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Noise (electronics)

About: Noise (electronics) is a research topic. Over the lifetime, 42029 publications have been published within this topic receiving 622342 citations. The topic is also known as: measurement noise.


Papers
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Journal ArticleDOI
TL;DR: In this paper, a new adaptive filtering algorithm was proposed to dramatically lower phase noise, improving both measurement accuracy and phase unwrapping, while demonstrating graceful degradation in regions of pure noise.
Abstract: The use of SAR interferometry is often impeded by decorrelation from thermal noise, temporal change, and baseline geometry. Power spectra of interferograms are typically the sum of a narrow-band component combined with broad-band noise. We describe a new adaptive filtering algorithm that dramatically lowers phase noise, improving both measurement accuracy and phase unwrapping, while demonstrating graceful degradation in regions of pure noise. The performance of the filter is demonstrated with SAR data from the ERS satellites over the Jakobshavns glacier of Greenland.

1,635 citations

Journal ArticleDOI
05 Jan 1995-Nature
TL;DR: In certain nonlinear systems, including electronic circuits and biological sensory apparatus, the presence of noise can in fact enhance the detection of weak signals, called stochastic resonance.
Abstract: Noise in dynamical systems is usually considered a nuisance. But in certain nonlinear systems, including electronic circuits and biological sensory apparatus, the presence of noise can in fact enhance the detection of weak signals. This phenomenon, called stochastic resonance, may find useful application in physical, technological and biomedical contexts.

1,588 citations

Journal ArticleDOI
TL;DR: In this paper, the authors calculated the thermal noise of a cantilever with a free end by considering all possible vibration modes of the cantilevers and showed that if the end is supported by a hard surface, no thermal fluctuations of the deflection are possible.
Abstract: Thermal fluctuations of the cantilever are a fundamental source of noise in atomic force microscopy. We calculated thermal noise using the equipartition theorem and considering all possible vibration modes of the cantilever. The measurable amplitude of thermal noise depends on the temperature, the spring constant K of the cantilever and on the method by which the cantilever deflection is detected. If the deflection is measured directly, e.g. with an interferometer or a scanning tunneling microscope, the thermal noise of a cantilever with a free end can be calculated from square root kT/K. If the end of the cantilever is supported by a hard surface no thermal fluctuations of the deflection are possible. If the optical lever technique is applied to measure the deflection, the thermal noise of a cantilever with a free end is square root 4kT/3K. When the cantilever is supported thermal noise decreases to square root kT/3K, but it does not vanish.

1,535 citations

Journal ArticleDOI
TL;DR: In this paper, a split-spectrum amplitude-decorrelation angiography (SSADA) was proposed to improve the signal-to-noise ratio (SNR) of flow detection.
Abstract: Amplitude decorrelation measurement is sensitive to transverse flow and immune to phase noise in comparison to Doppler and other phase-based approaches. However, the high axial resolution of OCT makes it very sensitive to the pulsatile bulk motion noise in the axial direction. To overcome this limitation, we developed split-spectrum amplitude-decorrelation angiography (SSADA) to improve the signal-to-noise ratio (SNR) of flow detection. The full OCT spectrum was split into several narrower bands. Inter-B-scan decorrelation was computed using the spectral bands separately and then averaged. The SSADA algorithm was tested on in vivo images of the human macula and optic nerve head. It significantly improved both SNR for flow detection and connectivity of microvascular network when compared to other amplitude-decorrelation algorithms.

1,507 citations

Book
01 Jan 1958
TL;DR: The aim of this book is to clarify the role of noise in the development of linear and nonlinear systems and to provide a procedure forormalising the noise generated by these systems.
Abstract: Preface to the IEEE Press Edition. Preface. Errata. Introduction. Probability. Random Variables and Probability Distributions. Averages. Sampling. Spectral Analysis. Shot Noise. The Gaussian Process. Linear Systems. Noise Figures. Optimum Linear Systems. Nonlinear Devices: The Direct Method. Nonlinear Devices: The Transform Method. Statistical Detection Signals. Appendix 1: The Impulse Function. Appendix 2: Integral Equations. Bibliography. Index.

1,473 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
202218
20211,494
20201,388
20191,398
20181,455
20171,544