Topic
Spectrum analyzer
About: Spectrum analyzer is a research topic. Over the lifetime, 12217 publications have been published within this topic receiving 101851 citations.
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Patent•
22 Dec 2006TL;DR: In this paper, a system relating to sample analyzers, and more particular, to sample Analyzers that are simple to operate and have a reduced risk of providing an erroneous result to a user, is described.
Abstract: A system relating to sample analyzers, and more particular, to sample analyzers that are simple to operate and have a reduced risk of providing an erroneous result to a user. In some cases, the sample analyzer may be a portable sample analyzer that includes a disposable fluidic cartridge. The operators of the analyzers need not be trained.
92 citations
Book•
01 Dec 1988
TL;DR: In this article, the fundamental theoretical bases of modern microwave measurements in the time and frequency domains, including reflectometry, spectrum analysers, vector and scalar analyzers, multiports, power, noise, frequency stability and time domain reflectometry are discussed.
Abstract: The book covers the fundamental theoretical bases of modern microwave measurements in the time and frequency domains, including reflectometry, spectrum analysers, vector and scalar analysers, multiports, power, noise, frequency stability and time domain reflectometry. It offers a comprehensive account of far-and-nearfield antennas measurements.
92 citations
TL;DR: The present method is better than previously reported methods in terms of both gross and fine F0 errors and the fundamental frequency is more accurately estimated from reliable harmonic components which are easy to select given the dominance spectra.
Abstract: This paper presents a new method for robust and accurate fundamental frequency (F0) estimation in the presence of background noise and spectral distortion. Degree of dominance and dominance spectrum are defined based on instantaneous frequencies. The degree of dominance allows one to evaluate the magnitude of individual harmonic components of the speech signals relative to background noise while reducing the influence of spectral distortion. The fundamental frequency is more accurately estimated from reliable harmonic components which are easy to select given the dominance spectra. Experiments are performed using white and babble background noise with and without spectral distortion as produced by a SRAEN filter. The results show that the present method is better than previously reported methods in terms of both gross and fine F0 errors.
92 citations
Patent•
10 Mar 1989
TL;DR: In this paper, a gas multiple component analyzer includes an infrared source that passes at least one measuring beam through a sample cell that contains the gas to be analyzed, and three measuring signals are generated in response to the measuring beam, and each is indicative of optical energy from the source transmitted through the sample cell in a respective optical region characterized by a respective Optical center wave-length and a respective band pass.
Abstract: A gas multiple component analyzer includes an infrared source that passes at least one measuring beam through a sample cell that contains the gas to be analyzed. Three measuring signals are generated in response to the measuring beam, and each is indicative of optical energy from the source transmitted through the sample cell in a respective optical region characterized by a respective optical center wave-length and a respective band pass. The three measuring signals are algebraically combined to automatically determine which of the three end gases is present in the sample cell in the greatest concentration, and the concentration thereof. The disclosed system measures concentration of three separate gases having overlapping absorption spectra.
92 citations
Patent•
12 Nov 1973
TL;DR: In this article, a secondary ion mass spectroscopic instrument including a source of ions to be measured and a quadrupole mass analyzer is disposed in the instrument between the source and the analyzer so as to block direct line-of-sight communication there between and thereby prevent fast neutral particles, photons and fast electrons and reflected fast ions from reaching the analyser.
Abstract: In a secondary ion mass spectroscopic instrument including a source of ions to be measured and a quadrupole mass analyzer, a baffle is disposed in the instrument between the source and the analyzer so as to block direct line-of-sight communication therebetween and thereby prevent fast neutral particles, photons and fast electrons and reflected fast ions from reaching the analyzer.
91 citations