Relaxation oscillator

About: Relaxation oscillator is a research topic. Over the lifetime, 1952 publications have been published within this topic receiving 22326 citations.

Subharmonic Crystal Oscillators

Abstract: Relaxation oscillators are described of which the fundamental frequency is a high‐order (up to 10 000) subharmonic of the frequency of a quartz crystal which serves as the controlling element. Except for the addition of the crystal, the circuits are no more complicated than conventional ones.

The Structure of Instantaneous Phase Resetting in a Neural Oscillator

Abstract: In order to ultimately gain an understanding of the central pattern generators (CPG) involved in rhythmic motor activity such as locomotion and respiration it is necessary to understand the phase resetting behavior of the neural oscillators that comprise such circuits. In this study, we ignore action potential generation and instead focus on the underlying oscillations whose plateaus comprise the bursts and whose troughs comprise the interburst hyperpolarizations. We have examined the structure of phase resetting in neural oscillators. As an illustrative example, we will use Morris-Lecar oscillator, which, despite its simplicity, reproduces with sufficient accuracy the membrane potential envelope of a neural oscillator. The qualitative characterization of a limit cycle oscillator as a phase oscillator, a relaxation oscillator, or an intermediate determines the relationship between time elapsed (temporal phase) and distance traversed along the limit cycle (geometric phase). A mapping between geometric phase and temporal phase was found to provide insight into the shape of the phase resetting curve (PRC).

Open Defect Detection in Assembled Circuit Boards With Built-In Relaxation Oscillators

Abstract: In this article, we propose two kinds of electrical interconnect test methods for production tests and field ones of assembled circuit boards, which are performed prior to and after shipping to market, respectively. For these tests, we also propose a built-in test circuit. The methods we followed are based on the oscillation frequency of a relaxation oscillator (ROsc) embedded in integrated circuits (ICs). The frequency is measured as the number of pulse signals within a specified test time. Using the test methods, open defects at the interconnects between IC pins and a printed circuit board (PCB) are detected that are modeled as a resistor, a capacitor, and an open-circuit fault. We examined the detectability of open defects using the process variations afforded by SPICE simulation. The simulation results show that open defects were detected, modeled as a resistor of 45.8 $\Omega $ or above, along with open defects modeled as a capacitor and an open-circuit fault using the production test method. In addition, a resistance increase of 1.2 $\Omega $ at defect-free interconnects occurred after shipping to market was detected using the field test method. We also prototyped ICs with embedded ROscs and built an experimental circuit made of the ICs on PCBs. Moreover, we experimentally examined whether open defects could be detected. The results show that with the production test method, open defects modeled as a resistor of 10 $\Omega $ or above and modeled as a capacitor and an open-circuit fault can be detected.