Static induction transistor

About: Static induction transistor is a research topic. Over the lifetime, 8155 publications have been published within this topic receiving 107058 citations. The topic is also known as: SIT.

Sensors for measuring current passing through a load

Abstract: A sensor for measuring a current passing through a load. The sensor has a power transistor having a first terminal connected to substantially constant voltage and a second terminal connected to the load. The sensor can sample a voltage difference with a variable capacitor, and a controller can be configured to cause a variable capacitor in the current sensor to have a capacitance inversely proportional to a resistance of the power transistor, whereby a charge stored on the variable capacitor is proportional to the current passing through the power transistor when the sampling switches are opened. A comparator can compare the current through the power transistor to a known reference current to generate a digital output signal. The sensor can include a power transistor, reference transistor and amplifier connected and configured so as to generate a signal on a reference line having a current of known proportion to the current passing through the load.

Switching regulator having a low dissipation current overload detection device

Abstract: A switching regulator employs between a primary power source and a switching transistor a sensing circuit which senses the current being drawn through the switching transistor by a load. A storage filter circuit having a large series inductance is connected between the load and the switching transistor. A feedback network is connected between the output connection of the storage filter circuit and the switching transistor to activate the switching transistor when the output voltage falls below a predetermined value and to inactivate the switching transistor when the output voltage exceeds a predetermined reference value. The sensing means which senses gradual overloads and a timing circuit which senses abrupt overloads are coupled to the switching transistor via a threshold circuit which compares the output signals from the sensing means and the timing circuits to a predetermined threshold level. When either of the output signals exceeds the threshold level, the switching transistor is opened interrupting the current from the primary power source.

High voltage system using enhancement and depletion field effect transistors

Abstract: An enhancement mode field effect transistor and a depletion mode field effect transistor are connected in a circuit to provide for a conductivity of the transistors during a first polarity in an alternating voltage and to provide for a non-conductivity of the transistors during a second polarity in the alternating voltage. The circuit also provides for the continued and proper operation of the circuit even when voltages having a magnitude greater than the breakdown voltage of the enhancement mode field effect transistor are applied to the circuit. Each of the transistors may have a source, a gate and a drain. The gates of the transistors receive an alternating voltage of one polarity at the same time that the drain of the depletion mode field effect transistor receives a voltage of the opposite polarity. The source of the depletion mode field effect transistor and the drain of the enhancement mode field effect transistor are common. The source of the enhancement mode field effect transistor may receive a reference potential such as ground. The transistors are conductive during the application of a positive voltage to their gates and are non-conductive during the application of a negative voltage to their gates. When the transistors are non-conductive, the depletion mode transistor prevents the voltage on the drain of the enhancement mode field effect transistor from exceeding the breakdown value.

Circuit for automatically biasing RF power transistor by use of on-chip temperature-sensing transistor

Abstract: A circuit arrangement automatically sets quiescent collector current conditions for a class A/B RF power transistor, which is configured of a plurality of parallel-connected transistors formed in a common semiconductor die. The biasing circuit arrangement includes a temperature-sensing transistor having its collector-emitter current flow path coupled with a programmable constant current source. A differential amplifier circuit is coupled to the base and emitter electrodes of the temperature sensing transistor, and generates a bias voltage for biasing each of the transistors of the RF power device. This bias voltage is combined with a programmable D.C. offset voltage. The values of the constant current and D.C. offset voltage are programmed such that the average of the quiescent collector currents of the parallel-connected transistors of the RF power transistor corresponds to the quiescent collector current through the temperature-sensing transistor. An optional external control voltage may be used to further adjust the bias voltage for the RF power transistor.

Semiconductor device with temperature sensor

Abstract: A semiconductor device is disclosed. In one embodiment the semiconductor device includes a semiconductor body of which is integrated a temperature sensor for measuring the temperature prevailing in the semiconductor body. The temperature sensor has a MOS transistor and a bipolar transistor. The MOS transistor is integrated into the semiconductor body nd configured such that the substhreshold current intensity of the MOS transistor is proportional to the temperature to be measured. The subthreshold current of the MOS transistor is amplified by the bipolar transistor.