Showing papers on "Texture (crystalline) published in 1993"
TL;DR: In this article, the preferred orientation of ZnOx films was controlled by radio frequency (RF) magnetron sputtering, and the growth mechanisms were made clear with respect to the density of surface energy.
661 citations
TL;DR: In this article, a two-step growth process based on the control of α permits the independent optimization of texture axis and surface morphology, offering the possibility to obtain smooth faceted diamond films for arbitrary film thickness.
315 citations
TL;DR: In this article, ordered diamond films have been deposited on single-crystal silicon substrates via an in situ carburization followed by biasenhanced nucleation, which is speculated to form an epitaxial SiC conversion layer.
Abstract: Ordered diamond films have been deposited on single‐crystal silicon substrates via an in situ carburization followed by bias‐enhanced nucleation. Textured diamond films with greater than 50% of the grains oriented D(100)//Si(100) and D〈110〉//Si〈110〉 were grown in both a horizontal and vertical microwave plasma chemical vapor deposition reactor. Separate diamond films from each of the two reactors were analyzed both by scanning electron microscopy and Raman spectroscopy. The in situ carburization is speculated to form an epitaxial SiC conversion layer, thus providing an economical alternative to obtaining epitaxial diamond films on single‐crystal SiC.
296 citations
TL;DR: In this paper, the authors proposed a new model for Bi/Pb(2223) tapes, based on the frequent small-angle c-axis grain boundaries that serve as highly conducting connections for the current between neighbouring grains, without the necessity for the supercurrent to flow perpendicularly to the CuO planes.
Abstract: Detailed analyses of the microstructure of silver-sheathed (Bi, Pb)2Sr2Ca2Cu3Ox tapes by scanning electron microscopy and X-ray diffraction, as well as measurements of the critical current density and the electrical resistivity of the isolated superconductor cores, have been performed on a series of short samples with filament thicknesses of approx 40–50 μm and jc (77 K, B=0) ≈ 15 000 A/cm2 The experimental data cannot be satisfactorily explained within the framework of the “brick wall” model for the current transport in highly textured polycrystalline high-temperature superconductors We therefore propose a new model for Bi/Pb(2223) tapes, based on the frequent small-angle c-axis grain boundaries that serve as highly conducting connections for the current between neighbouring grains, without the necessity for the supercurrent to flow perpendicularly to the CuO planes The model provides a semi-quantitative description of the field dependence of the critical current density and its anisotropy, and correlates them with characteristics microstructural features of the Bi/Pb(2223) tapes
203 citations
TL;DR: In this paper, the effects of incident ion/metal flux ratio Ji/JMe and ion energy Ei on the microstructure, texture, and phase composition of polycrystalline metastable Ti0.5Al 0.5N films produced by reactive magnetron sputtering were investigated using x-ray diffraction (XRD), plan-view and cross-sectional transmission electron microscopy, and Rutherford backscattering spectroscopy.
Abstract: The effects of incident ion/metal flux ratio Ji/JMe and ion energy Ei on the microstructure, texture, and phase composition of polycrystalline metastable Ti0.5Al0.5N films produced by reactive magnetron sputtering have been investigated using x‐ray diffraction (XRD), plan‐view and cross‐sectional transmission electron microscopy, and Rutherford backscattering spectroscopy. The films, typically ≂1 μm thick, were deposited at a pressure of 20 mTorr (2.67 Pa) in pure N2 on thermally oxidized Si(001) substrates at 250±25 °C. The N2+ ion flux to the substrate was controlled by means of a variable axial magnetic field superimposed on the permanent magnetic field of the magnetron. Films deposited at Ei=20 eV (≂10 eV per incident accelerated N) with Ji/JMe=1 exhibited a complete (111) texture with a porous columnar microstructure and an average column size of ≂30 nm. Increasing Ei from 20 to 85 eV, while maintaining Ji/JMe constant at 1, resulted in a small change in texture as the XRD intensity ratio I002/(I111+...
156 citations
TL;DR: In this article, the difference between the total multilayer film stress and the layer deposition stresses can be attributed to a tensile interface stress of −2.27±0.67 J/m2.
Abstract: Stresses were measured in 〈111〉‐textured Ag/Ni multilayered thin films from the substrate curvature and from lattice parameter measurements by x‐ray diffraction. The difference between the total multilayer film stress and the layer deposition stresses can be attributed to a tensile interface stress of −2.27±0.67 J/m2. Interfacial phase formation is unlikely in this system as indicated by the exceptionally low mutual solubilities.
