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Moiré pattern

About: Moiré pattern is a research topic. Over the lifetime, 1917 publications have been published within this topic receiving 27176 citations. The topic is also known as: moiré fringes & moire pattern.


Papers
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Journal ArticleDOI
TL;DR: In this article , small-angle twisted bilayer graphene assembled from separated CVD-grown graphene single-crystals can ensure high-quality transport properties, determined by a device-scale-uniform moiré potential.
Abstract: To realize the applicative potential of 2D twistronic devices, scalable synthesis and assembly techniques need to meet stringent requirements in terms of interface cleanness and twist-angle homogeneity. Here, we show that small-angle twisted bilayer graphene assembled from separated CVD-grown graphene single-crystals can ensure high-quality transport properties, determined by a device-scale-uniform moiré potential. Via low-temperature dual-gated magnetotransport, we demonstrate the hallmarks of a 2.4°-twisted superlattice, including tunable regimes of interlayer coupling, reduced Fermi velocity, large interlayer capacitance, and density-independent Brown-Zak oscillations. The observation of these moiré-induced electrical transport features establishes CVD-based twisted bilayer graphene as an alternative to “tear-and-stack” exfoliated flakes for fundamental studies, while serving as a proof-of-concept for future large-scale assembly.

2 citations

Proceedings ArticleDOI
24 May 2022
TL;DR: In this paper , a method for the fabrication of multiplexed azopolymer surface relief gratings through a computer controlled holographic illumination system is presented, which can be tuned to have both positive and negative topography.
Abstract: Multiplexing is a method in which multiple information is stored or combined in a common medium. In photolithographic applications, spatial and temporal multiplexing can be used to design complex structured surfaces as superposition of simple profiles on the surface of a photosensitive materials able to respond to a time-averaged light pattern. Azopolymers are promising material systems in that sense, as they can be directly photo-structured in a reversible way over large scales with high quality, by simply controlling the spatiotemporal distribution of light irradiated on their surface. Not involving the typical chemical development of standard photoresists, the direct light-induced surface topography of azopolymer can be further modified after structuration, resulting a suitable platform to encode multiplexed information in a topographic surface relief pattern. Here, we show a method that allows the fabrication of multiplexed azopolymer surface relief gratings through a computer controlled holographic illumination system. The ability of our setup in accurately and digitally manipulating the evolution of the geometry of a simple sinusoidal intensity pattern is here exploited for the realization of quasicrystalline surface relief gratings, that can be tuned to have both positive and negative topography while preserving the multiplexed grating-vector information encoded in their far-field light diffraction pattern. Our results pave the way toward the realization structured surfaces able to convert multiple information in a single complex topographic profile for application in optics and cryptography.

2 citations

Journal ArticleDOI
TL;DR: An effort has been made to explore the cause of image processing error with an emphasis on topics concerning the frequency leakage in Fourier transform and the request for operation parameters of measurement arrangement.

2 citations

Journal ArticleDOI
01 Apr 1970
TL;DR: In this paper, the authors derived quantitative relationships from which display distortion to the 0.1 percent accuracy mentioned can be obtained using moire fringes and two distinct methods are described.
Abstract: Before high-accuracy graphic displays can be successfully designed or implemented from existing displays, the display distortion need be known to a high degree of accuracy-typically of the order of 0.1 percent of the display area height or better. Present day methods of measuring distortion are clumsy and imprecise. Methods of measurement using moire fringes have been suggested before, but the treatment was intuitive and the interpretation quailtative. In this paper are derived quantitative relationships from which display distortion to the 0.1 percent accuracy mentioned can be obtained using moire fringes. Two distinct methods are described. Full experimental methods, limitations, accuracy of method, etc., are given. Actual case examples illustrate the method. Although the methods developed here were specifically for TV-mode displays, the methods are equally valid for any graphic display device such as cathode-ray tubes (storage or refresh), electromechanical X-Y plotters, flat-screen displays, etc., the only requirement being the ability to display or generate a parallel line pattern. The distortion of graphic input devices such as TV cameras, electronic X-Y input pads, etc., can also be obtained using these methods.

2 citations

Patent
20 May 1992
TL;DR: In this paper, a halogen lamp is used for a light source S, and a micrometer is fitted to the light source differential motion mechanism element M and moved on a horizontal plane.
Abstract: PURPOSE:To enable execution of three-dimensional measurement with high sensitivity by a method wherein a lattice is moved in the direction vertical to the surface of the lattice, while a light source is moved in parallel to the lattice surface and shifted in a state wherein moire fringes of each degree are made uniform, and the moire fringes are picked up and subjected to a computation processing CONSTITUTION:A halogen lamp is used for a light source S, and a micrometer is fitted to a light source differential motion mechanism element M and moved on a horizontal plane Besides, the light source S is adjusted in a height direction so that the central position of the light source S be aligned with the focal position of a CCD camera Ca Then, positional alignment of the center of the light source S with the focus of the camera Ca is conducted and a distance between the light source S and the camera Ca is set so that a fringe interval being suitable for measurement be obtained The amounts of shift of a lattice G and the light source S are calculated with respect to four phases of 0, pi/2, pi and 3pi/2 by a prescribed formula, both of them are shifted four times and images of moire fringes are picked up by the camera Ca On the occasion, the lattice G is moved within a plane and thereby an averaging process of the moire fringes is executed In this way, three-dimensional measurement with high sensitivity can be executed

2 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
2023181
2022321
202126
202048
201946
201844