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Modeling and simulation

About: Modeling and simulation is a research topic. Over the lifetime, 10273 publications have been published within this topic receiving 111550 citations.


Papers
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Proceedings ArticleDOI
07 Dec 2008
TL;DR: This work presents an experimentation layer for the modeling and simulation framework JAMES II that greatly facilitates the configuration and usage of the system for a user and supports distributed optimization, on-demand observation, and various distributed and non-distributed scenarios.
Abstract: Modeling and simulation frameworks for use in different application domains, throughout the complete development process, and in different hardware environments need to be highly scalable. For achieving an efficient execution, different simulation algorithms and data structures must be provided to compute a concrete model on a concrete platform efficiently. The support of parallel simulation techniques becomes increasingly important in this context, which is due to the growing availability of multi-core processors and network-based computers. This leads to more complex simulation systems that are harder to configure correctly. We present an experimentation layer for the modeling and simulation framework James II. It greatly facilitates the configuration and usage of the system for a user and supports distributed optimization, on-demand observation, and various distributed and non-distributed scenarios.

36 citations

Journal ArticleDOI
TL;DR: In this article, an integrated simulation tool is presented for estimating the hot-carrier-induced degradation of nMOS transistor characteristics and circuit performance and a reliability simulation tool incorporates an accurate one-dimensional MOSFET model for representing the electrical behavior of locally damaged transistors.
Abstract: The physical models and an integrated simulation tool are presented for estimating the hot-carrier-induced degradation of nMOS transistor characteristics and circuit performance. The proposed reliability simulation tool incorporates an accurate one-dimensional MOSFET model for representing the electrical behavior of locally damaged transistors. The hot-carrier-induced oxide damage can be specified by only a few parameters, avoiding extensive parameter extractions for the characterization of device damage. The physical degradation model includes both fundamental device degradation mechanisms, i.e., charge trapping and interface trap generation. A repetitive simulation scheme has been adopted to ensure accurate prediction of the circuit-level degradation process under dynamic operating conditions. >

36 citations

Journal ArticleDOI
TL;DR: The problems and challenges of Cyber Physical Systems (CPS) are presented, and features and benefits of a generic framework to enable design, modeling and simulation of large-scale, heterogeneous CPS systems in an integrated manner are discussed.
Abstract: Wireless technologies have contributed to extensive development of many kinds of applications that enable cost-effective and intelligent monitoring and control of physical environments, objects, activities such as smart buildings, home or industry automation, and remote patient care. These kinds of applications often require support of heterogeneous physical environments and large-scale systems mixing several different types of monitoring and control. In addition to heterogeneity and scalability support, mobility support is crucial in the development of these software systems.Although much research has addressed design, modeling and simulation of such systems, most solutions usually do not cover all requirements from different domains. Rather, these solutions restrict the development environment and reduce flexibility of design by enforcing the use of a specific software platform and tightly-coupled tools.This paper presents problems and challenges of Cyber Physical Systems (CPS) like the aforementioned applications, and discusses features and benefits of a generic framework to enable design, modeling and simulation of large-scale, heterogeneous CPS systems in an integrated manner.

36 citations

Proceedings ArticleDOI
10 Oct 2005
TL;DR: This work presents DEVStone, a synthetic benchmark devoted to automate the evaluation of DEVS-based simulation approaches, which generates models similar to those existing in the real world.
Abstract: DEVS (Discrete EVents systems Specification) is a sound, formal modeling and simulation (M&S) framework that supports hierarchical, modular model composition DEVS-based M&S environments have been used successfully to understand, analyze, and develop a wide variety of systems As the systems under study become larger and more complex, the performance of the simulator becomes critical Nevertheless, evaluating the performance of such simulators is a complex process that requires the execution of large numbers of models with different characteristics We present DEVStone, a synthetic benchmark devoted to automate the evaluation of DEVS-based simulation approaches, which generates models similar to those existing in the real world DEVStone facilitates performance analysis for successive versions (eg, upgrades or fixes) of the same simulation engine, and provides a common metric to compare different M&S environments

36 citations

Journal ArticleDOI
TL;DR: In this article, a service-oriented approach for modeling and simulation of distributed manufacturing systems (DiMSs) is described, which aims towards efficient and innovative collaboration that integrates design and development activities of manufacturing systems.
Abstract: In this paper modeling and simulation is discussed in the context of distributed manufacturing systems (DiMS). The DiMS concept aims towards efficient and innovative collaboration that integrates design and development activities of manufacturing systems. A DiMS, described formally as a digital manufacturing system, is a competent basis for the modeling and simulation of manufacturing systems. The activities of the simulation model are described on the basis of a service-oriented approach in which content of the services is completely known. Micro, meso, and macro manufacturing levels are applied to the modeling and simulation. By means of these levels the hierarchy of the communication of the services is illustrated. An example is described in which modeling and simulation is used to proceed from ideas to efficiently operated manufacturing systems.

36 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
202333
202291
2021268
2020332
2019450
2018442