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Schottky barrier

About: Schottky barrier is a research topic. Over the lifetime, 22570 publications have been published within this topic receiving 427746 citations. The topic is also known as: Schottky barrier junction.


Papers
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Journal ArticleDOI
TL;DR: It is shown that the Schottky barrier height at the nanotube/metal interface can be diminished in a continuous fashion down to an almost ohmic contact through these chemical treatments.
Abstract: We present the improvement of carbon nanotube field effects transistors (CNTFETs) performances by chemical tuning of the nanotube/substrate and nanotube/electrode interfaces. Our work is based on a method of selective placement of individual single walled carbon nanotubes (SWNTs) by patterned aminosilane monolayer and its use for the fabrication of self-assembled nanotube transistors. This method brings a relevant solution to the problem of systematic connection of self-organized nanotubes. The aminosilane monolayer reactivity can be used to improve carrier injection and doping level of the SWNT. We show that the Schottky barrier height at the nanotube/metal interface can be diminished in a continuous fashion down to an almost ohmic contact through these chemical treatments. Moreover, sensitivity to 20 ppb of triethylamine is demonstrated for self-assembled CNTFETs, thus opening new prospects for gas sensors taking advantages of the chemical functionality of the aminosilane used for assembling the CNTFETs.

145 citations

Journal ArticleDOI
TL;DR: In this paper, a flame detector was fabricated using a conductive single crystal substrate using a simple method without epitaxy and vacuum processes, which is a poly(3,4-ethylene dioxythiophene) complex with polystyrene sulfonic acid (PEDOT-PSS) Schottky contact/a semi-insulating layer of β-Ga2O3/n-type region of In ohmic contact.
Abstract: An oxide semiconductor of β-Ga2O3 has a natural solar-blind sensitivity due to its large bandgap of 4.8 eV. To evaluate its potential, a flame detector was fabricated using its conductive single crystal substrate applying a simple method without epitaxy and vacuum processes. The structure is a poly(3,4-ethylene dioxythiophene) complex with polystyrene sulfonic acid (PEDOT–PSS) Schottky contact/a semi-insulating layer of β-Ga2O3/n-type region of β-Ga2O3/an In ohmic contact. The spectral response of the detector exhibited a large 250-to-300-nm rejection ratio of 1.5 ×104 and an external quantum efficiency of 18% at 250 nm. The device successfully detected a flame by distinguishing 1.5 nW/cm2 solar-blind light from the flame under a strong fluorescent lamp illumination without any visible-cut filters. This result encourages the fabrication of practical β-Ga2O3-based flame detectors.

145 citations

Journal ArticleDOI
TL;DR: In this article, the Schottky barrier at the junction between a metallic contact and a semiconducting colloidal quantum dot film was elucidated experimentally using a combination of capacitance-voltage and temperature-dependent currentvoltage measurements.
Abstract: We elucidate experimentally a quantitative physical picture of the Schottky barrier formed at the junction between a metallic contact and a semiconducting colloidal quantum dot film. We used a combination of capacitance-voltage and temperature-dependent current-voltage measurements to extract the key parameters of the junction. Three differently processed Al∕PbS colloidal quantum dot junction devices provide rectification ratios of 104, ideality factors of 1.3, and minimal leakage currents at room temperature. The Schottky barrier height is 0.4eV and the built-in potential 0.3V. The depletion width ranges from 90to150nm and the acceptor density ranges from 2×1016to7×1016cm−3.

145 citations

Journal ArticleDOI
TL;DR: A transient-mode electroluminescent device based on transition-metal dichalcogenide monolayers is demonstrated to bypass the requirement of ohmic contacts for electrons and holes, and millimetre-scale light emission from a transparent 2D display is observed.
Abstract: Transition-metal dichalcogenide monolayers have naturally terminated surfaces and can exhibit a near-unity photoluminescence quantum yield in the presence of suitable defect passivation. To date, steady-state monolayer light-emitting devices suffer from Schottky contacts or require complex heterostructures. We demonstrate a transient-mode electroluminescent device based on transition-metal dichalcogenide monolayers (MoS2, WS2, MoSe2, and WSe2) to overcome these problems. Electroluminescence from this dopant-free two-terminal device is obtained by applying an AC voltage between the gate and the semiconductor. Notably, the electroluminescence intensity is weakly dependent on the Schottky barrier height or polarity of the contact. We fabricate a monolayer seven-segment display and achieve the first transparent and bright millimeter-scale light-emitting monolayer semiconductor device.

145 citations

Journal ArticleDOI
TL;DR: A simple modelling approach is proposed to quantitatively describe the transfer characteristics of Schottky barrier-MOSFETs from ultra-thin body materials accurately in the device off-state and successfully applied the approach to extract Schotky barrier heights for electrons and holes in black phosphorus devices for a large range of body thicknesses.
Abstract: Owing to the difficulties associated with substitutional doping of low-dimensional nanomaterials, most field-effect transistors built from carbon nanotubes, two-dimensional crystals and other low-dimensional channels are Schottky barrier MOSFETs (metal-oxide-semiconductor field-effect transistors). The transmission through a Schottky barrier-MOSFET is dominated by the gate-dependent transmission through the Schottky barriers at the metal-to-channel interfaces. This makes the use of conventional transistor models highly inappropriate and has lead researchers in the past frequently to extract incorrect intrinsic properties, for example, mobility, for many novel nanomaterials. Here we propose a simple modelling approach to quantitatively describe the transfer characteristics of Schottky barrier-MOSFETs from ultra-thin body materials accurately in the device off-state. In particular, after validating the model through the analysis of a set of ultra-thin silicon field-effect transistor data, we have successfully applied our approach to extract Schottky barrier heights for electrons and holes in black phosphorus devices for a large range of body thicknesses.

145 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
2023565
2022988
2021672
2020758
2019824
2018847