Showing papers on "Process corners published in 1974"
Patent•
03 Jun 1974
TL;DR: In this paper, a self-configurable circuit structure and method for forming the same, for achieving wafer scale integration including the combination of an integrated circuit wafer having an input and an output, wafer control means to provide test and operational modes, at least one unit circuit on the wafer connected to the Wafer Control means, coupled between the input and output.
Abstract: A self-configurable circuit structure and method for forming the same, for achieving wafer scale integration including the combination of an integrated circuit wafer having an input and an output, wafer control means to provide test and operational modes, at least one unit circuit on the wafer connected to the wafer control means, coupled between the wafer input and output. The unit circuit includes a semi-conductor chip, test means for functional testing of the chip and circuit control means responsive to the output of the test means to intercouple the unit circuit if it is properly functioning between the wafer input and output to form a functional circuit.
93 citations