134 citations
TL;DR: In this paper, the orientation of the films has been studied as a function of ion bombardment angle, deposition rate, ion current density, and ion beam energy, and it has been shown that films having ion to atom ratios of 0.05 exhibit (220) biaxial alignment in the plane of the film.
Abstract: Yttria stabilized zirconia films were deposited using ion‐assisted, electron beam deposition (IBAD) on pyrex glass substrates heated to 600 °C. Films deposited under these conditions without IBAD exhibit fiber texture such that preferred (100) orientation exists perpendicular to the substrate. The orientation of the films has been studied as a function of ion bombardment angle, deposition rate, ion current density, and ion beam energy. Films deposited with IBAD at bombardment angles of less than 63° display strong (100) preferred orientation perpendicular to the substrate. Films having ion to atom ratios of 0.05 exhibit (220) biaxial alignment in the plane of the film. Best results were achieved for films with deposition rates of 2.4 A/s, beam energies of 75 eV and ion fluences of 18 μA/cm2. Increasing the beam energy to 300 eV increases the concentration of wire texture in these films. Films deposited at higher ion/atom ratios (0.11 and 0.25) produce films with alignments highly dependent on the angle of...
127 citations
TL;DR: In this paper, a single crystal of the new phase Bi8Te9 has been obtained by thermal annealing and preliminary diffraction study shows an hexagonal lattice with a = 4.41 A and c ≈ 103 A.
124 citations
TL;DR: In this paper, the authors discussed the importance of interfacial chemistry on the control of texture for crystallization of PLZT thin layers on coated substrates and gave relationships for the chemical characteristics of the substrate's surface and the preferred orientations which develop on heat treatment.
Abstract: PLZT thin layers were deposited onto various substrates by sol-gel methods, and crystallized under different conditions and substrate treatments. Relationships are given for the chemical characteristics of the substrate’s surface and the preferred orientations which develop on heat treatment. A preferred (111) orientation always developed for perovskite crystallized on Pt layers which contained Ti on the surface. This was attributed to the formation of Pt3Ti and the role of heteroepitaxial nucleation and growth sites. In addition, a preferred (100) orientation was also obtained on unarmealed Pt/Ti/SiO2/Si substrates which were free of Ti on the surface. This was attributed to self-textured growth with flat faces striving for minimum surface energy conditions. The results are discussed in terms of the importance of interfacial chemistry on the control of texture for crystallization of PLZT thin layers on coated substrates.
118 citations
TL;DR: In this paper, the deformation microstructures and texture at five strain levels were observed and characterized using transmission electron microscopy (TEM) and neutron diffraction, and the microstructural evolution was discussed with special emphasis on factors that contribute to the transition from structures characteristic of small and medium strain micro-structures to those characteristic of large strain micro structures.
Abstract: High-purity nickel (99. 99 pct) with a grain size of 80 to 100 µm was deformed by cold-rolling from 37 to 98 pct reductions (von Mises effective strains ofevm = 0. 5 to 4. 5). The deformation microstructures and texture at five strain levels were observed and characterized using transmission electron microscopy (TEM) and neutron diffraction. The microstructures evolved within a framework common to medium and high stacking fault energy fee polycrystals. This framework consists of structural subdivision by higher angle boundaries (geometrically necessary boundaries) at one volume scale and at a smaller volume scale by lower angle cell boundaries (incidental boundaries) for all strain levels. We have characterized the dislocation boundaries, including dense dislocation walls (DDWs), microbands (MBs), and lamellar boundaries (LBs) in terms of crystallographic and macroscopic orientations, morphology, and frequency of occurrence. The microstructural evolution is discussed with special emphasis on factors that contribute to the transition from structures characteristic of small and medium strain microstructures to those characteristic of large strain microstructures.
118 citations
TL;DR: In this paper, a typical copper film consists of three texture components: (111), (200), and (511) texture components, and the fraction of the random texture component and the distribution of the hkl components in copper films are relatively large.
Abstract: Microstructure is an important factor influencing the reliability of thin film interconnects. The microstructure of copper films is of particular interest because of its use in numerous electronic applications. Pole figure x-ray diffraction and transmission electron microcopy were conducted on copper films deposited by several techniques: sputtering, partially ionized beam deposition, chemical vapor deposition, evaporation, and electroplating. Quantitative texture data are determined from fiber texture plots. A typical copper film consists of three texture components: (111), (200), and random. (220) and (511) texture components are possible under some deposition conditions. Compared to aluminum films, the fraction of the random texture component and the distribution of the (hkl) components in copper films are relatively large. Bimodal grain size distributions are observed in some films.
