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Polycrystalline silicon

About: Polycrystalline silicon is a research topic. Over the lifetime, 19554 publications have been published within this topic receiving 198222 citations. The topic is also known as: polysilicon & poly-Si.


Papers
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Patent
12 Sep 2003
TL;DR: The inclusion of germanium in the silicide provides a wider temperature range within which the monosilicide phase may be formed, while essentially preserving the superior sheet resistance exhibited by nickel mono-silicide.
Abstract: A MOSFET gate or a MOSFET source or drain region comprises silicon germanium or polycrystalline silicon germanium. Silicidation with nickel is performed to form a nickel germanosilicide (62, 64) that preferably comprises the monosilicide phase of nickel silicide. The inclusion of germanium in the silicide provides a wider temperature range within which the monosilicide phase may be formed, while essentially preserving the superior sheet resistance exhibited by nickel monosilicide. As a result, the nickel germanosilicide is capable of withstanding greater temperatures during subsequent processing than nickel monosilicide, yet provides approximately the same sheet resistance and other beneficial properties as nickel monosilicide.

101 citations

Patent
01 Mar 1996
TL;DR: In this paper, a micro-mechanical component is cut out from a base plate (20) made of a first crystalline material by anisotropic attack, which takes effect in the direction of the thickness of the plate using a gas excited by plasma, surrounding a mask (30) of the required shape mounted above the plate.
Abstract: of EP0732635A micro-mechanical component is cut out from a base plate (20) made of a first crystalline material by anisotropic attack. This process takes effect in the direction of the thickness of the plate using a gas excited by plasma, surrounding a mask (30) of the required shape mounted above the plate. This first material may be either mono-crystalline or polycrystalline silicon or its oxide or its nitride. The parts of the component which are intended to come into contact with another component are re-coated by chemical deposition from the vapour phase with a second material. The second material is chosen to offer suitable coefficients of hardness and wear resistance for their task. The second material may, for example, be crystalline carbon in the form of diamond.

100 citations

Journal ArticleDOI
TL;DR: The mechanism of cyclic fatigue failure in silicon thin films has remained a mystery since nearly a decade ago as mentioned in this paper, when it was reported that silicon does not display the room temperature plasticity or extrinsic toughening mechanisms necessary to cause fatigue in either ductile (e.g., metals) or brittle materials.
Abstract: Reported nearly a decade ago, cyclic fatigue failure in silicon thin films has remained a mystery. Silicon does not display the room temperature plasticity or extrinsic toughening mechanisms necessary to cause fatigue in either ductile (e.g., metals) or brittle (e.g., ceramics and ordered mintermetallic) materials.

100 citations

Patent
Billy L. Crowder1, Arnold Reisman1
01 Mar 1979
TL;DR: An improved interconnection for semiconductor integrated circuits is provided by a member made of doped polycrystalline silicon and metal silicide that provides the simultaneous advantages of high conductivity and reduced overlap capacitance in multilayer integrated circuit devices as discussed by the authors.
Abstract: An improved interconnection for semiconductor integrated circuits is provided by a member made of doped polycrystalline silicon and metal silicide that provides the simultaneous advantages of high conductivity and reduced overlap capacitance in multilayer integrated circuit devices. Such interconnecting members are useable to produce field effect transistor type devices.

100 citations

Patent
Gregory M. Chrysler1, Ravi Prasher1
29 Dec 2003
TL;DR: In this paper, a method and apparatus for cooling an electronics chip with a cooling plate having integrated micro channels and manifold/plenum made in separate single-crystal silicon or low-cost polycrystalline silicon.
Abstract: A method and apparatus for cooling an electronics chip with a cooling plate having integrated micro channels and manifold/plenum made in separate single-crystal silicon or low-cost polycrystalline silicon. Forming the microchannels in the cooling plate is more economical than forming the microchannels directly into the back of the chip being cooled. In some embodiments, the microchannels are high-aspect-ratio grooves formed (e.g., by etching) into a polycrystalline silicon cooling base, which is then attached to a cover (to contain the cooling fluid in the grooves) and to the back of the chip.

99 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
202343
2022130
2021122
2020313
2019498
2018534