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Power integrity

About: Power integrity is a research topic. Over the lifetime, 983 publications have been published within this topic receiving 6867 citations.


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Proceedings ArticleDOI
19 Dec 2011
TL;DR: In this article, a three-stage power integrity check was proposed to account for standard PI tools' capacity limitation of on-die short and high time resolution and die + package long and low time resolution PI analysis.
Abstract: Described an importance, complexity and limitations of power distribution network analysis in Deep Submicron Designs. Proposed a three-stage way of Power Integrity (PI) checks to account for standard PI tools' capacity limitation of on-die short and high time resolution and die + package long and low time resolution PI analysis.

1 citations

Journal ArticleDOI
25 Nov 2015
TL;DR: This work summarizes the recent enhancements of “Mpilog”-class macromodels for high-speed I/O-buffers for SI&PI co-simulations.
Abstract: Due to increasingly stringent low-cost and small form-factor design constraints, Signal and Power Integrity analyses (SI&PI) have gained a paramount importance in the definition and optimization of mobile platforms. Operating margins are dramatically reduced in order to meet all the required design targets and constraints (extensive re-use, time-to-market, etc.). In this scenario, transistor-level simulations for platform-level analyses are inefficient and often, impractical. I/O-buffer models become essential and their accuracy is crucial for the reliability of SI&PI studies. As data-rates increase, signaling swing reduces and power-supply voltage noise becomes inevitable, state-of-the-art legacy models are limited for SI&PI co-simulations. This work summarizes the recent enhancements of “Mpilog”-class macromodels for high-speed I/O-buffers. Mpilog macromodels reproduce voltage and currents at I/O and (multiple) supply ports as weighted combinations of pull-up/pull-down static and dynamic components. The...

1 citations

Proceedings ArticleDOI
22 Sep 2016
TL;DR: In this article, the authors show that the supply integrity is a function of the rail clamp gain, its speed of response to ESD, and the amount of on-chip supply decoupling capacitance.
Abstract: On-chip power supply integrity may be compromised during a power-on ESD event, e.g. system-level ESD. Experimental data are provided to show that the supply integrity is a function of the rail clamp gain, its speed of response to ESD, and the amount of on-chip supply decoupling capacitance. It is also demonstrated that just a few nH of package inductance can cause the on-chip supply to briefly collapse, regardless of the rail clamp response speed.

1 citations

Proceedings ArticleDOI
01 Oct 2015
TL;DR: The advantages of on-chip linear VRM are validated by measuring fabricated chip and showing PDN self-impedance at output buffer by simulation with designed PCB's S-parameter, and eye-diagram power fluctuation up to 1 Gbps.
Abstract: By applying on-chip linear VRM, PDN inductance is greatly decreased and PDN resonance peak disappears, which is usually generated by PCB/PKG inductance and on-chip capacitance. To confirm, we design an application circuits which have on-chip linear voltage regulator module (VRM) with aggressor and victim buffer. We validate the advantages of on-chip linear VRM by measuring fabricated chip in this research. Moreover, we show PDN self-impedance at output buffer by simulation with designed PCB's S-parameter, and eye-diagram power fluctuation up to 1 Gbps.

1 citations

Proceedings ArticleDOI
25 Mar 2020
TL;DR: An in-depth evaluation of the impacts of process and temperature variations on HVR is presented and a systemic solution to incorporate variation awareness into the HVR system control policy is proposed to add up to 4.28% in system power efficiency with minimal hardware overhead.
Abstract: Large-scale systems-on-a-chips (SoCs) have stringent power requirements to ensure adequate supply of power to on-die devices and prevent catastrophic timing violations. Heterogeneous voltage regulation (HVR) leveraging a combination of on-chip and off-chip voltage regulators has been advocated for ensuring power integrity with maximum efficiency. However, unavoidable process and temperature variations have not been considered in prior HVR work. In this paper, we present an in-depth evaluation of the impacts of process and temperature variations on HVR. Furthermore, we propose a systemic solution to incorporate variation awareness into the HVR system control policy to add a further improvement of up to 4.28% in system power efficiency with minimal hardware overhead.

1 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
202312
202267
202139
202045
201965
201852