Topic
Moiré pattern
About: Moiré pattern is a research topic. Over the lifetime, 1917 publications have been published within this topic receiving 27176 citations. The topic is also known as: moiré fringes & moire pattern.
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Patent•
27 Jan 2000
TL;DR: In this article, the authors proposed a method for the creation of a moire fringe pattern arising from a difference or difference between the first and second interference fringe patterns, where all the errors of a poor quality, misaligned system are accepted and then eliminated by the combination process.
Abstract: An interferometer (1) is arranged to form a first interference fringe pattern comprising at least ten interference fringes; recording an image of said first interference fringe pattern; perturbing an optical path in the interferometer (1) to form a second interference fringe pattern comprising at least ten interference fringes; and combining an image of said second interference fringe pattern with the recorded image of the first interference fringe pattern to produce a further image comprising a moire fringe pattern arising from a difference or differences between the first and second interference fringe patterns. The combining step involves subtraction (4) of digital images. Different wavelengths and interferometers are used: Michelson, Mach-Zehnder, Fizeau, Twyman-Green. In this new approach, all the errors of a poor quality, misaligned system are accepted and then eliminated by the combination process, producing a moire fringe pattern. The method enables very large aperture optical systems for traditional and engineering interferometers to be constructed from inexpensive and basic components.
20 citations
Patent•
17 May 1994
TL;DR: In this article, the authors presented an apparatus and method for measuring two-dimensional displacement by moire fringes of concentric circle gratings, which can be precisely measured by a pair of grating and the measurement resolution can be improved by the image processing using the characteristics of the fringes without noises.
Abstract: The present invention provides an apparatus and method for measuring two- dimensional displacement by moire fringes of concentric circle gratings which two-dimensional displacement can be precisely measured by a pair of grating and the measurement resolution can be improved by the image processing using the characteristics of moire fringes without noises.
20 citations
TL;DR: In this paper, the first-order diffracted moire fringes of transparent multilayered structures comprised of irregularly deformed periodic patterns were studied and compared with a comparison study of the diffracted Moire fringe pattern and detailed microscopy of the structure.
Abstract: We studied the first-order diffracted moire fringes of transparent multilayered structures comprised of irregularly deformed periodic patterns. By a comparison study of the diffracted moire fringe pattern and detailed microscopy of the structure, we show that the diffracted moire fringe can be used as a nondestructive tool to analyze the alignment of multilayered structures. We demonstrate the alignment method for the case of layer-by-layer microstructures using soft lithography. The alignment method yields high contrast of fringes even when the materials being aligned have very weak contrasts. The imaging method of diffracted moire fringes is a versatile visual tool for the microfabrication of transparent deformable microstructures in layer-by-layer fashion.
20 citations
TL;DR: The method is improved to eliminate the error caused by the harmonics in the moiré profile and both simulation and experimental results show that the improved method can effectively reduce the influence of harmonics.
Abstract: A method for high-resolution three-dimensional shape measurement for a shadow moire system is proposed. To increase the resolving power of the method, the problem caused by the harmonics of the moire profile needs to be solved. It is well known that moire fringes in a shadow moire system have a nonsinusoidal profile caused by harmonics. The influence of the harmonics in moire profile on the measurement accuracy of the method is discussed. The method is improved to eliminate the error caused by the harmonics in the moire profile. Both simulation and experimental results show that the improved method can effectively reduce the influence of harmonics.
20 citations
Journal Article•
TL;DR: In this article, a new approach to Moire deflectometry using phase-shifting technique is described, where phase maps are calculated to reconstruct the surface profile of the tested object.
20 citations