scispace - formally typeset
Search or ask a question
Topic

Tantalum capacitor

About: Tantalum capacitor is a research topic. Over the lifetime, 2432 publications have been published within this topic receiving 26709 citations.


Papers
More filters
Journal ArticleDOI
TL;DR: In this article, the status of polymer dielectric film development and its feasibility for capacitor applications was highlighted. And the PEI film was found to be the preferred choice for high-temperature film capacitor development due to its thermal stability, dielectrics properties, and scalability.
Abstract: Film capacitor technology has been under development for over half a century to meet various applications such as direct-current link capacitors for transportation, converters/inverters for power electronics, controls for deep well drilling of oil and gas, direct energy weapons for military use, and high-frequency coupling circuitry. The biaxially oriented polypropylene film capacitor remains the state-of-the-art technology; however, it is not able to meet increasing demand for high-temperature (>125°C) applications. A number of dielectric materials capable of operating at high temperatures (>140°C) have attracted investigation, and their modifications are being pursued to achieve higher volumetric efficiency as well. This paper highlights the status of polymer dielectric film development and its feasibility for capacitor applications. High-temperature polymers such as polyetherimide (PEI), polyimide, and polyetheretherketone were the focus of our studies. PEI film was found to be the preferred choice for high-temperature film capacitor development due to its thermal stability, dielectric properties, and scalability.

167 citations

Patent
Yoshihiro Takaishi1
28 Nov 1995
TL;DR: When tantalum oxide is used for a dielectric film of a stacked type storage capacitor forming a memory cell together with a switching transistor, heat treatments are limited to 530 degrees centigrade in the stages as mentioned in this paper.
Abstract: When tantalum oxide is used for a dielectric film of a stacked type storage capacitor forming a memory cell together with a switching transistor, heat treatments are limited to 530 degrees centigrade in the stages after the deposition of the tantalum oxide, and leakage current across the tantalum oxide is drastically decreased.

164 citations

Journal ArticleDOI
C.T. Black1, J.J. Welser1
TL;DR: In this article, a simple, semiclassical model of an idealized capacitor is used to estimate the capacitance correction due to the distribution of displacement charge in the metal electrodes, which contributes to the universally seen decrease in measured dielectric constant with capacitor film thickness.
Abstract: A consequence of the finite electronic screening length in metals is that electric fields penetrate short distances into the metal surface. Using a simple, semiclassical model of an idealized capacitor, we estimate the capacitance correction due to the distribution of displacement charge in the metal electrodes. We compare our result with experimental data from thin-film high-dielectric-constant capacitors, which are currently leading contenders for use in future high-density memory applications. This intrinsic mechanism contributes to the universally-seen decrease in measured dielectric constant with capacitor film thickness.

158 citations

Journal ArticleDOI
TL;DR: In this article, an economic electronic module integrated on an electrolytic capacitor that is able to indicate the moment when it must be changed is presented, based on measurements of the voltage ripple and the capacitor current; the latter is compared to the ESR value of the sound capacitor deduced from the component case temperature.
Abstract: The object of this paper is to present an economic electronic module integrated on an electrolytic capacitor that is able to indicate the moment when it must be changed. First, with a switchmode power supply as an example, the high probability of electrolytic capacitor failure with respect to other power components is noted. Second, the authors recall that the increase of the equivalent series resistance (ESR) of the capacitor is the best indicator of their faulty state. From the measurements of the voltage ripple and the capacitor current, one can deduce the ESR; the latter is compared to the ESR value of the sound capacitor deduced from the component case temperature. Thus, the capacitor deterioration can be diagnosed.

158 citations


Network Information
Related Topics (5)
Capacitor
166.6K papers, 1.4M citations
74% related
Transistor
138K papers, 1.4M citations
72% related
Voltage
296.3K papers, 1.7M citations
70% related
Dielectric
169.7K papers, 2.7M citations
69% related
Silicon
196K papers, 3M citations
67% related
Performance
Metrics
No. of papers in the topic in previous years
YearPapers
20238
20227
20219
202020
201924
201834