Spectrum analyzer

About: Spectrum analyzer is a research topic. Over the lifetime, 12217 publications have been published within this topic receiving 101851 citations.

Combined thermal analyzer and x-ray diffractometer

Abstract: Scientific apparatus and a method are described for observing simultaneously both structural and thermodynamic properties of materials. An X-ray diffractometer and a thermal analyzer and mounted to cooperate and coact on the same sample and to complete a meaningful analysis in a very few minutes. The diffractometer is equipped with a rapid position-sensitive detector connected to a multichannel analyzer to record and display X-ray diffraction data from the sample over an angle of 20° (two theta) or more. The thermal analyzer is preferably a differential scanning calorimeter. By correlating X-ray diffraction and thermal data taken simultaneously while the sample is passing through a range of temperatures and/or environments, structural changes corresponding to thermal events can be identified and elucidated.

Stable Entire-Length Measurement of Fiber Strain Distribution by Brillouin Optical Correlation-Domain Reflectometry with Polarization Scrambling and Noise-Floor Compensation

Abstract: We performed a stable high-speed entire-length measurement of strain distribution by suppressing the signal fluctuations automatically using polarization scrambling. Strain distribution along the entire length of a 100-m fiber was successfully measured with 40-cm spatial resolution and 19-Hz sampling rate. We also demonstrated a signal-to-noise ratio improvement by compensating the noise-floor of the electrical spectrum analyzer.

X-Ray optics for observing dark-field and bright-field refraction-contrast images

Abstract: A new X-ray optics for observing dark-field and bright-field refraction-contrast images is proposed. The optics consists of a collimator and an analyzer in the Bragg geometry with a sample between them. Phase gradients produced by the sample are resolved by the analyzer and the transmitted X-rays are recorded on an X-ray film. When the analyzer is tuned at an angle inside its selective reflection region, clear dark-field images are observed. On the other hand, when the analyzer is tuned in the vicinity of, but outside, the selective reflection region, bright-field images are observed. This optics was tested at a vertical wiggler beamline, BL-14B, at the Photon Factory. The analyzer images were taken at various points in the rocking curve. Both dark-field and bright-field images were successfully observed.

Signal generator for digital spectrum analyzer

Abstract: A signal generator generates a test signal for input to a device under test the output signal of which is subjected to fast Fourier transform analysis by a fast Fourier transformer. A waveform memory (29) is read out in synchronism with data input to the fast Fourier transformer. The waveform memory (29) has stored therein sample values of a composite waveform of a plurality of predetermined spectra. The output read out from the waveform memory (29) is converted by a D/A converter (33) into an analog signal for use as the test signal.

Polarization analyzer for vacuum uv and x radiation

Abstract: A simple analyzer is described for the determination of the degree of polarization of vacuum uv and x rays The analyzer uses solar blind detectors and, thus, is ideal for use in circumstances where visible and near‐uv radiation is present in addition to the radiation under investigation