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Moiré pattern

About: Moiré pattern is a research topic. Over the lifetime, 1917 publications have been published within this topic receiving 27176 citations. The topic is also known as: moiré fringes & moire pattern.


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Patent
Kodera Masako1
17 Jan 2019
TL;DR: In this article, a crystal analyzer that can accurately detect a crystal strain or a crystal defect in a crystal was proposed, based on the correspondence relation between the pattern of the moire stripe of a moire image and the crystal defect.
Abstract: To provide a crystal analyzer that can accurately detect a crystal strain or a crystal defect in a crystal.SOLUTION: The crystal analyzer according to an embodiment includes: a first storage unit for storing a first image including a crystal lattice image in a crystal region of a sample including a crystal region; a first image processing unit for generating a moire image from the crystal lattice image; a second storage unit for storing at least one of the correspondence relation between the pattern of the moire stripe of a moire image and the crystal defect and the correspondence relation between the pattern of the moire stripe of the moire image and the crystal strain; and an analysis unit for analyzing the moire image generated from the crystal lattice image with reference to at least one of the correspondence relations and detecting at least one of the crystal defect and the crystal strain in the crystal region.SELECTED DRAWING: Figure 1
Proceedings ArticleDOI
01 Mar 1991
TL;DR: In this paper, a high sensitivity strain measurement procedure that combines moire interferometry and digital image processing, has been successfully implemented to determine thermally induced strains in electronic components, called fractional fringe Moire Interferometry (FFMI).
Abstract: A high sensitivity strain measurement procedure that combines moire interferometry and digital image processing, has been successfully implemented to determine thermally induced strains in electronic components. The technique is called Fractional Fringe Moire Interferometry (FFMI). It produces whole field displacement information that are used to compute strains in a certain plane. Displacements in the submicron domain are detected with excellent spatial resolution over the area of interest. An example is presented here to illustrate the use of the technique to monitor thermally induced deformations in a specimen made from a plastic DIP device. The specimen was uniformly heated from room temperature to 90 degree(s)C, and the resulting moire fringe patterns were recorded, analyzed using digital-image-processing and in plane displacements in the package were determined. Strain components were then computed by simple differentiation of the acquired displacement fields. Contour maps showing actual thermo/mechanical strain components in the device were constructed. Those maps can provide an excellent tool for strain analysis of microelectronic devices regardless of the structural complexity of the device.© (1991) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Proceedings ArticleDOI
15 Oct 2012
TL;DR: A method based on information entropy is proposed, the feasibility of the method is proved in mathematics, analysis of the moirefringes and the result of the two-dimensional FFT of moire fringes is presented, and the process of finding the exactly coordinate of the frequency domain, which is based on the method, is shown.
Abstract: To improve the accuracy of the measuring system of long focal length, the coordinate of the special spectrum point should be found. In this paper a method based on information entropy is proposed, the feasibility of the method is proved in mathematics, analysis of the moire fringes and the result of the two-dimensional FFT of moire fringes is presented, the process of finding the exactly coordinate of the frequency domain, which is based on the method, is shown. We also demonstrate an application of the method to the measuring system, and numerical result of the experiment could prove that the accurate of the system is significantly improved.
Journal ArticleDOI
TL;DR: An elemental pattern capture method for obtaining a special presentation of an individual Glass moire pattern rather than moire patterns displayed in an array, which shows a good application prospect in document security and authentication.
Patent
16 Aug 2019
TL;DR: In this paper, a stepping-free X-ray grating phase contrast imaging method is proposed to remove the phase stepping process and reduce the precision requirements for mechanical parts, and no extra cost is added, an object does not need to be subjected to mobile scanning and the requirements on the consistency of the Moire fringes are low.
Abstract: The invention discloses a stepping-free X-ray grating phase contrast imaging method. The method comprises the steps of 1) arranging an imaging system; 2) changing an angle of analyzing a grating or changing a period of self-imaging fringes of the phase grating, thereby enabling the plane of a detector to receive Moire fringes; 3) adjusting structural parameters of the imaging system to obtain a background displacement curve; 4) placing a sample at an object point, collecting fringe information received by the detector at the moment, and obtaining an object displacement curve; and 5) accordingto the obtained background displacement curve and object displacement curve, carrying out processing to obtain absorption, refraction and scattering information of the sample. Compared with a traditional X-ray grating phase contrast imaging method adopting phase stepping, the stepping-free X-ray grating phase contrast imaging method has the advantages that the phase stepping process is removed, sothat the phase contrast imaging speed is greatly increased, and the precision requirements for mechanical parts are reduced; and meanwhile, no extra cost is increased, an object does not need to be subjected to mobile scanning, and the requirements on the consistency of the Moire fringes are low. The stepping-free X-ray grating phase contrast imaging method is an effective supplement of the grating phase contrast imaging method.

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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
2023181
2022321
202126
202048
201946
201844