Lead zirconate titanate

About: Lead zirconate titanate is a research topic. Over the lifetime, 7141 publications have been published within this topic receiving 150878 citations.

Piezoelectric cantilever sensors with asymmetric anchor exhibit picogram sensitivity in liquids

Abstract: We show for the first time that self-exciting and self-sensing piezoelectric cantilevers consisting only of lead zirconate titanate (PZT) measure resonance only if they are asymmetrically anchored. Symmetric-anchoring did not give rise to electrically measurable bending resonant modes in the 0–100 kHz range. Sensitivity of first and second bending mode resonances was characterized in a flow apparatus using small density changes in liquid (0.003–0.01 g/cm 3 ) and by dodecanethiol chemisorption at 30 pM. Density change results were consistent with existing models of submerged cantilevers, and yielded mass-change sensitivity of ∼33 ng/Hz and 217 pg/Hz for the first two modes. In chemisorption experiments, where binding was localized to 1 mm 2 distal tip of the PZT cantilever, sensitivity improved by an order of magnitude to 2 pg/Hz and 414 fg/Hz for the same two resonant modes.

A systematic study on structural and dielectric properties of lead zirconate titanate/(Pb,La)(Zr(1−x)Ti(x))O3 thin films deposited by metallo‐organic decomposition technology

Abstract: Pin‐hole free ferroelectric (Pb,La)(Zr1−xTix)O3 thin films with uniform composition have been fabricated using the metallo‐organic precursor compounds, which were carefully home synthesized. The structural development, spectroscopic, and dielectric properties of these films have been systematically investigated using atomic force microscopy (AFM), x‐ray diffraction, Fourier transform infrared spectroscopy, Raman scattering, and dielectric measurements. It has been found from our experimental results of PZT 40/60 thin films that the overlapping of (h00) and (00l) peaks of these films in x‐ray diffraction patterns, mainly due to the small grain sizes in films, makes it very difficult to distinguish individual diffraction peaks and to identify the phases. However, Raman measurements undoubtedly reveal the Raman spectra of these films in the tetragonal phase field, demonstrating that Raman spectroscopy is an effective tool to identify structures, especially in the case of thin films having very small grains. ...

Analysis of intrinsic lattice deformation in PZT-ceramics of different compositions

Abstract: High resolution synchrotron X-ray diffraction was used to investigate extrinsic (domain switching) and intrinsic (lattice deformation) contributions to the total strain induced by external electric field in soft lead zirconate titanate (PZT) ceramics. Evidence was presented for both 180° and non-180° domain switching. The direction dependence of the lattice deformation was examined. It was found that in rhombohedral PZT, the highest lattice strain occurs in [100] direction, and for tetragonal PZT, the highest lattice strain occurs in [101] direction. Finally it was found, that the lattice strain gives a higher contribution to the total strain for rhombohedral PZT than for tetragonal PZT.

Effect of dopants on the microstructure and lattice parameters of lead zirconate-titanate ceramics

Abstract: The effect of dopants on the microstructure and lattice parameters of Pb0.94Sr0.06(Zr0.53Ti0.47)O3 ceramics was studied. Small amounts (0 to 0.3 wt%) of Cr2O3, MnO2, Co2O3 and U3O8, were used as dopants. In a few compositions two oxides were used, namely U3O8 with Cr2O3 as well as MnO2 with Cr2O3 X-ray diffraction investigation of powdered samples showed that all the compositions (both modified and unmodified) were of perovskite type with tetragonal symmetry. The Curie temperature was decreased with the decrease of tetragonal distortion indicated by the axial ratio,c0/a0, in all cases. The average grain sizes for the doped and undoped compositions were determined from SEM photomicrographs of polished and acid-etched surfaces using the linear intercept technique. The average grain size for the undoped composition was found to be 10.7μm. The addition of a small amount of dopants controlled the grain growth to give rise to the average grain size of 6.4 to 9.5μm, which appeared to have some effect on the improvement of the piezoelectric properties of the ceramics.

Enhanced Piezoelectric and Ferroelectric Properties of Nb2O5 Modified Lead Zirconate Titanate-Based Composites

Abstract: The addition of ZnO nanowhiskers (ZnOw) in lead zirconate titanate (PZT) matrices results in reinforced composite materials but deteriorates their electrical properties. In this study, novel piezoelectric PZT/ZnOw composites modified with Nb2O5 were successfully fabricated using solid-state sintering method. The experimental results showed that the addition of 0.5 wt% Nb2O5 resulted in highly dense and homogenous PZT composites after sintering at 1150°C, with good piezoelectric and ferroelectric properties similar to pure PZT, specifically piezoelectric constant d33=665 pC/N, electromechanical coupling factor kp=0.7, relative dielectric constant ɛ=5048, and remnant polarization Pr=30.2 μC/cm2. The “soft effect” of Nb5+ ions, reflected in the improvement of the aforementioned properties, is attributed to the accommodation of Nb5+ ions at the B sites of the lattice of PZT. Compared with the PZT/ZnOw reinforced composites, the mechanical properties were slightly improved by adding 0.5 wt% Nb2O5, where flexural strength σf of 128 MPa and fracture toughness KIC of 1.46 MPa·m1/2 were measured.