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Subthreshold conduction

About: Subthreshold conduction is a research topic. Over the lifetime, 6343 publications have been published within this topic receiving 131957 citations. The topic is also known as: Subthreshold leakage.


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Journal ArticleDOI
TL;DR: A lucid formulation of the minimum hysteresis-free subthreshold swing of the negative-capacitance field-effect transistor reveals the intrinsic limitation of NC-FETs in achieving steep-slope switching characteristics and highlights their more practical role in saving the voltage losses in modern FETs.
Abstract: The negative-capacitance field-effect transistor(NC-FET) has attracted tremendous research efforts. However, the lack of a clear physical picture and design rule for this device has led to numerous invalid fabrications. In this work, we address this issue based on an unexpectedly concise and insightful analytical formulation of the minimum hysteresis-free subthreshold swing (SS), together with several important conclusions. Firstly, well-designed MOSFETs that have low trap density, low doping in the channel, and excellent electrostatic integrity, receive very limited benefit from NC in terms of achieving subthermionic SS. Secondly, quantum-capacitance is the limiting factor for NC-FETs to achieve hysteresis-free subthermionic SS, and FETs that can operate in the quantum-capacitance limit are desired platforms for NC-FET construction. Finally, a practical role of NC in FETs is to save the subthreshold and overdrive voltage losses. Our analysis and findings are intended to steer the NC-FET research in the right direction.

91 citations

Journal ArticleDOI
TL;DR: Subthreshold operation, passive voltage boosting, and various low-power circuit techniques such as current reuse, stacking, and differential cross coupling have been combined to lower the total power consumption.
Abstract: This paper reports a fully monolithic subthreshold CMOS receiver with integrated subthreshold quadrature LO chain for 2.4 GHz WPAN applications. Subthreshold operation, passive voltage boosting, and various low-power circuit techniques such as current reuse, stacking, and differential cross coupling have been combined to lower the total power consumption. The subthreshold receiver, consisting of the switched-gain low noise amplifier, the quadrature mixers, and the variable gain amplifiers, consumes only 1.4 mW of power and has a gain of 43 dB and a noise figure of 5 dB. The entire quadrature LO chain, including a stacked quadrature VCO and differential cross-coupled buffers, also operates in the subthreshold region and consumes a total power of 1.2 mW. The subthreshold receiver with integrated LO generation is implemented in a 0.18 mum CMOS process. The receiver has a 3-dB IF bandwidth of 95 MHz.

91 citations

Journal ArticleDOI
Abstract: A 6-bit highly digital flash ADC is implemented in a 0.18 mum CMOS process. The ADC operates in the subthreshold regime down to 200 mV and employs comparator redundancy and reconfigurability to improve linearity. The low-voltage sampling switch employs voltage boosting, stacking and feedback to reduce leakage. Common-mode rejection is implemented digitally via an IIR filter. The minimum FOM of the ADC is 125 fJ/conversion-step at a 0.4 V supply, where it achieves an ENOB of 5.05 at 400 kS/s. The clocked comparators' switching thresholds are adjusted through a combination of device sizing and stacking. A quadratic relationship between the amount of device stacking and the strength of an input network in the subthreshold regime is derived, demonstrating an advantage of stacking over device width scaling to adjust comparator thresholds.

91 citations

Journal ArticleDOI
TL;DR: Recognition of mental disorder by the physician at baseline was not associated with an improvement of psychopathology after 12 months, but was associated with a improvement in occupational disability and self-reported disability among threshold cases.

91 citations

Journal ArticleDOI
TL;DR: In this paper, a 2D analytical model for surface potential and drain current for a long channel p-type gate-all-around nanowire tunneling field effect transistor with a circular cross section was proposed.
Abstract: In this paper, we propose a 2-D analytical model for surface potential and drain current for a long channel p-type gate-all-around nanowire tunneling field effect transistor with a circular cross section. This model includes the effect of drain voltage, gate metal work function, oxide thickness, and radius of the silicon nanowire without assuming a fully depleted channel. The proposed model also includes the effect of the variation in the tunneling volume with the applied gate voltage. The model is tested using 3-D numerical simulations and is found to be accurate for all gate voltages except for subthreshold region.

91 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
2023153
2022349
2021172
2020196
2019242
2018272