Topic
Synchrotron radiation
About: Synchrotron radiation is a research topic. Over the lifetime, 14639 publications have been published within this topic receiving 244775 citations. The topic is also known as: magnetobremsstrahlung radiation & Synchrotron Radiation.
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01 Jan 2008
TL;DR: In this paper, the authors discuss the applicability of small-angle X-ray SCATTERing in a variety of applications in the field of NNOMA, from MACRO-to NANOTOMOGRAPHY.
Abstract: PART I: GENERAL MICROSTRUCTURE AND PROPERTIES OF ENGINEERING MATERIALS INTERNAL STRESSES IN ENGINEERING MATERIALS TEXTURE AND TEXTURE ANALYSIS IN ENGINEERING MATERIALS PHYSICAL PROPERTIES OF PHOTONS AND NEUTRONS RADIATION SOURCES GENERATION AND PROPERTIES OF NEUTRONS PRODUCTION AND PROPERTIES OF SYNCHROTRON RADIATION PART II: METHODS INTRODUCTION TO DIFFRACTION METHODS FOR INTERNAL STRESS ANALYSES STRESS ANALYSIS BY ANGLE-DISPENSIVE NEUTRON DIFFRACTION STRESS ANALYSIS BY ENERGY-DISPERSIVE NEUTRON DIFFRACTION RESIDUAL STRESS ANALYSIS BY MONOCHROMATIC HIGH-ENERGY X-RAYS RESIDUAL STRESS ANALYSIS BY WHITE HIGH ENERGY X-RAYS REFLECTION MODE TRANSMISSION MODE DIFFRACTION IMAGING FOR MICROSTRUCTURE ANALYSIS BASICS OF SMALL-ANGLE SCATTERING METHODS SMALL-ANGLE NEUTRON SCATTERING DECOMPOSITION KINETICS IN COPPER-COBALT ALLOY SYSTEMS: APPLICATIONS OF SMALL-ANGLE X-RAY SCATTERING New Developments in Neutron Tomography NEUTRON AND SYNCHROTRON -RADIATION-BASED IMAGING FOR APPLICATIONS IN MATERIALS SCIENCE - FROM MACRO- TO NANOTOMOGRAPHY mu-TOMOGRAPHY OF ENGINEERING MATERIALS DIFFRACTION ENHANCED IMAGING PART III: NEW AND EMERGING METHODS 3D X-RAY DIFFRACTION MICROSCOPE 3D MICRON-RESOLUTION LAUE DIFFRACTION QUANTITATIVE ANALYSIS OF THREE-DIMENSIONAL PLASTICS STRAIN FIELD USING MARKERS AND X-RAY ABSORPTION TOMOGRAPHY COMBINED DIFFRACTION AND TOMOGRAPHY PART IV: INDUSTRIAL APPLICATIONS DIFFRACTION-BASED RESIDUAL STRESS ANALYSIS APPLIED TO PROBLEMS IN THE AIRCRAFT INDUSTRY OPTIMIZATION OF RESIDUAL STRESSES IN CRANKHAFTS
95 citations
TL;DR: In this paper, a high-resolution synchrotron-radiation angle-resolved photoemission (ARPES) spectrometer combined with a combinatorial laser molecular-beam epitaxy (laser MBE) thin film growth system was constructed to investigate the electronic structure of transition metal oxide thin films.
Abstract: We have constructed a high-resolution synchrotron-radiation angle-resolved photoemission (ARPES) spectrometer combined with a combinatorial laser molecular-beam epitaxy (laser MBE) thin film growth system in order to investigate the electronic structure of transition metal oxide thin films. An ARPES spectrometer GAMMADATA SCIENTA SES-100 was selected for the high-throughput and high-energy and angular-resolution ARPES measurements. A total energy resolution of 6.3 meV and a momentum (an angular) resolution of 0.02 A−1 (0.2°) were obtained at a photon energy of 40 eV. The system is installed at the high-resolution vacuum-ultraviolet beamline BL-1C or the soft-x-ray undulator beamline BL-2C at the Photon Factory as an end-station. Another distinctive feature of this system is the direct connection from the spectrometer to a laser MBE chamber. Thin film samples can be transferred quickly into the photoemission chamber without breaking ultrahigh vacuum. Laser MBE is one of the best methods to grow thin films ...
95 citations
TL;DR: The potential of modern methods for X-ray diffraction Line Profile Analysis can be fully exploited with data collected at synchro- tron radiation beamlines, provided that optics and experimental set-up are suitably designed and characterized.
Abstract: The potential of modern methods for X-ray diffraction Line Profile Analysis can be fully exploited with data collected at synchro- tron radiation beamlines, provided that optics and experimental set-up are suitably designed and characterized. The Material Characterization by X-ray Diffraction beamline, MCX, at Elettra-Sincrotrone Trieste,
95 citations
TL;DR: In this article, the authors used a high-resolution CCD camera to collect diffracted patterns in digital form using the ID11, BL2 material science beamline at theEuropean Synchrotron Radiation Facility at Grenoble.
94 citations
TL;DR: In this article, the first time resolved X-ray photoelectron spectroscopy (XPS) experiments were performed at the Trieste SuperESCA beam line, where high quality high resolution (better than 0.3 eV) core level photoemission data from adsorbate species on metal samples can be acquired in a few seconds.
94 citations