Topic
Noise measurement
About: Noise measurement is a research topic. Over the lifetime, 19776 publications have been published within this topic receiving 308180 citations.
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TL;DR: Equal-noisiness experiments using variable sound durations and pressure levels to determine perceived noise level of listeners were conducted in this article, where variable sound duration and pressure level were used.
Abstract: Equal-noisiness experiments using variable sound durations and pressure levels to determine perceived noise level of listeners
94 citations
Patent•
15 Sep 1999
TL;DR: In this paper, the input signal is divided into signal blocks, which are processed to provide an estimate of a short-time perceptual band spectrum of the input signals, and a noise suppression frequency response is then determined based on the estimate of the long-term perceptual bands of the noise and the short time perceptual bands.
Abstract: Noise is suppressed in an input signal that carries a combination of noise and speech. The input signal is divided (10) into signal blocks, which are processed (14) to provide an estimate of a short-time perceptual band spectrum of the input signal. A determination is made (16) at various points in time as to whether the input signal is carrying noise only or a combination of noise and speech. When the input signal is carrying noise only, the corresponding estimated short-time perceptual band spectrum of the input signal is used to update an estimate (18) of a long term perceptual band spectrum of the noise. A noise suppression frequency response is then determined (20) based on the estimate of the long term perceptual band spectrum of the noise and the short-time perceptual band spectrum of the input signal, and used to shape (24) a current block of the input signal in accordance with the noise suppression frequency response.
93 citations
TL;DR: A robust Gaussian approximate fixed-interval smoother for nonlinear systems with heavy-tailed process and measurement noises is proposed and results show the efficiency and superiority of the proposed smoother as compared with existing smoothers.
Abstract: In this letter, a robust Gaussian approximate (GA) fixed-interval smoother for nonlinear systems with heavy-tailed process and measurement noises is proposed. The process and measurement noises are modeled as stationary Student’s t distributions, and the state trajectory and noise parameters are inferred approximately based on the variational Bayesian (VB) approach. Simulation results show the efficiency and superiority of the proposed smoother as compared with existing smoothers.
93 citations
TL;DR: In this article, the authors proposed a two-probe measurement approach for the noise source and termination impedance of a switched-mode power supply (SMPS) under its normal operating condition.
Abstract: Based on a two-probe measurement approach, the noise source and noise termination impedances of a switched-mode power supply (SMPS) under its normal operating condition are measured. With the accurate noise source and noise termination impedances, an electromagnetic interference (EMI) filter can be optimally designed. A practical example of the design of an EMI filter to comply with a regulatory conducted EMI limit using the proposed procedure is demonstrated and compared with the cases, where the noise source and noise termination impedances are not taken into account, or coarse estimates of them are considered. Although all approaches allow filtered SMPS to pass the regulation limits, designing EMI filters with the accurate noise source and termination impedances leads to optimal component values and avoids overdesign.
93 citations
TL;DR: The authors present measurement results that illustrate typical LF noise behavior in small-area MOSFETs, and a model based on Shockley-Read-Hall statistics to explain the behavior.
Abstract: In small-area MOSFETs widely used in analog and RF circuit design, low-frequency (LF) noise behavior is increasingly dominated by single-electron effects. In this paper, the authors review the limitations of current compact noise models which do not model such single-electron effects. The authors present measurement results that illustrate typical LF noise behavior in small-area MOSFETs, and a model based on Shockley-Read-Hall statistics to explain the behavior. Finally, the authors treat practical examples that illustrate the relevance of these effects to analog circuit design. To the analog circuit designer, awareness of these single-electron noise phenomena is crucial if optimal circuits are to be designed, especially since the effects can aid in low-noise circuit design if used properly, while they may be detrimental to performance if inadvertently applied.
92 citations