Topic
Test strategy
About: Test strategy is a research topic. Over the lifetime, 4208 publications have been published within this topic receiving 89763 citations. The topic is also known as: testing approach.
Papers published on a yearly basis
Papers
More filters
••
26 Mar 2007TL;DR: This paper describes a t-way testing tool, called FireEye, and discusses design decisions that are made to enable an efficient implementation of the generalized IPO strategy, called in-parameter-order (IPO), from pairwise testing to t- way testing.
Abstract: Most existing work on t-way testing has focused on 2-way (or pairwise) testing, which aims to detect faults caused by interactions between any two parameters. However, faults can also be caused by interactions involving more than two parameters. In this paper, we generalize an existing strategy, called in-parameter-order (IPO), from pairwise testing to t-way testing. A major challenge of our generalization effort is dealing with the combinatorial growth in the number of combinations of parameter values. We describe a t-way testing tool, called FireEye, and discuss design decisions that are made to enable an efficient implementation of the generalized IPO strategy. We also report several experiments that are designed to evaluate the effectiveness of FireEye
341 citations
••
TL;DR: A simple iterative graphical approach to construct and perform Bonferroni-type tests, represented by directed, weighted graphs, where each node corresponds to an elementary hypothesis, together with a simple algorithm to generate such graphs while sequentially testing the individual hypotheses.
Abstract: For clinical trials with multiple treatment arms or endpoints a variety of sequentially rejective, weighted Bonferroni-type tests have been proposed, such as gatekeeping procedures, fixed sequence tests, and fallback procedures. They allow to map the difference in importance as well as the relationship between the various research questions onto an adequate multiple test procedure. Since these procedures rely on the closed test principle, they usually require the explicit specification of a large number of intersection hypotheses tests. The underlying test strategy may therefore be difficult to communicate. We propose a simple iterative graphical approach to construct and perform such Bonferroni-type tests. The resulting multiple test procedures are represented by directed, weighted graphs, where each node corresponds to an elementary hypothesis, together with a simple algorithm to generate such graphs while sequentially testing the individual hypotheses. The approach is illustrated with the visualization of several common gatekeeping strategies. A case study is used to illustrate how the methods from this article can be used to tailor a multiple test procedure to given study objectives.
339 citations
••
TL;DR: This study aims at surveying existing research on SPL testing in order to identify useful approaches and needs for future research, and finds system testing is the largest group with respect to research focus, followed by management.
Abstract: Context: Software product lines (SPL) are used in industry to achieve more efficient software development. However, the testing side of SPL is underdeveloped. Objective: This study aims at surveying existing research on SPL testing in order to identify useful approaches and needs for future research. Method: A systematic mapping study is launched to find as much literature as possible, and the 64 papers found are classified with respect to focus, research type and contribution type. Results: A majority of the papers are of proposal research types (64%). System testing is the largest group with respect to research focus (40%), followed by management (23%). Method contributions are in majority. Conclusions: More validation and evaluation research is needed to provide a better foundation for SPL testing.
312 citations
•
15 May 2003TL;DR: This book is the most comprehensive introduction available to the range of techniques and tools used in digital testing, including fault simulation, CMOS testing, design for testability, and built-in self test.
Abstract: From the Publisher:
As the complexity of modern digital systems increases, so does the need for ever more rigorous testing at all levels, from individual chips up to complete system architectures. This book is the most comprehensive introduction available to the range of techniques and tools used in digital testing. It covers every key topic, including fault simulation, CMOS testing, design for testability, and built-in self test. Aimed at graduate students of electrical and computer engineering, the book is also the most up-to-date reference on the market for practicing engineers.
308 citations
••
TL;DR: A synthesis of the most important research results related to Adaptive Random Testing (ART) is presented, particularly note the fundamental role of diversity in test case selection strategies.
302 citations