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Speckle imaging

About: Speckle imaging is a research topic. Over the lifetime, 3730 publications have been published within this topic receiving 62354 citations.


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Journal ArticleDOI
TL;DR: In this article, a two-component gas of strongly interacting fermions along the Bose-Einstein condensate-BCS crossover is studied by in situ imaging of dispersive speckle patterns.
Abstract: Spin fluctuations and density fluctuations are studied for a two-component gas of strongly interacting fermions along the Bose-Einstein condensate-BCS crossover. This is done by in situ imaging of dispersive speckle patterns. Compressibility and magnetic susceptibility are determined from the measured fluctuations. This new sensitive method easily resolves a tenfold suppression of spin fluctuations below shot noise due to pairing, and can be applied to novel magnetic phases in optical lattices.

66 citations

Journal ArticleDOI
TL;DR: In this paper, an experiment in narrow spectral band speckle interferometry is described, which uses variations in the spectrum across the astronomical object under study, to obtain information of the object on the millisecond of arc scale.
Abstract: This paper describes an experiment in narrow spectral band speckle interferometry, which uses variations in the spectrum across the astronomical object under study, to obtain information of the object on the millisecond of arc scale. We plan to apply this experiment to the study of spectroscopic double stars, stellar rotation, spectroscopic and magnetic variable stars and other astronomical objects.

66 citations

Journal ArticleDOI
TL;DR: In this paper, speckle interferometry has been applied to the measurement of Young's modulus in thin films, and the results showed that the results were lower than the polycrystalline bulk average value and electrodeposited films.
Abstract: Speckle interferometry has been applied to the measurement of Young's modulus in thin films. The present study has two novel aspects: the specimens used were approximately 1 m thick and less than 1 mm long, so the speckle images were obtained by photomicroscopy; and the digital images were analysed by quantitative treatment at intense speckles, rather than by the more standard techniques. Displacements and strains within the gauge length were obtained with low statistical uncertainties. Young's modulus values for three varieties of copper thin films were obtained. All were lower than the polycrystalline bulk average value and the electrodeposited film's modulus was lower than those of both the vapour-deposited films.

66 citations

Journal ArticleDOI
TL;DR: A method that uses a thin random scattering medium to measure the wavelength of a near-infrared laser beam with picometer resolution is developed, based on the application of principal component analysis, which is used for pattern recognition and is applied here to the case of speckle pattern categorization.
Abstract: The speckle pattern arising from a thin random, disordered scatterer may be used to detect the transversal mode of an incident beam. On the other hand, speckle patterns originating from meter-long multimode fibers can be used to detect different wavelengths. Combining these approaches, we develop a method that uses a thin random scattering medium to measure the wavelength of a near-infrared laser beam with picometer resolution. The method is based on the application of principal component analysis, which is used for pattern recognition and is applied here to the case of speckle pattern categorization.

66 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
202332
202249
202162
202079
201972
201895