Spatial filter

About: Spatial filter is a research topic. Over the lifetime, 6170 publications have been published within this topic receiving 100451 citations.

Use of single-mode waveguides to correct the optical defects of a nulling interferometer.

Abstract: In the area of long-baseline nulling interferometry, high rejection ratios are needed to cancel out the light of a bright central source and look for nearby faint structures or companions. These rejection requirements directly translate into drastic optical constraints. We discuss the possibility of using single-mode waveguides for such applications. Conversely to simple pinholes, single-mode waveguides efficiently correct wave-front defects of both high- and low-order spatial frequencies, ensure a perfect matching of the amplitude profiles coming from the various beams, and can be used with almost optimum coupling efficiency over a broad optical bandpass (typically an octave). They then appear to greatly enhance the feasibility of high-dynamic interferometric coronagraphs.

Generalized gradient schemes for the measurement of two-dimensional image motion

Abstract: This paper describes a procedure for recovering the global velocity of an image by incorporating spatial filtering, and, optionally, temporal filtering, into a scheme that employs a generalized version of the gradient algorithm of motion detection. Motion within a patch is analysed by six parallel channels, each incorporating a different spatiotemporal filter. Advantageous features of this scheme are: (a) global velocity is derived directly, without first computing local velocity at a number of image locations; (b) the filters compute first derivatives rather than second derivatives, making the scheme potentially more resistant to noise than certain other schemes; (c) two of the six filters can be chosen almost completely arbitrarily, and can therefore be tailored to maximize signal reliability, and (d) the measurement of velocity can be made as local or as global as desired by altering the size of the patch that is viewed by the filters. An analogous scheme is derived for the measurement of rotation, as well as expansion or contraction of the image.

Dynamic wave-front generation for the characterization and testing of optical systems.

Abstract: We describe a simple method for generating known optical aberrations dynamically, using a ferroelectric liquid-crystal spatial light modulator. Aberrations inherent in the optical system are measured and corrected, and as an example Kolmogorov turbulence is simulated for aperture sizes D/r(0) from 0 to 30, varying at frame rates up to 2.5 kHz. A measure of wave-front generation efficiency is introduced and is shown to be better than 86% for Kolmogorov phase screens with D/r(0) in the range from 0 to 30.

Speckle reduction track filter apparatus for optical inspection of patterned substrates

Abstract: An apparatus used to inspect patterned wafers and other substrates with periodic features for the presence of particles, defects and other aperiodic features in which a spatial filter placed in the Fourier plane is used in combination with either broadband illumination, angularly diverse illumination or both. In contrast to prior devices that direct light from a single monochromatic source through a pinhole aperture stop, embodiments are describes that illuminate a patterned substrate using (1) a single monochromatic source with a slit-shaped aperture stop for angularly diverse illumination, (2) a single broadband source with a pinhole aperture stop for broadband illumination, (3) a single broadband source with a slit-shaped aperture stop for both broadband and angularly diverse illumination, or (4) multiple sources with an aperture stop for each source for at least angularly diverse illumination. The spatial filters for these illumination systems are characterized by opaque tracks in an otherwise transmissive filter for blocking the elongated bands produced by diffraction from the periodic features on the illuminates substrate. The filter may be made photographically by exposing high contrast film placed in or near the Fourier plane to the diffracted light from a defect and particle frame substrate having only periodic features. Light scattered from the aperiodic features is able to substantially pass through the filter and be imaged onto, a CCD array, vidicon camera or TDI sensor.