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Static induction transistor

About: Static induction transistor is a research topic. Over the lifetime, 8155 publications have been published within this topic receiving 107058 citations. The topic is also known as: SIT.


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Patent
26 Nov 1993
TL;DR: A current limit circuit for protection of an intelligent power switch includes a series circuit of a sense transistor and a sense resistor coupled to the power semiconductor transistor switch so that the sense resistor current is a fraction of, and is proportional to, the power transistor current.
Abstract: A current limit circuit for protection of an intelligent power switch includes a series circuit of a sense transistor and a sense resistor coupled to the power semiconductor transistor switch so that the sense resistor current is a fraction of, and is proportional to, the power transistor current. A pull-down transistor is coupled to the control electrode of the power transistor switch. A feedback circuit including a series connection of a diode-connected transistor and a reference V source is coupled between the sense resistor and the control electrode of the pull down transistor. The feedback circuit produces a voltage level shift and the circuit provides an accurate limit on the power transistor current independent of any variations in threshold voltage.

57 citations

Patent
10 Nov 1998
TL;DR: In this paper, a multi-level fabrication process is proposed for producing active and passive devices on various levels of a semiconductor topography. And the interconnect configuration is made as short as possible between features within one transistor level to features within another transistor level.
Abstract: A process is provided for producing active and passive devices on various levels of a semiconductor topography. As such, the present process can achieve device formation in three dimensions to enhance the overall density at which an integrated circuit is formed. The multi-level fabrication process not only adds the to the overall circuit density, but does so with emphasis placed on high performance interconnection between devices on separate levels. The interconnect configuration is made as short as possible between features within one transistor level to features within another transistor level. This interconnect scheme lowers resistivity by forming a gate conductor of an upper level transistor upon a gate conductor of lower level transistor. Alternatively, the gate conductors can be a single conductive entity. In order to abut the gate conductors together, or form a single gate conductor, the upper level transistor is inverted relative to the lower level transistor. In addition to the inverted, shared gate conductor, the multi-level transistor fabrication process incorporates formation of openings and filling of those openings to produce interconnect to junctions of the upper/lower transistors. Interconnecting the gate conductors of a pair of stacked transistors and connecting specific junctions of those transistors allows formation of a high density inverter circuit hereof.

57 citations

Journal ArticleDOI
TL;DR: In this article, a polycrystalline silicon thin-film transistor consisting of silicon-oxide-nitrideoxide-silicon (SONOS) stack gate dielectric and nanowire (NW) channels was investigated for the applications of transistor and nonvolatile memory.
Abstract: In this letter, a polycrystalline silicon thin-film transistor consisting of silicon-oxide-nitride-oxide-silicon (SONOS) stack gate dielectric and nanowire (NW) channels was investigated for the applications of transistor and nonvolatile memory. The proposed device, which is named as NW SONOS-TFT, has superior electrical characteristics of transistor, including a higher drain current, a smaller threshold voltage (Vth) , and a steeper subthreshold slope. Moreover, the NW SONOS-TFT also can exhibit high program/erase efficiency under adequate bias operation. The duality of both transistor and memory device for the NW SONOS-TFT can be attributed to the trigate structure and channel corner effect.

57 citations

Patent
Mohamad M. Mojaradi1, Tuan A. Vo1
21 Dec 1993
TL;DR: A high current, high voltage transistor which can be easily electrically stacked to extend the voltage range and uses less silicon area than a conventional stacked transistor configuration and a configuration of field plates that provide the greatest breakdown voltages with the highest ohmic values as discussed by the authors.
Abstract: A high current, high voltage transistor which can be easily electrically stacked to extend the voltage range and uses less silicon area than a conventional stacked transistor configuration and a configuration of field plates that provide the greatest breakdown voltages with the highest ohmic values. Also, a star shaped field plate design which provides the greatest breakdown voltages with the highest ohmic values. The field plate is constructed using several concentric rings connected by fingers that are wider at towards the center of the concentric rings and narrower towards the perimeter of the concentric rings.

57 citations

Patent
22 Nov 1994
TL;DR: In this article, a high gain, high frequency transistor is formed having a combination of a moderately doped retrograde emitter and a collector which is formed by self-aligned implantation through an emitter opening window.
Abstract: A high gain, high frequency transistor is formed having a combination of a moderately doped retrograde emitter and a collector which is formed by self-aligned implantation through an emitter opening window. This combination allows continued base width scaling and ensures high current capability yet limits the electric field at the emitter-base junction, particularly near the base contacts, in order to reduce leakage and capacitance and to enhance breakdown voltage. Cut-off frequencies on the order of 100 GHz can thus be obtained in the performance of a transistor with a 30 nm base width in a SiGe device.

57 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
20234
20225
20211
20203
20196
20189