Reflector (antenna)

About: Reflector (antenna) is a research topic. Over the lifetime, 28730 publications have been published within this topic receiving 212618 citations.

High brightness light-emitting device and manufacturing process of the light-emitting device

Abstract: A light-emitting device comprises a multi-layer structure including one or more active layer configured to irradiate light in response to the application of an electric signal, a transparent passivation layer laid over an outmost surface of the multi-layer stack, a reflector layer laid over the passivation layer, and a plurality of electrode pads coupled with the multi-layer structure. In a manufacture process of the light-emitting device, the reflector layer and the passivation layer are patterned to form at least one opening exposing an area of the multi-layer structure. One electrode pad is formed through the opening of the reflector layer and the passivation layer to connect with the multi-layer structure.

Double-loop frequency selective surfaces for multi frequency division multiplexing in a dual reflector antenna

Abstract: A multireflector antenna utilizes a frequency-selective surface (FSS) in a subreflector to allow signals in two different RF bands to be selectively reflected back into a main reflector and to allow signals in other RF bands to be transmitted through it to the main reflector for primary focus transmission. A first approach requires only one FSS at the subreflector which may be an array of double-square-loop conductive elements. A second approach uses two FSS's at the subreflector which may be an array of either double-square-loop (DSL) or double-ring (DR). In the case of DR elements, they may be advantageously arranged in a triangular array instead of the rectangular array for the DSL elements.

Beam diffraction by planar and parabolic reflectors

Abstract: In the complex source point technique, an omnidirectional source diffraction solution becomes that for a directive beam when the coordinates of the source position are given appropriate complex values. This is applied to include feed directivity in reflector edge diffraction. Solutions and numerical examples for planar strip and parabolic cylinder reflectors are given, including an offset parabolic reflector. The main beams of parabolic reflectors are calculated by aperture integration and the edge diffracted fields by uniform diffraction theory. In both cases, a complex source point feed in the near or far field of the reflector may be used in the pattern calculation, with improvements in accuracy in the lateral and spillover pattern lobes. >

MS-MS time-of-flight mass spectrometer

Abstract: In an MS-MS time-of-flight mass spectrometer, a space focus of the ion source is defined by correction of the second order. If the geometrical and electric values of the ion source are suitably selected, the space focus may be such as to permit very good primary mass resolution when suitable secondary interaction methods are used. The secondary interaction at the space focus may be effected (a) by a focused, pulsed laser ray or other pulsed interaction methods that can be focused. (b) by a wire mesh consisting of very fine "line combs" engaging each other, to which voltage pulses can be applied, (c) by a combination of a) and/or b) with an electrostatically high, primary, fieldless drift path. The MS-MS time-of-flight mass spectrometer is operated using a reflector comprising a movable reflector end plate with adjustable potential, which enables primary ions to be eliminated from the spectrum without any loss in mass resolution. By tuning the reflector fields in a suitable manner, and suitable selection of an observation window in the time-of-flight spectrum, it is possible to measure a secondary mass spectrum generated at the space focus.