Topic
Noise (electronics)
About: Noise (electronics) is a research topic. Over the lifetime, 42029 publications have been published within this topic receiving 622342 citations. The topic is also known as: measurement noise.
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TL;DR: In this paper, the effects of skew angles on signal and noise were analyzed in two thin film disk media with different anisotropy orientation distributions by micromagnetic simulations, and the fundamental peak signals were compared for two skew angles of zero and thirty-degree versus recording densities in the isotropic and oriented media.
Abstract: The effects of skew angles on signal and noise are analyzed in two thin film disk media with different anisotropy orientation distributions by micromagnetic simulations. The recorded magnetization patterns with a thirty-degree skew angle are shown for the isotropic and oriented media. The cross-track noise profiles are calculated and analyzed in both media at a recording density of 2405 flux-reversal per millimeter. The fundamental peak signals are compared for two skew angles of zero and thirty-degree versus recording densities in the isotropic and oriented media.
15 citations
TL;DR: In this article, a detailed investigation of the unwanted opto-acoustic interactions in such interferometers, which can lead to the phenomenon of parametric instability, is presented. And the results show that the increased overlap of the Mesa beams with the test masses leads to approximately 3 times as many unstable modes in comparison to a similar interferometer with Gaussian beams.
Abstract: To reduce the thermal noise in the future generation of gravitational wave detectors, flat-top beams have been proposed to replace conventional Gaussian beams, so as to obtain better averaging over the Brownian motion of the test masses. Here, we present a detailed investigation of the unwanted opto-acoustic interactions in such interferometers, which can lead to the phenomenon of parametric instability. Our results show that the increased overlap of the Mesa beams with the test masses leads to approximately 3 times as many unstable modes in comparison to a similar interferometer with Gaussian beams.
15 citations
TL;DR: In this paper, the effect of different noise sources on the position detection capability of a position sensitive detector (PSD)-transimpedance amplifier (TIA) sensing system is analyzed.
Abstract: A study of the different noise sources in a position sensitive detector (PSD)-transimpedance amplifier (TIA) sensing system is presented and the dominant noise sources are identified. The effect of these noise sources on the position detection capability of the sensing system is analyzed. An expression derived for the position resolution of the phase method of position detection reveals the position resolution depends inversely on the modulation frequency of the light source and the square of the amplitude of the currents flowing through the metal electrodes, and is dependent on the position of the incident light beam. Simulation results show that the best achievable position resolution is at the center of the PSD and becomes worse as one moves away from the center toward the edges. Compared to the 4 nm//spl radic/Hz position resolution that is achievable using the amplitude method of position detection, the phase method of position detection provides a resolution of 9 nm//spl radic/Hz and 6 nm//spl radic/Hz corresponding to a modulation frequency of 50 kHz and 70 kHz respectively.
15 citations
14 Oct 2008
TL;DR: A fully-differential low-power low-noise preamplifier for biopotential and neural-recording applications is presented and provides an output swing of ± 0.9 V with a THD of less than 0.1%
Abstract: A fully-differential low-power low-noise preamplifier for biopotential and neural-recording applications is presented. This design, which has been simulated in a standard 90-nm CMOS process, consumes 30 μW from a 3-V power supply. The simulated integrated input-referred noise is 2.3 μV over 0.1 Hz to 20 kHz. The amplifier also provides an output swing of ± 0.9 V with a THD of less than 0.1%
15 citations
Patent•
19 Apr 1973
TL;DR: In this article, an intermodulation distortion analyzer generates two pairs of sinusoidal test tones to serve as a test signal for the channel under test, which can be used to eliminate the long time averaging required for measurements when noise bands are used.
Abstract: An intermodulation distortion analyzer generates two pairs of sinusoidal test tones to serve as a test signal for the channel under test. The two pairs of tones simulate two respective noise band test signals but eliminate the long time averaging required for measurements when noise bands are used. A highly linear AGC circuit employs sampling at an output-controlled duty cycle to maintain a constant reference level for the analyzer. This reference level permits automatic distortion measurements to be read out directly in db below the test signal. An RMS detector circuit for second order intermodulation products employs feedback control to maintain the input signal to a squaring circuit constant. Squaring of the constant level sinusoids produces RMS DC components which can be separated for direct measurement. A distortion circuit provides known levels of second and third order intermodulation in the test signal to permit accurate check out of the analyzer.
15 citations