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Process corners

About: Process corners is a research topic. Over the lifetime, 912 publications have been published within this topic receiving 9116 citations.


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Journal ArticleDOI
TL;DR: In this article, a new compensation technique for the low noise amplifier (LNA) with the high capability and efficiency for low power applications is proposed, where the output of the compensator circuit is adjusted according to changes in temperature, voltage and five process corners.
Abstract: In this paper, a new compensation technique for the low noise amplifier (LNA) with the high capability and efficiency for low power applications is proposed. The supply voltage and bias of the LNA are near the sub-threshold voltage, which has excellent effect on reducing power consumption. At this voltage level, the gain decreases and the various circuit parameters become extremely sensitive to process, voltage and temperature (PVT) changes. To overcome the problem, a compensating circuit with variable current source to control the LNA bias voltage is used. The output of the compensator circuit is adjusted according to changes in temperature, voltage and five process corners, and produces a variable voltage. The temperature compensator consists of two current sources that produce a current proportional to temperature changes. Regarding process and voltage compensator, according to the state created in the circuit, the appropriate amount of current is injected through the output and finally stabilizes the main parameters of the LNA circuit. In LNA circuit, for proper performance at supply voltage near the sub-threshold and attaining the gain improvement, forward body bias and gm-boosting techniques are employed, respectively. The LNA circuit along with the PVT compensator at supply voltage of 0.35V, consumes about 567µW power consumption that here 91µW is caused by the PVT compensator circuit. In the proposed circuit, the rate of noise figure (NF) and gain (S21) changes compared to temperature changes in the five corners have decreased by 4.3 and 12.1 times versus LNA with constant bias, respectively. In this case, with 20% changes of VDD, NF and S21 changes decreased by 23 and 11.35 times, respectively. The results are provided by Cadence software using 65nm CMOS technology.

1 citations

Journal ArticleDOI
TL;DR: In this article , a constant-gm bias circuit is proposed to mitigate the sensitivity of phase-locked loop (PLL) to process voltage temperature (PVT) corners, and a prototype of 4-stage ring oscillator with center frequency of 5 GHz was developed in 65nm TSMC CMOS technology.
Abstract: Phase Locked Loop (PLL) is an on-chip clock generator for timing-centric electronic systems. Voltage Controlled Oscillator (VCO) is the key element for high-performance PLLs. A detailed qualitative explanation has been given to describe VCO operation. It is shown from simulation results that the variation of small signal transconductance ([Formula: see text]) is the main dominant source of frequency and gain ([Formula: see text]) variation in a VCO. In this work, simulation results for the conventional ring oscillator are presented which demonstrates [Formula: see text] times variation in [Formula: see text] across Process Voltage Temperature (PVT) corners. Such huge sensitivity to PVT is undesirable for high bandwidth PLL design. To mitigate this sensitivity, a constant-gm bias circuit is proposed in this paper, with a detailed mathematical analysis. A prototype of 4-stage ring oscillator with center frequency of 5[Formula: see text]GHz is developed in 65[Formula: see text]nm TSMC CMOS technology, and post-layout simulation results are carried out. Results show that maximum [Formula: see text] variation of 28% and frequency variation of 17% at a given control voltage. Temperature sensitivity has been decreased from 19.3% to 7% using the proposed biasing technique. Proposed solution consumes 2.4[Formula: see text]mW power from 1[Formula: see text]V power supply.

1 citations

01 Jan 2008
TL;DR: In this article, a driving circuit for a semiconductor laser was designed and the operation principle and design ideas of the constant current and voltage circuits in the laser driving circuit were described.
Abstract: A driving circuit for a semiconductor laser is designed.The structure of the semiconductor laser and its circuit are presented.The operation principle and design ideas of the constant current and voltage circuits in the semiconductor laser driving circuit are described.The power consumption of the semiconductor laser is decreased effectively after a constant voltage circuit module is added in the design of the circuit.

1 citations

Journal ArticleDOI
01 Jan 2016
TL;DR: A low energy consumption 3-input AND/XOR gate is proposed by employing multi-rails and hybrid-CMOS techniques to improve its speed and short the signal transimission path in power and power delay product (PDP).
Abstract: 3-input AND/XOR is the basic complex gate of Reed-Muller logic. Low energy consumption is important for Reed-Muller logic circuit implementation. Against the drawbacks of the published gate-level and transistor-level 3-input AND/XOR gate design in power and power delay product (PDP), a low energy consumption 3-input AND/XOR gate is proposed by employing multi-rails and hybrid-CMOS techniques to improve its speed and short the signal transimission path. Under 55nm CMOS process, post-simulations in different process corners are carried out by using HSPICE and compared with the published circuits. Simulation results show that the proposed circuit has advantages over published designs. For typical process corners, the improvement of the proposed circuit can be up to 27.21%, 19.23% and 35.39%, respectively, in terms of power, delay and power delay product.

1 citations

Patent
13 Sep 2018
TL;DR: In this article, a 3DIC process variation measurement circuit (PVMC) is provided to measure process variation, which can be used to dynamically control supply voltage provided to the 3D IC such that operation of the 3-DIC approaches a desired process corner.
Abstract: Dynamically controlling voltage provided to three-dimensional (3D) integrated circuits (ICs) (3DICs) to account for process variations measured across interconnected IC tiers of 3DICs are disclosed herein. In one aspect, a 3DIC process variation measurement circuit (PVMC) is provided to measure process variation. The 3DIC PVMC includes stacked logic PVMCs configured to measure process variations of devices across multiple IC tiers and process variations of vias that interconnect multiple IC tiers. The 3DIC PVMC may include IC tier logic PVMCs configured to measure process variations of devices on corresponding IC tiers. These measured process variations can be used to dynamically control supply voltage provided to the 3DIC such that operation of the 3DIC approaches a desired process corner. Adjusting supply voltage using the 3DIC PVMC takes into account interconnected properties of the 3DIC such that the supply voltage is adjusted to cause the 3DIC to operate in the desired process corner.

1 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
202311
202226
202138
202047
201943
201864