Topic
Power network design
About: Power network design is a research topic. Over the lifetime, 941 publications have been published within this topic receiving 11552 citations.
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09 May 2012TL;DR: DSENT, a NoC modeling tool for rapid design space exploration of electrical and opto-electrical networks, is presented and the results show the implications of different technology scenarios and the need to reduce laser and thermal tuning power in a photonic network due to their non-data-dependent nature.
Abstract: With the rise of many-core chips that require substantial bandwidth from the network on chip (NoC), integrated photonic links have been investigated as a promising alternative to traditional electrical interconnects While numerous opto-electronic NoCs have been proposed, evaluations of photonic architectures have thus-far had to use a number of simplifications, reflecting the need for a modeling tool that accurately captures the tradeoffs for the emerging technology and its impacts on the overall network In this paper, we present DSENT, a NoC modeling tool for rapid design space exploration of electrical and opto-electrical networks We explain our modeling framework and perform an energy-driven case study, focusing on electrical technology scaling, photonic parameters, and thermal tuning Our results show the implications of different technology scenarios and, in particular, the need to reduce laser and thermal tuning power in a photonic network due to their non-data-dependent nature
529 citations
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TL;DR: In this article, power consumption of logic circuits, interconnections, clock distribution, on chip memories, and off chip driving in CMOS VLSI has been estimated and an estimate tool is created.
Abstract: Power consumption from logic circuits, interconnections, clock distribution, on chip memories, and off chip driving in CMOS VLSI is estimated. Estimation methods are demonstrated and verified. An estimate tool is created. Power consumption distribution between interconnections, clock distribution, logic gates, memories, and off chip driving are analyzed by examples. Comparisons are done between cell library, gate array, and full custom design. Also comparisons between static and dynamic logic are given. Results show that the power consumption of all interconnections and off chip driving can be up to 20% and 65% of the total power consumption respectively. Compared to cell library design, gate array designed chips consume about 10% more power, and power reduction in full custom designed chips could be 15%. >
456 citations
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TL;DR: This paper presents a new technique for analyzing a power grid using macromodels that are created for a set of partitions of the grid, and shows that even for a 60 million-node power grid, the approach allows for an efficient analysis, whereas previous approaches have been unable to handle power grids of such size.
Abstract: Careful design and verification of the power distribution network of a chip are of critical importance to ensure its reliable performance. With the increasing number of transistors on a chip, the size of the power network has grown so large as to make the verification task very challenging. The available computational power and memory resources impose limitations on the size of networks that can be analyzed using currently known techniques. Many of today's designs have power networks that are too large to be analyzed in the traditional way as flat networks. In this paper, we propose a hierarchical analysis technique to overcome the aforesaid capacity limitation. We present a new technique for analyzing a power grid using macromodels that are created for a set of partitions of the grid. Efficient numerical techniques for the computation and sparsification of the port admittance matrices of the macromodels are presented. A novel sparsification technique using a 0-1 integer linear programming formulation is proposed to achieve superior sparsification for a specified error. The run-time and memory efficiency of the proposed method are illustrated on industrial designs. It is shown that even for a 60 million-node power grid, our approach allows for an efficient analysis, whereas previous approaches have been unable to handle power grids of such size.
284 citations
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15 Nov 2007
TL;DR: In this article, the authors describe methods for distributing power in high speed, high complexity integrated circuits with power levels exceeding many tens of watts and power supplies below a volt, including inductance models for interdigitated structures, design strategies for multi-layer power grids, advanced methods for efficient power grid design and analysis, and methodologies for simultaneously placing multiple power supplies and decoupling capacitors.
Abstract: This book describes methods for distributing power in high speed, high complexity integrated circuits with power levels exceeding many tens of watts and power supplies below a volt. It provides a broad and cohesive treatment of power distribution systems and related design problems, including both circuit network models and design techniques for on-chip decoupling capacitors, providing insight and intuition into the behavior and design of on-chip power distribution systems. Organized into subareas to provide a more intuitive flow to the reader, this second edition adds more than a hundred pages of new content, including inductance models for interdigitated structures, design strategies for multi-layer power grids, advanced methods for efficient power grid design and analysis, and methodologies for simultaneously placing on-chip multiple power supplies and decoupling capacitors. The emphasis of this additional material is on managing the complexity of on-chip power distribution networks.
197 citations
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01 May 2005TL;DR: Experimental results show the effectiveness of the novel low-capture-power X-filling method in reducing capture power dissipation without any impact on area, timing, and fault coverage.
Abstract: Research on low-power scan testing has been focused on the shift mode, with little or no consideration given to the capture mode power. However, high switching activity when capturing a test response can cause excessive IR drop, resulting in significant yield loss. This paper addresses this problem with a novel low-capture-power X-filling method by assigning 0's and 1's to unspecified (X) bits in a test cube to reduce the switching activity in capture mode. This method can be easily incorporated into any test generation flow, where test cubes are obtained during ATPG or by X-bit identification. Experimental results show the effectiveness of this method in reducing capture power dissipation without any impact on area, timing, and fault coverage.
183 citations