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Showing papers on "Tantalum capacitor published in 1981"


Patent
22 Jun 1981
TL;DR: In this article, a double-layer capacitor is defined as a solid state electric double layer capacitor consisting of a polarization electrode, a non-polarization electrode, and a solid electrolyte disposed at least between the polarization electrode and the nonpolarisation electrode, the polarisation electrode being a mixture of carbon and the solid electrolytes mixed with each other in a predetermined ratio, the non polarization electrodes being another mixture of the sol electrolyte and a composition containing Cu and a substance selected from a group consisting of Cu 2 S and TiS 2.
Abstract: A solid state electric double layer capacitor comprising a polarization electrode, a non-polarization electrode, and a solid electrolyte disposed at least between the polarization electrode and the non-polarization electrode, the polarization electrode being a mixture of carbon and the solid electrolyte, mixed with each other in a predetermined ratio, the non-polarization electrode being another mixture of the solid electrolyte and a composition containing Cu and a substance selected from a group consisting of Cu 2 S and TiS 2 , and the solid electrolyte having a chemical composition of K x Rb 1-x Cu 4 I y Cl 5-y (0.1≦x ≦0.25, 1.25≦y≦1.67).

27 citations


Journal ArticleDOI
TL;DR: In this article, a multilayer ceramic dieletric was used in binary system Pb(Fe 2/3 W l/3 )O 3 -Pb( Fe l/2 Nb l/ 2 )O3.
Abstract: Large capacitance multilayer ceramic capacitors were made using a ceramic dieletric in the binary system Pb(Fe 2/3 W l/3 )O 3 -Pb(Fe l/2 Nb l/2 )O3. The new capacitors used silver alloy as an internal electrode, reducing the capacitor cost significantly. It was then possible to make economical 10 µF ~ 400 µF muitilayer ceramic capacitors. Typical electrical properties of the new capacitors are listed below: Size 4.5 cm3Capacitance at 20° C, 1 kHz 400 µF Dissipation factor at 1 V rms, 1 kHz 0.6 percent Insulation resistance 5000 \Omega -F Capacitance change with temperature change (-30° C ~ +85° C) -83 to 0 percent Impedance at 100 kHz 2m \Omega 2 Equivalent series resistance at 100 kHz 0.8 m \Omega Maximum permissible ripple current 20 A. The new multilayer ceramic capacitors exhibit the following benefits in comparison with conventional multilayer ceramic capacitors, tantalum electrolytic capacitors, and aluminum electrolytic capacitors. a) Dimensions are small and capacitance is large; b) impedance at high frequency band is small; c) equivalent series resistance is small; d) maximum permissible ripple current is large. The new multilayer ceramic capacitors are useful in various electronic circuits, particularly in switching regulators, in place of tantalum electrolytic capacitors and aluminum electrolytic capacitors.

26 citations


Patent
06 Jul 1981
TL;DR: In this paper, a multigap series construction for multiple electrode monolithic capacitors employing ceramics is described, where the voltage rating of such capacitors increases with each gap added across the dielectric.
Abstract: This specification discloses a multigap series construction for multiple electrode monolithic capacitor structures employing ceramics. The voltage rating of such capacitors increases with each gap added across the dielectric. Additionally, the amount of piezoelectric activity occurring in a piezoelectric dielectric is limited by the series gap arrangement to be below that which causes deleterious spurious signals to be generated when said capacitor vibrates.

17 citations


Patent
27 Jul 1981
TL;DR: In this paper, a method of fabricating film circuits whereby thick film crossunders may be included with thin film capacitors on a single substrate was described, where at least one dielectric layer was formed on the crossunder electrode and a layer capable of smoothing irregularities was also formed in the area of capacitor formation.
Abstract: A method of fabricating film circuits whereby thick film crossunders may be included with thin film capacitors (22) on a single substrate (10). At least one dielectric layer (12) is formed on the crossunder electrode (11) and a layer capable of smoothing irregularities (13) is also formed in the area of capacitor formation. Firing of the capacitor underlayer is compatible with the dielectric layer. A layer such as beta tantalum (14) is formed over essentially the entire circuit and etched from the contact areas (21) of the crossunder electrode. The layer is oxidized to form a protective layer (15) for the previously deposited layers as well as an underlay for subsequently formed thin film components.

