Topic
Relaxation oscillator
About: Relaxation oscillator is a research topic. Over the lifetime, 1952 publications have been published within this topic receiving 22326 citations.
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01 Sep 1975
TL;DR: In this paper, an analysis for the voltage versus frequency characteristics of a varactor modulated VHF voltage controlled oscillator is presented, in which the frequency deviation is linearized by using the nonlinear characteristics of the field effect transistor as a signal amplifier.
Abstract: An analysis is presented for the voltage versus frequency characteristics of a varactor modulated VHF voltage controlled oscillator in which the frequency deviation is linearized by using the nonlinear characteristics of a field effect transistor as a signal amplifier. The equations developed are used to calculate the oscillator output frequency in terms of pertinent circuit parameters. It is shown that the nonlinearity exponent of the FET has a pronounced influence on frequency deviation linearity, whereas the junction exponent of the varactor controls total frequency deviation for a given input signal. A design example for a 250 MHz frequency modulated oscillator is presented.
Patent•
01 Dec 1982
TL;DR: In this paper, a starting generator was proposed to reduce the starting time of an oscillator in a switching device. But the starting voltage was not provided to the oscillator, which is immediately available in the form of a starting voltage immediately after each removal of the damping action.
Abstract: An electronic switching device (1) operating without contact is represented and described, which comprises an oscillator (10) which can be influenced from the outside, a switched-mode amplifier (11), an electronic switch (12) which can be controlled by the oscillator (10) via the switched-mode amplifier (11), and a feed circuit (13) for generating the feed voltage for the oscillator (10) and for the switched-mode amplifier (11). In such switching devices (1), the oscillator (10) must start again after each damping action and the subsequent removal of the damping. The time needed by the oscillator (10) for coming from the non-oscillating state into the oscillating state, the starting time, is a criterion of the maximum switching frequency permitted by such a switching device (1). To reduce the starting time of the oscillator (10) in switching devices (1) of the type being discussed, a starting generator (14) is provided which generates a starting voltage containing the oscillating frequency, which voltage is coupled into the oscillator (10). According to the invention, a starting aid is thus provided to the oscillator (10) for the starting, which is immediately available in the form of the starting voltage immediately after each removal of the damping of the oscillator (10).
01 Jan 1978
TL;DR: In this paper, the behavior of a general free-rorand-g moltivibrator circuit is investigated, which is a higher dimensional generalization of the van der Pol relaxation oscillator equations.
Abstract: ,Absfmcr-The behavior of a general free-ror&g moltivibrator circuit is investigated. The circuit contafns two three-terminal active devices drawing control current and subject to satoration, and various. passive circuit elements, some of which are parasitic. The operation of the multivibrator is described by a system of nonlinear equations which is a higher dimensional generalization of the van der Pol relaxation oscillator equations. Tbe methods of sing&r perturbation theory are applied to show under what circomstances the multivibrator will, and onder what circm&ao~ it wtll not, oscillate. ‘Ibe period and waveform of the osciffations are also obtained. I. INTRODUCTION
19 May 2013
TL;DR: A new monitoring circuit, consisting of a pMOS device experiencing accelerated NBTI stress, a Capacitive Switch, Relaxation Oscillator structure, serving as a monitoring unit, which allows to dynamically track the N BTI-induced degradation with time.
Abstract: The paper introduces a new monitoring circuit to quantify the change in performance of devices undergoing NBTI stress at 65nm technology node. The proposed solution consists of a pMOS device experiencing accelerated NBTI stress, a Capacitive Switch, Relaxation Oscillator structure, serving as a monitoring unit, which allows to dynamically track the NBTI-induced degradation with time. The circuit measures the change of the relaxation frequency which is attributed to the saturation current shift in pMOSFET due to NBTI stress. The proposed circuit with counting unit produces a digital output which makes it easier to collect. The capacitive relaxation oscillator modeling has been established and verified by the experiments. Meanwhile, the circuit is easily to be integrated with the digital logic system. Based on the device matrix, the effect of initial saturation current distribution and NBTI-induced time-dependent variability can also be obtained.