Topic
Scanning ion-conductance microscopy
About: Scanning ion-conductance microscopy is a research topic. Over the lifetime, 3507 publications have been published within this topic receiving 88018 citations. The topic is also known as: SICM.
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TL;DR: In this paper, surface microscopy using vacuum tunneling has been demonstrated for the first time, and topographic pictures of surfaces on an atomic scale have been obtained for CaIrSn 4 and Au.
Abstract: Surface microscopy using vacuum tunneling is demonstrated for the first time. Topographic pictures of surfaces on an atomic scale have been obtained. Examples of resolved monoatomic steps and surface reconstructions are shown for (110) surfaces of CaIrSn 4 and Au.
4,290 citations
TL;DR: In this article, it was shown that carbon nanotubes might constitute well defined tips for scanning probe microscopy, and they were attached to the silicon cantilevers of conventional atomic force microscopes.
Abstract: SINCE the invention of the scanning tunnelling microscope1, the value of establishing a physical connection between the macroscopic world and individual nanometre-scale objects has become increasingly evident, both for probing these objects2–4 and for direct manipulation5–7 and fabrication8–10 at the nanometre scale. While good progress has been made in controlling the position of the macroscopic probe of such devices to sub-angstrom accuracy, and in designing sensitive detection schemes, less has been done to improve the probe tip itself4. Ideally the tip should be as precisely defined as the object under investigation, and should maintain its integrity after repeated use not only in high vacuum but also in air and water. The best tips currently used for scanning probe microscopy do sometimes achieve sub-nanometre resolution, but they seldom survive a 'tip crash' with the surface, and it is rarely clear what the atomic configuration of the tip is during imaging. Here we show that carbon nanotubes11,12 might constitute well defined tips for scanning probe microscopy. We have attached individual nanotubes several micrometres in length to the silicon cantilevers of conventional atomic force microscopes. Because of their flexibility, the tips are resistant to damage from tip crashes, while their slenderness permits imaging of sharp recesses in surface topography. We have also been able to exploit the electrical conductivity of nanotubes by using them for scanning tunnelling microscopy.
2,179 citations
TL;DR: Introduction to Biological Scanning Electron Microscopy by M. A. Hayat.
Abstract: Introduction to Biological Scanning Electron Microscopy. By M. A. Hayat. Pp.323 (University Park Press: Baltimore, Maryland, London and Tokyo, 1978.) £9.25.
1,166 citations