9 citations


Journal ArticleDOI
TL;DR: In this paper, the influence of the atmosphere on the kinetics of the manganese nitrate decomposition and on several physical properties of the resulting MnO2, such as density, grain size, crystalline structure, resistivity and activation energy for electrical conduction, has been studied.
Abstract: MnO2 samples have been prepared by the pyrolytic decomposition of manganese nitrate in different atmospheres: dry air and air saturated with water vapour. The influence of the atmosphere on the kinetics of the manganese nitrate decomposition and on several physical properties of the resulting MnO2, such as density, grain size, crystalline structure, resistivity and activation energy for electrical conduction, has been studied. The dielectric and breakdown properties of Ta-Ta2O5-MnO2 capacitive structures, using MnO2 as a solid electrolyte, are also strongly affected by the atmosphere in which the MnO2 layers are prepared. It has been found that the electrical conductivity of the MnO2 samples is greater when they are formed in a saturated water vapour atmosphere, resulting in substantially improved characteristics for the power losses and scintillation voltage of the corresponding tantalum capacitors.

7 citations


Journal ArticleDOI
TL;DR: In this paper, the electrical characteristics of anodic oxide films formed on tantalum are investigated in anodes oxidized in the standard electrolytes for lowvoltage (1% H3PO4 in water) and high voltages (same plus ethylene glycol) and it is found that small additions (about 1%) of certain organic acids such as citric acid to the above====== democraticallyelectrolytes greatly improves the leakage current, the scintillation voltage and the dielectric losses of tantalum======¯¯¯¯capacitors.
Abstract: The electrical characteristics of anodic oxide films formed on tantalum are investigated in anodes oxidized in the standard electrolytes for low-voltage (001% H3PO4 in water) and high-voltage (same plus ethylene glycol) applications It is found that small additions (about 01%) of certain organic acids such as citric acid to the above electrolytes greatly improves the leakage current, the scintillation voltage and the dielectric losses of tantalum capacitors Furthermore, the use of these organic acids makes it possible to extend to higher voltages the use of the low-voltage electrolyte, and allows, in the case of the high-voltage electrolyte, a substantial diminution in the ethylene glycol concentration without impairing the characteristics of the resulting capacitors Finally, the effect of the citric acid and the ethylene glycol in the anodizing electrolytes is discussed

5 citations



Journal ArticleDOI
TL;DR: In this paper, the relationship between breakdown voltage and dielectric material and capacitance value is discussed, and a summary of experimental results on breakdown in glass, mica, plastic film, ceramic disc, ceramic multilayer, aluminum electrolytic, and tantalum capacitors is presented.
Abstract: Capacitors subjected to short, constant current pulses will fail when the voltage reaches the breakdown value. A summary of experimental results on breakdown in glass, mica, plastic film, ceramic disc, ceramic multilayer, aluminum electrolytic, and tantalum capacitors is presented. The relationship between breakdown voltage and dielectric material, dielectric thickness, voltage rating, capacitance value, and capacitor construction is discussed.

5 citations


Patent
02 Feb 1981
TL;DR: In this paper, the authors proposed to detect leakage current and polarity by measuring the difference between transient currents flowing to a reference capacitor connected in series with a resistor and a capacitor to be measured which are designed for equal time constant.
Abstract: PURPOSE:To achieve leakage current and polarity detection in a short time, by measuring the difference between transient currents flowing to a reference capacitor connected in series with a resistor and a capacitor to be measured which are designed for equal time constant. CONSTITUTION:Time constants consisting of a resistor 17 having a low impedance negligible in comparison with a capacitor 6 corresponding to an equivalent resistor 16 generating the leakage current of a capacitor 13 to be measured for the leakage current, a resistor 10 and the reference capacitor 6 connected to a one end of a DC power supply 9 and those consisting of a capacitor 13 and a resistor 15 are set equal to each other. When a switch 8 is closed and a voltage corresponding to the difference between transient currents flowing to the capacitors 6, 13 connected to one end of the power supply 9 is measured at a voltmeter connected between other ends of the capacitors 6, 13, the capacitor leakage current can be detected in a short time. On the other hand, since the transient current changes for tantalum capacitors depending on the polarity, the polarity detection can similarly be made in a short time.

