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Tantalum capacitor

About: Tantalum capacitor is a research topic. Over the lifetime, 2432 publications have been published within this topic receiving 26709 citations.


Papers
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Journal ArticleDOI
TL;DR: In this article, the impact of top electrode including Ni and Al on electrical stress reliability was studied and the mechanisms to explain the electrode-dependent reliability were also proposed in MIM capacitors with amorphous ZrTiO4 film as the dielectric.
Abstract: For metal-insulator-metal (MIM) capacitors with an amorphous ZrTiO4 film as the dielectric, the impact of top electrode including Ni and Al on electrical stress reliability was studied and the mechanisms to explain the electrode-dependent reliability were also proposed in this work. It has been found that the Ni-electrode MIM capacitors reveal good reliability in terms of 0.91% capacitance change after ten-year operation under −2 V constant voltage stress while that for those with Al electrode degrades to 1.92%. This undesirable higher capacitance change can be mainly ascribed to a larger permittivity modulation in the dielectric that is due to higher leakage current and consequently more trapped charges and dipoles caused by a lower electrode work function. In addition, a parasitic Al2O3 film in the Al-electrode MIM capacitors also worsens the integrity of the dielectric because of the existence of additional traps.

8 citations

01 Jan 2005
TL;DR: In this article, the effect of inductance of the test circuit on voltage and current transients was investigated and the requirements for the elements of the circuit, in particular, resistance of circuit, inductance, wires and resistors, type of switching devices, and characteristics of energy storage bank capacitors.
Abstract: Surge current testing is considered one of the most important techniques to evaluate reliability and/or screen out potentially defective tantalum capacitors for low-impedance applications. Analysis of this test, as it is described in the MIL-PRF-55365 document, shows that it does not address several issues that are important to assure adequate and reproducible testing. This work investigates the effect of inductance of the test circuit on voltage and current transients and analyzes requirements for the elements of the circuit, in particular, resistance of the circuit, inductance of wires and resistors, type of switching devices, and characteristics of energy storage bank capacitors. Simple equations to estimate maximum inductance of the circuit to prevent voltage overshooting and minimum duration of charging/discharging cycles to avoid decreasing of the effective voltage and overheating of the parts during surge current testing are suggested.

8 citations

Patent
25 May 2000
TL;DR: In this article, a solid electrolytic capacitor with lead wires (lead frames) has been proposed, in which the bonding structure between the capacitor element and the lead frames is improved.
Abstract: A solid electrolytic capacitor comprising a capacitor element comprising a valve-acting metal substrate having on the surface thereof a dielectric film and a solid electrolytic layer provided on the dielectric film, the capacitor element provided with lead wires (lead frames), in which the bonding structure between the capacitor element and the lead frames is improved. The solid electrolytic capacitor has high strength at the bonded portion between the capacitor element and the lead frames and has excellent heat resistance and is highly reliable. Also, a method for manufacturing such a solid electrolytic capacitor is disclosed.

8 citations

Proceedings ArticleDOI
24 Nov 1997
TL;DR: In this paper, the theory of aluminium electrolytic capacitors and their manufacturing process are discussed, and the electrical characteristics and their variation are outlined, as well as expected capacitor life.
Abstract: The author discusses the theory of aluminium electrolytic capacitors and their manufacturing process. The raw materials-aluminium, electrolyte, spacers and other materials-are described. The electrical characteristics and their variation are outlined, as is expected capacitor life. (6 pages)

8 citations

Patent
22 May 1995
TL;DR: In this article, a plurality of dielectric materials are arranged so that each material is in parallel between capacitor plates, and the capacitor value of this structure is preset, therefore, for operation electrically at different specific temperatures.
Abstract: A capacitor structure is described as having a plurality of dielectric materials located so that each dielectric material is in parallel between capacitor plates. The capacitor value of this structure is preset, therefore, for operation electrically at different specific temperatures. The description gives a specific stacked arrangement for the various dielectric materials in which this capacitor can be formed, as one example of that to which it is adaptable.

8 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
20238
20227
20219
202020
201924
201834