Topic
Switching time
About: Switching time is a research topic. Over the lifetime, 7222 publications have been published within this topic receiving 87596 citations.
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IBM1
TL;DR: In this article, a review of the materials used in switching devices is presented, focusing particularly on the role of filamentary conduction and deliberately introduced or accidental nanoparticles, and the reported device parameters (on-off ratio, on-state current, switching time, retention time, cycling endurance, and rectification) are compared with those that would be necessary for a viable memory technology.
Abstract: Many organic electronic devices exhibit switching behavior, and have therefore been proposed as the basis for a nonvolatile memory (NVM) technology. This Review summarizes the materials that have been used in switching devices, and describes the variety of device behavior observed in their charge-voltage (capacitive) or current-voltage (resistive) response. A critical summary of the proposed charge-transport mechanisms for resistive switching is given, focusing particularly on the role of filamentary conduction and of deliberately introduced or accidental nanoparticles. The reported device parameters (on-off ratio, on-state current, switching time, retention time, cycling endurance, and rectification) are compared with those that would be necessary for a viable memory technology.
964 citations
TL;DR: In this paper, the authors measured the switching speed of two transmission gates in tandem, each having an aperture time of 15 psec, by correlating the response of two transceivers in tandem.
Abstract: Quasimetallic photoconductivity produced by the absorption of picosecond optical pulses in silicon transmission line structures has been used to devise electronic switches and gates which can be turned on and off in a few picoseconds. Electrical signals as large as 100 V can be switched by a few microjoules of optical energy. The switching speed was measured by correlating the response of two transmission gates in tandem, each having an aperture time of 15 psec.
841 citations
TL;DR: In this paper, the authors investigated spin torque switching in perpendicular magnetic tunnel junctions using Ta∣CoFeB∣MgO free layers and a synthetic antiferromagnet reference layer.
Abstract: Spin torque switching is investigated in perpendicular magnetic tunnel junctions using Ta∣CoFeB∣MgO free layers and a synthetic antiferromagnet reference layer. We show that the Ta∣CoFeB interface makes a key contribution to the perpendicular anisotropy. The quasistatic phase diagram for switching under applied field and voltage is reported. Low switching voltages, Vc 50 ns=290 mV are obtained, in the range required for spin torque magnetic random access memory. Switching down to 1 ns is reported, with a rise in switching speed from increased overdrive that is eight times greater than for comparable in-plane devices, consistent with expectations from a single-domain model.
715 citations
TL;DR: In this article, an optical nonlinear element asymmetrically placed in a short fiber loop is used for demultiplexing Tb/s pulse trains that requires less than 1 pJ of switching energy and can be integrated on a chip.
Abstract: A device capable of demultiplexing Tb/s pulse trains that requires less than 1 pJ of switching energy and can be integrated on a chip is presented. The device consists of an optical nonlinear element asymmetrically placed in a short fiber loop. Its switching time is determined by the off-center position of the nonlinear element within the loop, and therefore it can use the strong, slow optical nonlinearities found in semiconductors, which all other fast demultiplexers seek to avoid. The switch's operation at 50 Gb/s is demonstrated, using 600-fJ control pulses. >
676 citations
01 Dec 2008
TL;DR: In this paper, a novel HfO2-based resistive memory with the TiN electrodes is proposed and fully integrated with 0.18 mum CMOS technology, which uses a thin Ti layer as the reactive buffer layer into the anodic side of capacitor-like memory cell, and excellent memory performances such as low operation current (down to 25 muA), high on/off resistance ratio (above 1,000), fast switching speed (5 ns), satisfactory switching endurance (>106 cycles) have been demonstrated in the memory device.
Abstract: A novel HfO2-based resistive memory with the TiN electrodes is proposed and fully integrated with 0.18 mum CMOS technology. By using a thin Ti layer as the reactive buffer layer into the anodic side of capacitor-like memory cell, excellent memory performances, such as low operation current (down to 25 muA), high on/off resistance ratio (above 1,000), fast switching speed (5 ns), satisfactory switching endurance (>106 cycles), and reliable data retention (10 years extrapolation at 200degC) have been demonstrated in our memory device. Moreover, the benefits of high yield, robust memory performance at high temperature (200degC), excellent scalability, and multi-level operation promise its application in the next generation nonvolatile memory.
634 citations