Moiré pattern

About: Moiré pattern is a research topic. Over the lifetime, 1917 publications have been published within this topic receiving 27176 citations. The topic is also known as: moiré fringes & moire pattern.

Observation of Linear and Nonlinear Light Localization at the Edges of Moiré Arrays

Abstract: We observe linear and nonlinear light localization at the edges and in the corners of truncated moir\'e lattices created by the superposition of periodic mutually-twisted at Pythagorean angles square sublattices. Experimentally exciting corner linear modes in the fs-laser written moir\'e lattices we find drastic differences in their localization properties in comparison with the bulk excitations. We also address the impact of nonlinearity on the corner and bulk modes and experimentally observe the crossover from linear quasi-localized states to the surface solitons emerging at the higher input powers. Our results constitute the first experimental demonstration of localization phenomena induced by truncation of periodic moir\'e structures in photonic systems.

Real Time Measurement Of An Object's Small Displacement By High Speed Video Camera With Moire Pattern

Abstract: The resolution of a high speed video camera is not so high as photographic film, therefore the measurement of a small shift, such as the vibration of object is sometimes impossible. Here we suggest to use a grids cover on the object and pass this image through another transparent grids to the camera. It will generate a moire fringe which produce the equivalent resolution thousand times than before. We also put a corrdina te mask on the screen of the video TV, it is not only let us get a possibility to measure the small displacement of object which we can not see by video camera before, but also gives us a real time 3 Dimensional data. The mask errors generated hr the curved screen are also discussed.

Method for measuring object surface three-dimensional morphology

Abstract: The present invention relates to a method for measuring an object surface three-dimensional morphology. The method belongs to the photomechanics technology field, and comprises the steps of inclining the angle of a scanning electron microscope sample table; obtaining the scanning moire images of a tested sample under different angles; carrying out the moire fringe processing on two images of different inclination angles separately to obtain the displacement fields under the two angles; determining the three-dimensional morphology diagram of the tested sample by utilizing a stereoscopic analysis model formula in a scanning electron microscope and according to the displacement fields. The method for measuring the object surface three-dimensional morphology of the present invention integrates the advantages of high measurement sensitivity and large view field of a scanning moire technology, and can measure the three-dimensional morphology of the object having a micro-nano scale. The method for measuring the object surface three-dimensional morphology of the present invention makes up the insufficient that a conventional scanning electron microscope method only can measure the in-surface information, expands the application range of a scanning moire method, and possesses a very good effect on the measurement of the three-dimensional morphology of the object of micro-nano scale.

A Computer Based Moire Technique To Measure Very Small Displacements

Abstract: The accuracy that can be achieved in the measurement of very small displacements in techniques such as moire, holography and speckle is limited by the noise inherent to the utilized optical devices. To reduce the noise to signal ratio, the moire method can be utilized. Two system of carrier fringes are introduced, an initial system before the load is applied and a final system when the load is applied. The moire pattern of these two systems contains the sought displacement information and the noise common to the two patterns is eliminated. The whole process is performed by a computer on digitized versions of the patterns. Examples of application are given.

Moire interferometry patterns for rotational alignment of structures

Abstract: In some manufacturing applications the alignment of fine structures formed on the surface of a part such as micro-scribed patterns on solar panels can be critical to the panel performance. Variations in pattern uniformity may degrade the efficiency of the solar panel if the pattern deviates significantly from designed parameters. This paper will explore the use of moire patterns to interpret the angular alignment of such structures on 3 dimensional non-planar shapes. The moire interferometry pattern creates a beat between the scribed pattern and a reference pattern that is a function of both the shape of the part as well as the shape of the scribed pattern. Both the part shape variations and the patterns of interest are typically much smaller than can be seen visually. Similar challenges exist when inspecting specular models or testing low quality optics. The moire effect allows small displacements to be measured from patterns that are well below the resolution of the camera systems that are used to view the patterns. Issues such as the separation of the shape of the part from the alignment of the fine structure as well as resolution and robustness of the technique will be explored in this paper.