Topic
Propagation constant
About: Propagation constant is a research topic. Over the lifetime, 3784 publications have been published within this topic receiving 58942 citations. The topic is also known as: γ & propagation constant.
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TL;DR: Simple formulas and functions for the fiber parameters are presented as a help for practical design work that considers the propagation constant, mode delay, the cladding field depth, and the power distribution in the fiber cross section.
Abstract: Thin glass fibers imbedded into a glass cladding of slightly lower refractive index represent a promising medium for optical communication. This article presents simple formulas and functions for the fiber parameters as a help for practical design work. It considers the propagation constant, mode delay, the cladding field depth, and the power distribution in the fiber cross section. Plots vs frequency of these parameters are given for 70 modes
1,506 citations
17 Jan 2005
TL;DR: In this article, a numerical multimode calibration procedure is proposed and developed with a commercial software package on the basis of a full-wave finite-element method for the accurate extraction of complex propagation constants of the SIW structure.
Abstract: The substrate integrated waveguide (SIW) technique makes it possible that a complete circuit including planar circuitry, transitions, and rectangular waveguides are fabricated in planar form using a standard printed circuit board or other planar processing techniques. In this paper, guided wave and modes characteristics of such an SIW periodic structure are studied in detail for the first time. A numerical multimode calibration procedure is proposed and developed with a commercial software package on the basis of a full-wave finite-element method for the accurate extraction of complex propagation constants of the SIW structure. Two different lengths of the SIW are numerically simulated under multimode excitation. By means of our proposed technique, the complex propagation constant of each SIW mode can accurately be extracted and the electromagnetic bandstop phenomena of periodic structures are also investigated. Experiments are made to validate our proposed technique. Simple design rules are provided and discussed.
1,356 citations
TL;DR: The dispersion equation of injected surface-plasma waves that propagate on thin metal films has been solved as a function of the film thickness, and splitting of the modes into two branches is observed.
Abstract: The dispersion equation of injected surface-plasma waves that propagate on thin metal films has been solved as a function of the film thickness, and splitting of the modes into two branches is observed. For one branch the imaginary part of the propagation constant goes to zero as the thickness of the metal decreases. Reflectivity calculations agree with this result, which predicts that one can obtain propagation distances that are more than 1 order of magnitude larger than observed before.
881 citations
Abstract: A theory for combined differential and common-mode normalized power waves is developed in terms of even and odd mode impedances and propagation constants for a microwave coupled line system. These are related to even and odd-mode terminal currents and voltages. Generalized s-parameters of a two-port are developed for waves propagating in several coupled modes. The two-port s-parameters form a 4-by-4 matrix containing differential-mode, common-mode, and cross-mode s-parameters. A special case of the theory allows the use of uncoupled transmission lines to measure the coupled-mode waves. Simulations verify the concept of these mixed-mode s-parameters, and demonstrate conversion from mode to mode for asymmetric microwave structures. >
780 citations
TL;DR: In this article, a methodology for extracting high-frequency IC interconnect transmission parameters directly from S-parameter measurements has been demonstrated using on-chip test structures, which consists of: (1) building onchip interconnect structures for microwave test, (2) characterizing and subtracting measurement system parasitics, extracting the transmission line impedance and propagation constant (attenuation constant and phase constant) from the calibrated data, and (4) extracting the Telegrapher's Equation transmission parameters (R, L, C, and G).
Abstract: A methodology for extracting high-frequency IC interconnect transmission parameters directly from S-parameter measurements has been demonstrated using on-chip test structures. The methodology consists of: (1) building on-chip interconnect structures for microwave test, (2) characterizing and subtracting measurement system parasitics, (3) extracting the transmission line impedance and propagation constant (attenuation constant and phase constant) from the calibrated data, and (4) extracting the Telegrapher's Equation transmission parameters (R, L, C, and G). Additional on-chip calibration permits subtraction of pad parasitic effects. This methodology is demonstrated over a 45-MHz to 20-GHz frequency range using an example 1-cm-long, 4- mu m-wide IC interconnect built in an advanced BiCMOS technology. Variations in interconnect impedance and capacitance indicate two signal propagation modes. Significant substrate-based loss is measured at microwave frequencies. >
627 citations