Spectrum analyzer

About: Spectrum analyzer is a research topic. Over the lifetime, 12217 publications have been published within this topic receiving 101851 citations.

Motor stator condition analyzer

Abstract: A motor performance analyzer senses currents and voltages applied to the motor, converts the sensed signals to digital data signals, and stores the digital data signals. The analyzer includes a processor for evaluating the digital data and a display for alerting a user or technician to potential winding faults. Advanced signal processing techniques are used to further evaluate stored data and to provide trending information.

Method of photon spectral analysis

Abstract: A spectroscopic method to rapidly measure the presence of plutonium in soils, filters, smears, and glass waste forms by measuring the uranium L-shell x-ray emissions associated with the decay of plutonium. In addition, the technique can simultaneously acquire spectra of samples and automatically analyze them for the amount of americium and γ-ray emitting activation and fission products present. The samples are counted with a large area, thin-window, n-type germanium spectrometer which is equally efficient for the detection of low-energy x-rays (10-2000 keV), as well as high-energy γ rays (>1 MeV). A 8192- or 16,384 channel analyzer is used to acquire the entire photon spectrum at one time. A dual-energy, time-tagged pulser, that is injected into the test input of the preamplifier to monitor the energy scale, and detector resolution. The L x-ray portion of each spectrum is analyzed by a linear-least-squares spectral fitting technique. The γ-ray portion of each spectrum is analyzed by a standard Ge γ-ray analysis program. This method can be applied to any analysis involving x- and γ-ray analysis in one spectrum and is especially useful when interferences in the x-ray region can be identified from the γ-ray analysis and accommodated during the x-ray analysis.

Method for detecting defects in semiconductor insulators

Abstract: The reliability of thin film insulators is determined with noise measurements which find the barrier height mean and standard deviation A constant voltage source is applied across the thin film insulator A low noise amplifier is connected across a resistor which is in series with the insulator A spectrum analyzer is connected to the low noise amplifier The power density is obtained by observing the output of a spectrum analyzer The current spectral density is compared to a predetermined reference to detect the presence of defects in the insulator

Optical RF downconverter

Abstract: An optical downconverter with very wide bandwidth operable to separately ically downconvert individual spectrum sections of an RF spectrum, comprising the steps of modulating an optical carrier with the RF spectral width to be downconverted, spatially separating via optical gratings the different sections of the spectrum of the optical carrier sidebands into a plurality of optical channels, generating a different phase-coherent optical local oscillator signal for each optical channel at an appropriate frequency such that the difference between the LO frequency and the particular spectrum section on the given optical channel is equal to a predetermined difference frequency; and mixing each optical channel with its appropriate frequency L.O. and detecting the difference frequency resulting therefrom.

Multireflection planar time-of-flight mass analyzer. II: The high-resolution mode

Abstract: The feasibility of the high-resolution operating mode in a planar multireflection time-of-flight analyzer that is suggested in Part I of this work is demonstrated. Time-of-flight aberrations, which limit the resolution, are estimated. A resolution as high as 200 000 at a time of flight of 70 ms is achieved in experiments. It is shown that the maximal resolution is limited by the duration of the ion packet generated by the source. The resolution can be improved by closing the ion beam trajectory with the formation of repeating cycles. The number of the cycles depends on the beam intensity losses due to scattering by the residual gas. It seem likely that the resolution can be improved further by using a higher vacuum, refining the ion source, and applying more stable power supplies.