Showing papers on "Spy-Bi-Wire published in 1989"

IEEE-1149.1 use in design for verification and testability at Texas Instruments

Abstract: Products aimed at standardization and cost reduction of IC and system test and debug, compatible with the JTAG/IEEE-1149.1 scan protocols and standards, are discussed. Included are ASIC (application-specific integrated circuit) cells, standard interface ICs, a bus master IC, a controller interface board for IBM compatibles, a high-speed scan interface, and software to control the scan bus. Tradeoffs to be looked at when using the JTAG/IEEE-1149.1 standard for ASIC are evaluated. >