Rise time

About: Rise time is a research topic. Over the lifetime, 4748 publications have been published within this topic receiving 47512 citations.

Nanosecond current probe for high‐voltage experiments

Abstract: A matched, slow wave transmission line is used as a current probe. It provides a linear response, fast rise time (τr <2 ns) and high‐voltage gain (≂1 V/A) for current pulses up to microsecond duration.

A DFT Approach for Testing Embedded Systems Using DC Sensors

Abstract: In this article, we propose a sensor-based BIT scheme By using sensors, we mitigate any issues related to signal integrity and diversity in the test response capture process Also, BIT can provide a test framework to estimate specifications during production testing for various modules in a heterogeneous SoC or SiP This scheme involves designing sensors for each module directly into the device under test (DUD and capturing sensor outputs that are low-frequency DC signals A low-frequency mixed-signal tester can capture these sensor responses, analyze them to infer each specific module's performance, and determine the overall pass-fail decision for the DUT The embedded sensors perform the necessary signal conditioning of the DUT output signals, thereby significantly reducing the ATE's response capture and analysis overhead As an example, it's possible to test a digital module for rise time by incorporating an integrator at the output node as a sensor As the output node voltage increases, the integrator's output capacitance charges to a DC value The ATE samples the capacitor's DC voltage at a specific time, and the DC voltage would be proportional to the DUT's rise time In this case, there would be no need to sample the rising waveform, and the ATE's digitizer requirements could be significantly relaxed This example indicates that during production testing, carefully chosen sensors can effectively simplify the overall test procedure

Optoelectronic measurement of the transfer function and time response of a 70 GHz sampling oscilloscope

Abstract: The transfer characteristics of a nominal 70 GHz sampling oscilloscope are measured using time-domain optoelectronic techniques. It is shown that the optoelectronic measurement set-up provides the bandwidth required to determine the full complex transfer function of the oscilloscope, which is completely characterized in the frequency and time domain. The investigated oscilloscope has a 3 dB bandwidth of 84 GHz and its step response shows a 10%–90% rise time of 4.8 ps. The uncertainty of the rise-time measurement is 1.2 ps.

Effect of surface tension on the acoustic radiation pressure-induced motion of the water-air interface

Abstract: The displacement of a water–air interface and its relaxation as a function of acoustic energy density and surface tension were analyzed both experimentally and numerically. Experimental systems were devised to observe the time evolution of the surface. A theoretical model to predict the response of the interface to acoustic excitation was also developed. It was found that the Langevin pressure due to a focused acoustic beam will cause the interface to rise to a height that is a function of the energy density of the beam. The rise time, which is the time it takes for the wafer surface to rise to its maximum height, was found to be independent of the incident energy, but was found to be a function of the surface tension. The time of mound formation measurements in clean water at low‐energy acoustic excitations were found to be within 20% of the simulation results. These results imply that surface rise time measurements may present a novel way of measuring surface tension of water–surfactant combinations accurately and rapidly by a simple noncontacting technique.