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Moiré pattern

About: Moiré pattern is a research topic. Over the lifetime, 1917 publications have been published within this topic receiving 27176 citations. The topic is also known as: moiré fringes & moire pattern.


Papers
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Patent
25 Oct 2001
TL;DR: In this paper, a halftone dot image is generated by meshing of an object image OI and a smoothed object image SOI, which is then smoothed by smoothing the object image and the halftoneset image.
Abstract: A halftone dot image HI composed of halftone dots is produced by halftone dot meshing of an object image OI. A smoothed object image SOI and a smoothed halftone dot image SHI are then produced by smoothing the object image and the halftone dot image. An interference moire image IM is produced by obtaining a difference between the smoothed object image SOI and the smoothed halftone dot image SHI.

4 citations

Patent
06 Sep 1984
TL;DR: In this paper, the authors used a liquid-crystal panel to move a grating pattern in a stripe shape electrically, and applied a voltage to each electrode to display shielded beams corresponding to the electrodes on the panel.
Abstract: PURPOSE:To erase unnecessary fringes other than moire fringes by the oscillation of a reference grating and to improve measurement precision by using a liquid-crystal panel which moves a grating pattern in a stripe shape electrically. CONSTITUTION:This device is provided with a spot light source 1 which irradiates an objective body 2 with light, the liquid-crystal panel 14 which displays selectively >=2 kinds of stripe pattern 13 which have stripes in parallel at different positions during the application of a voltage to an electrode 12, a TV camera 8 which photodetects reflected light from the objective body 2 through the panel 14, a picture processing circuit 11 which analyzes the video signal from the camera 8 and inspects the shape by moire fringes, and a circuit which controls the application state of the voltage to the electrodes 12 so that the electrodes 12 move at right angles to the direction of the fringes synchronously with the frame synchronizing signal of the camera 8. Then, the voltage is applied to each electrode 12 to display shielded beams corresponding to the electrodes on the panel 14.

4 citations

Proceedings ArticleDOI
29 Dec 1999
TL;DR: In this article, an automated Fourier transform method of phase retrieval of a carrier-modulated moire fringe pattern is presented, which can provide fast and accurate determination of the phase information by removing the carrier without shifting in frequency domain.
Abstract: An automated Fourier-transform method of phase retrieval of moire interferometric fringe pattern is presented. The method is shown to provide fast and accurate determination of the phase information by removing the carrier without shifting in frequency domain the filtered Fourier spectrum of the carrier-modulated moire fringe pattern. The principle of the method is described and moire interferometric measurements with submicron sensitivity of the in-plane displacement fields of thick carbon fiber/graphite-PEEK composite laminates are analyzed as example of application of the technique.

4 citations

Journal ArticleDOI
TL;DR: In this paper, a simple method for measurement of wavelength and decay of travelling waves on the surface of transparent liquids is described, where light transmitted through a fixed line grating is deviated by the wave-carrying surface, producing a distorted image of the grating.

4 citations

Patent
21 Jan 2000
TL;DR: In this paper, a photoresist film 10a is formed on a semiconductor substrate 10 on which the diffraction grating is formed, and an interference pattern is formed by exposing it by a two-luminous flux interference exposure method.
Abstract: PROBLEM TO BE SOLVED: To precisely measure a period of a diffraction grating even when the period of the diffraction grating is modulated in a minute area. SOLUTION: In this period measuring method, a photoresist film 10a is formed on a semiconductor substrate 10 on which the diffraction grating is formed, and an interference pattern is formed by exposing it by a two-luminous flux interference exposure method. At this time, moire fringes are generated by the interference pattern by an incident light beam and the interference pattern by a diffracted light beam. By measuring the angle of the moire fringes, the period of the diffraction grating is calculated and obtained.

4 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
2023181
2022321
202126
202048
201946
201844