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Spectrum analyzer

About: Spectrum analyzer is a research topic. Over the lifetime, 12217 publications have been published within this topic receiving 101851 citations.


Papers
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Patent
16 May 2006
TL;DR: In this paper, a test result analyzer compares test results to results in a database of historical data from running test cases and filters out results representative of fault conditions already reflected in the historical data, thereby reducing the amount of data that must be processed to identify fault conditions.
Abstract: A test result analyzer for processing results of testing software. The analyzer has an interface emulating the interface of a traditional data logger. After analyzing the test results, selected results may be output to a log file or otherwise reported for subsequent use. The test result analyzer compares test results to results in a database of historical data from running test cases. The analyzer filters out results representative of fault conditions already reflected in the historical data, thereby reducing the amount of data that must be processed to identify fault conditions.

53 citations

Journal ArticleDOI
TL;DR: Through measuring the amplitudes of the three ac components from the photomultiplier, at frequencies of 51, 102, and 153 Hz, complex dielectric function spectra have been obtained for test samples of Au and CdTe in the 1.5-eV range and shown to be in agreement with the results of others.
Abstract: A new type of scanning photometric ellipsometer with polarizer and analyzer both rotating synchronously at rotation rates of ω0/2 and ω0 (f0 = 51 Hz), has been designed and constructed. The mechanical and electrical design, alignment, calibration, and error reduction of the system are discussed in detail. Through measuring the amplitudes of the three ac components from the photomultiplier, at frequencies of 51, 102, and 153 Hz, respectively, complex dielectric function spectra have been obtained for test samples of Au and CdTe in the 1.5–5.5-eV range and shown to be in agreement with the results of others.

53 citations

Journal ArticleDOI
TL;DR: In this article, the use of a system of two converters in conjunction with either of these instruments permits the analysis of a gas stream for NO, NO2, and NH3.
Abstract: Adaptation of available instruments to the analysis of NO2 and NH3 became important with the introduction of the Federal Constant Volume Sampling procedure for exhaust analysis in 1970. Two instruments, the NO optical detector (NOOD) and the non-dispersive infrared analyzer (ND1R), are both fast and accurate. The use of a system of two converters in conjunction with either of these instruments permits the analysis of a gas stream for NO, NO2, and NH3. NO is measured on the gas stream before conversion; NO2 is determined after the gas stream has passed over a C-Mo converter at 475°C; and NH3 is determined after the gas has been conducted over a C-Cu converter.

53 citations

Patent
18 Dec 1986
TL;DR: An optical frequency analyzer for measuring an optical frequency spectrum with high accuracy, high resolving power and high stability by heterodyne detecting the incident light with the aid of a local oscillator is presented in this paper.
Abstract: An optical frequency analyzer for measuring an optical frequency spectrum with high accuracy, high resolving power and high stability by heterodyne detecting the incident light with the aid of a local oscillator, wherein the local oscillator comprises an optical frequency synthesizer/sweeper or a marker signal attached tunable laser. The optical frequency analyzer can be modified to measure the incident light itself as the object of measurement or light emerging from the object of measurement can be the incident light.

52 citations

Journal ArticleDOI
TL;DR: The relationship between the retrieved autocorrelation trace and signal impairments is exploited to simultaneously monitor dispersion, in-band optical signal to noise ratio (OSNR) and timing jitter from a single measurement.
Abstract: We report the first demonstration of simultaneous multi-impairment monitoring at ultrahigh bitrates using a THz bandwidth photonic-chip-based radio-frequency (RF) spectrum analyzer. Our approach employs a 7 cm long, highly nonlinear (gamma approximately 9900 /W/km), dispersion engineered chalcogenide planar waveguide to capture the RF spectrum of an ultrafast 640 Gb/s signal, based on cross-phase modulation, from which we numerically retrieve the autocorrelation waveform. The relationship between the retrieved autocorrelation trace and signal impairments is exploited to simultaneously monitor dispersion, in-band optical signal to noise ratio (OSNR) and timing jitter from a single measurement. This novel approach also offers very high OSNR measurement dynamic range (> 30 dB) and is scalable to terabit data rates.

52 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
20241
2023256
2022568
2021155
2020287
2019361