4 citations


Patent
26 Aug 1981
TL;DR: In this article, a destructive testing procedure in which a voltage 2.5 times the rated voltage is applied to the capacitor, at a relatively high current, is described, where the resistance in series with capacitors being tested is reduced step-by-step until the resistance value is reached such that the percentage of capacitor failures on any given sample of capacitors remains constant.
Abstract: This invention covers a destructive testing procedure in which a voltage 2.5 times the rated voltage is applied to the capacitor, at a relatively high current. The resistance in series with capacitors being tested is reduced step-by-step until the resistance value is reached such that the percentage of capacitor failures on any given sample of capacitors remains constant. Thereafter, all similar capacitors are tested at that resistance value and at 2.5 times the rated voltage. Those which do not explode exhibit remarkable reliability.

4 citations


Journal ArticleDOI
TL;DR: Various types of aluminum electrolytic capacitors are characterized and rated in terms of how well each type approximates the characteristics of solid-tantalum electrolytic capacitor.
Abstract: The inherent qualities, performance characteristics and limitations of solid tantalum and aluminum electrolytic capacitors are assessed. Various types of aluminum electrolytic capacitors are characterized and rated in terms of how well each type approximates the characteristics of solid-tantalum electrolytic capacitor.

Patent
11 Feb 1981
TL;DR: In this paper, a wound electrolytic capacitor is described, which consists of wound layers of anode foils, provided with a dielectric oxide layer, and cathode foam spacers, the foils being separated from one another by paper spacers.
Abstract: The invention relates to a wound electrolytic capacitor and a process for its production. The capacitor consists of wound layers of anode foils (1), provided with a dielectric oxide layer, and cathode foils (2), the foils being separated from one another by paper spacers (3), soaked in an operating electrolyte. The cathode foils (2) and/or the paper spacers (3) have transversely-running indentations. The invention is applied to electrolytic capacitors with "wet" operating electrolytes.

Patent
24 Apr 1981
TL;DR: In this paper, the anode riser of a solid tantalum capacitor is cleaned by means of a laser beam which removes all coatings from the riser in the area of the weld between riser and an external lead so as to leave no conducting path from riser to the cathode.
Abstract: not available for EP0039221Abstract of corresponding document: US4344107The anode riser of a solid tantalum capacitor is cleaned by means of a laser beam which removes all coatings from the riser in the area of the weld between the riser and an external lead so as to leave no conducting path from the riser to the cathode.

Patent
06 Feb 1981
TL;DR: In this article, a sintered porous tantalum anode is used to increase the contact surface between the Mn02 layer and subsequent graphite layers, which reduces the series resistance (ESR) by increasing the section of the negative output conductor, and improves the adhesion of subsequent metallic layers such as layers of Ag or Sn/Pb deposited on the graphite layer and thus the mechanical strength of the cathode connection.
Abstract: In the prodn. of tantalum condensers with a solid electrolyte (made e.g. as described in FR 1091097 by forming a sintered porous tantalum anode, forming a layer of tantalum oxide on this as electrolyte, impregnating the prod. with a Mn salt and pyrolysing to form a layer of Mn02 as cathode), at least one of the last impregnations of the anode is carried out using high density manganese nitrate soln. contg. at least one surface active additve in an amt. of less than 1000 ppm. Process increases the contact surface between the Mn02 layer and subsequent graphite layers, which reduces the series resistance (ESR) by increasing the section of the negative output conductor, and improves the adhesion of subsequent metallic layers such as layers of Ag or Sn/Pb deposited on the graphite layer and thus the mechanical strength of the cathode connection.