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Stuck-at fault

About: Stuck-at fault is a research topic. Over the lifetime, 9707 publications have been published within this topic receiving 160254 citations.


Papers
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Proceedings ArticleDOI
20 May 2001
TL;DR: This work introduces the concept of fail-stutter fault tolerance, a realistic and yet tractable fault model that accounts for both absolute failure and a new range of performance failures common in modern components.
Abstract: Traditional fault models present system designers with two extremes: the Byzantine fault model, which is general and therefore difficult to apply, and the fail-stop fault model, which is easier to employ but does not accurately capture modern device behavior To address this gap, we introduce the concept of fail-stutter fault tolerance, a realistic and yet tractable fault model that accounts for both absolute failure and a new range of performance failures common in modern components. Systems built under the fail-stutter model will likely perform well, be highly reliable and available, and be easier to manage when deployed.

83 citations

Journal ArticleDOI
TL;DR: The result is that robust fault reconstruction can be carried out for a wider class of systems compared to other works that also seek to relax the requirement of a full rank first Markov parameter.
Abstract: In observer-based fault reconstruction, one of the necessary conditions is that the first Markov parameter from the fault to the output must be full rank. This paper seeks to relax that requirement by using multiple sliding mode observers in cascade. Signals from an observer are used as the output of a fictitious system whose input is the fault. Another observer is then designed and implemented for the fictitious system. This process is repeated until the first Markov parameter of the fictitious system with respect to the fault is full rank. The result is that robust fault reconstruction can be carried out for a wider class of systems compared to other works that also seek to relax the requirement of a full rank first Markov parameter. In addition, this paper has also investigated and presented the necessary and sufficient conditions as easily testable conditions, and also the precise number of observers required. A simulation example verifies the effectiveness of the scheme.

83 citations

Journal ArticleDOI
TL;DR: A measure of the effect of tolerances on the elements is introduced, and a number of examples are considered to illustrate the application of the method in both the linear and the nonlinear cases.
Abstract: This paper deals with the problem of fault location in analog circuits The circuit under test is decomposed into subnetworks using nodes at which voltages have been measured We localize the faults to within the smallest possible subnetworks according to the final decomposition Then, further identification of the faulty elements inside the subnetworks is carried out The method is applicable to large-networks, linear or nonlinear It requires a limited-number of measurement nodes and its on-line computation requirements are minimal The method is based on checking the consistency of KCL in the decomposed circuit A measure of the effect of tolerances on the elements is introduced, and a number of examples are considered to illustrate the application of the method in both the linear and the nonlinear cases

82 citations

Proceedings ArticleDOI
23 Jun 1998
TL;DR: The description and application of the features of MEFISTO-L, the fault injection tool for VHDL models, being developed at LAAS, are described for supporting the strategy that is proposed for testing FTMs.
Abstract: The early assessment of the adequacy of fault tolerance mechanisms (FTMs), and the subsequent removal of fault tolerance deficiency faults (ftd-faults), are essential tasks in the design process of dependable computer systems. The paper is centered on the description and application of the features of MEFISTO-L, the fault injection tool for VHDL models, being developed at LAAS for supporting the strategy that we have proposed for testing FTMs. The paper first describes the overall testing framework in which MEFISTO-L is incorporated. The main guidelines for the design of MEFISTO-L and its objectives, attributes, implementation and use are then described. Special attention is given to the main original and innovative features: i) the embedded VHDL code analyzer, ii) the observation and injection mechanisms, iii) their synchronization, and iv) their automatic placement in the target VHDL model.

82 citations

Proceedings Article
01 Jan 1990
TL;DR: In this paper, simplified ATPG and fault simulation algorithms, reduced test set sizes, and increased fault coverage are achieved with I, testing for stuck-at faults, which will detect logically redundant and multiple stuck at faults and improve the detection of non-stuck-at fault defects.
Abstract: Simplified ATPG and fault simulation algorithms, reduced test set sizes, and increased fault coverage are achieved with I, testing for stuck-at faults. In addition, IDm testing will detect logically redundant and multiple stuck-at faults and improve the detection of non-stuck-at fault defects.

82 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
202336
202298
20219
20206
20199
201846