Stuck-at fault

About: Stuck-at fault is a research topic. Over the lifetime, 9707 publications have been published within this topic receiving 160254 citations.

Building management system with fault analysis

Abstract: A controller for a building management system is configured to analyze faults in the building management system. The controller detects a fault in the building management system by evaluating data of building management system using a system of rules. The controller determines a conditional probability for each of a plurality of possible fault causes given the detected fault. The controller determines the most likely fault cause by comparing the determined probabilities and electronically reports the most likely fault cause.

Sensor Placement for Fault Diagnosis

Abstract: An algorithm is developed for computing which sensors to add to meet a diagnosis requirement specification concerning fault detectability and fault isolability. The method is based only on the structural information in a model, which means that possibly large and nonlinear differential-algebraic models can be handled in an efficient manner. The approach is exemplified on a model of an industrial valve where the benefits and properties of the method are clearly shown.

Stuck-fault tests vs. actual defects

Abstract: This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and compared with a number of test sets based on other fault models. The defects present in the chips studied are characterized based on the chip tester responses. The data presented shows that N-detect test sets are particularly effective for both timing and hard failures. In these test sets each single-stuck fault is detected by at least N different test patterns. We also present data on the use of IDDq tests and VLV (very low voltage) tests for detecting defects whose presence doesn't interfere with normal operation during manufacturing test, but which cause early life failure.

Performance of diagnosis methods for IGBT open circuit faults in three phase voltage source inverters for AC variable speed drives

Abstract: Variable speed drives have become industrial standard in many applications Therefore fault diagnosis of voltage source inverters is becoming more and more important One possible fault within the inverter is an open circuit transistor fault An overview of the different strategies to detect this fault is given, including the algorithms used to localize the open transistor Previous work showed significant differences among the available methods to detect such a fault for a mains side active rectifier This paper extends the performance evaluation for the inverter connected to the machine with variable stator voltage and frequency Simulation results are presented They show the influence of the applied standard field oriented control on the currents during a fault An experimental setup in the laboratory is used to validate simulation results Typical detection results are presented including time-to-detection measurements Robust detection of open transistor faults has been found to be possible