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Moiré pattern

About: Moiré pattern is a research topic. Over the lifetime, 1917 publications have been published within this topic receiving 27176 citations. The topic is also known as: moiré fringes & moire pattern.


Papers
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Journal ArticleDOI
TL;DR: In this article, the authors applied scanning moire fringe imaging to demonstrate the quantitative strain mapping of a Si/Si 1−xGex interfacial layer with a detection precision of 0.1%.
Abstract: The development of a method for the precise measurement of strain fields in semiconductor devices has become a critical requirement because the electrical performances of the devices are greatly influenced by the strain induced in their structures. We applied scanning moire fringe imaging to demonstrate the quantitative strain mapping of a Si/Si1−xGex interfacial layer. The strain field was measured at a nano-meter scale spatial resolution, with a detection precision of 0.1%. The maximum value of the strain was measured to be 1.1% ± 0.1%, which is consistent with the direct measurement by high-resolution scanning transmission electron microscopy image.

53 citations

Journal ArticleDOI
TL;DR: In this paper, the use of orthogonal bicolored moire fringes with the unique capability to selectively display either set of fringes while obscuring the other set is discussed.
Abstract: This paper presents the results of an investigation to develop new techniques to enhance the moire method of mechanical interferometry. The program demonstrated the practicality of developing the use of orthogonal bicolored moire fringes with the unique capability to selectively display either set of fringes while obscuring the other set. An interpolation method for the determination of fractional fringe orders is also discussed.

52 citations

Journal ArticleDOI
TL;DR: An accurate pixel-to-pixel correspondence adjustment in the DMD camera by means of the phase-shifting moiré method is proposed, which provided very accurate adjustment whose error was less than 1/25 pixel.
Abstract: A camera based on the digital micromirror device (DMD) technology has been previously developed. In this optical system, the correspondence of each mirror of the DMD to each pixel of the CCD cannot readily be done since the pixel sizes of the DMD and the CCD are very small. An accurate pixel-to-pixel correspondence adjustment in the DMD camera by means of the phase-shifting moire method is proposed. To perform high accurate adjustment of the optical system, the phase distribution of a moire fringe pattern is analyzed when the CCD pixels and the DMD mirrors have a mismatch and/or misalignment with each other. This technique does not need a complicated setting or complex image processing to generate the moire fringe pattern, and it needs only one captured image. In the adjustment experiment, the proposed method provided very accurate adjustment whose error was less than 1/25 pixel. An experiment of phase analysis to demonstrate the usefulness was performed.

52 citations

Journal ArticleDOI
TL;DR: Two-stages are planned to measure the 3-D profile of objects by using the phaseshifting method, based on shadow moiretopography, with emphasis on describing the novel methodology and justifying it by an error simulation test.
Abstract: Two-stages are planned to measure the 3-D profile of objects by using the phaseshifting method, based on shadow moiretopography. The stages essentially consist of moving the grating vertically, which produces a change in the moirepattern, and rotating the grating, which results in a constant phase shift regardless of the moirefringe order. In practice, an additional stage of moving the grating horizontally has to be added, which averages the grating period and yields a better moirepat- tern. We aim to improve the shortcomings inherent in the conventional method, such as complicated operation of the optical arrangement, and our emphasis is on describing the novel methodology and justifying it by an error simulation test. The experimental results show that this tech- nique is available for practical applications. © 2000 Society of Photo-Optical Instrumentation Engineers. (S0091-3286(00)00408-6)

52 citations

Patent
15 Jan 1993
TL;DR: In this article, a system for determining the topography of a curved surface, comprising a device for projecting patterns of lines on the surface to be examined, which device includes two projectors disposed at an angle relative to each other, each provided with a raster of parallel straight lines, which are positioned at right angles to the plane through the projection axes and a rectangular diaphragm, of which the long sides are parallel to the lines of the raster.
Abstract: A system for determining the topography of a curved surface, comprising a device for projecting patterns of lines on the surface to be examined, which device includes two projectors disposed at an angle relative to each other, each provided with a raster of parallel straight lines, which are positioned at right angles to the plane through the projection axes and a rectangular diaphragm, of which the long sides are parallel to the lines of the raster, and a detection device for registering the image formed on the surface. The system is implemented such that an additive moire pattern is produced and that a pilot monitor in conjunction with an electronic filter is provided for real-time visualizing this moire pattern. The detection device is implemented for registering the image without moire interference, suitable for discrete Fourier analysis. The registration of the formed height line map for proper focussing or for obtaining an end product is electronically filtered, with the object of being able to see highly contrasting moire height contours in real time on a monitor. The light source for both projectors is a slit shaped continuous light source combined with a slit shaped flashlamp, which-- by means of synchronization at the end of the first raster period and the beginning of the second raster period respectively--illuminate a complete TV raster in only a few ms, and in which the half rasters can complement each other afterwards through explicit digital analysis.

51 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
2023181
2022321
202126
202048
201946
201844