TL;DR: In this article, a tensile testing method for thin films is presented, where the strain is measured directly on the unsupported thin film from the displacement of laser spots diffracted from a thin grating applied to its surface by photolithography.
Abstract: A new method for tensile testing of thin films is presented. The strain is measured directly on the unsupported thin film from the displacement of laser spots diffracted from a thin grating applied to its surface by photolithography. The diffraction grating is two-dimensional, allowing strain measurement both along and transverse to the tensile direction. In principle, Young’s modulus, Poisson’s ratio, and the yield stress of a thin film can be determined. Cu, Ag, and Ni thin films with strong ⟨111⟩ texture were tested. The measured Young moduli agreed with those measured on bulk crystals, but the measured Poisson ratios were consistently low, most likely due to slight transverse folding of the film that developed during the test. The yield stresses of the evaporated Cu and Ag thin films agreed well with an extrapolation of the Hall-Petch relation found for bulk materials. Ni thin films are known to deviate from a bulk Ni Hall–Petch relation for submicron grain sizes, and sputtered Ni films show much higher yield stresses than electrodeposited or vapor-deposited films of similar grain size. Our sputtered Ni films had higher yield stresses than other sputtered films from the literature.
TL;DR: In this article, the authors present an overview of the problem of anisotropic X-ray or neutron diffraction in crystalline materials using linear elastic models (Reuss and Voigt).
Abstract: X-ray or neutron diffraction can be used to measure residual stresses in crystalline materials. Normally, the d -sin 2 Ω-method is used to derive the stress from the diffraction data. However, the method fails if the samples are anisotropic because of a crystallographic texture, The present paper gives an overview of this problem. The theoretical part gives an analysis that sheds some light on the influence of crystallographic texture on diffraction data obtained during stress measurements. It is based on linear elastic models (Reuss and Voigt). The next part reviews the experimental findings of various authors, which shows that linear elastic models are sometimes insufficient to deal with anisotropy, especially in cases when plastic deformation has taken place. Finally, several methods (including some that make use of the ODF) that are used when dealing with textured samples are reviewed.
TL;DR: In this paper, the effects of substrate preparation on the structure and orientation of MgO films grown on (001) GaAs using pulsed laser deposition has been investigated, and the results showed that a preferential orientation within the plane of the substrate was obtained in cases where the surface oxide was only partially desorbed prior to growth.
Abstract: The effects of substrate preparation on the structure and orientation of MgO films grown on (001) GaAs using pulsed laser deposition has been investigated. Textured MgO films displaying a (111)MgO∥(001)GaAs orientation relation with x‐ray rocking curve full width at half maximum (FWHM) values as low as 1.8° were obtained in cases where the native GaAs surface oxide was only partially desorbed prior to growth. Reflection high‐energy electron diffraction, transmission electron microscopy (TEM), and x‐ray pole figure analysis of these films reveals a preferential orientation within the plane of the substrate: [110]MgO∥[110]GaAs and [112]MgO∥[110]GaAs. An interfacial layer (∼5 nm thick) was observed in high resolution TEM analysis, and was attributed to a remnant native GaAs oxide layer. Complete desorption of the native GaAs oxide at ∼600 °C in vacuum prior to MgO growth led to significant surface roughening due to Langmuir evaporation, and resulted in randomly oriented polycrystalline MgO films. Growth o...
TL;DR: In this paper, the origin of metastable tweed texture (microstructure) is studied by computer simulation, where a two-dimensional model of 99*99 unit cells represents a layer with an oxygen deficit of the high-Tc superconductor YBa2Cu3O7- delta and exhibits the ferroelastic tetragonal-orthorhombic phase transition.
Abstract: The origin of metastable tweed texture (microstructure) is studied by computer simulation. A two-dimensional model of 99*99 unit cells represents a layer with an oxygen deficit of the high-Tc superconductor YBa2Cu3O7- delta and exhibits the ferroelastic tetragonal-orthorhombic phase transition. The tweed texture is known to be important for flux pinning. In the model, the local ordering of the oxygen atoms produces long-range strain fields, which have been studied computationally by a molecular dynamics technique. The system has a strong tendency to form the tweed texture, as observed experimentally. Well above the structural phase transition temperature, the strain fluctuations show well developed embryos of the tweed texture, whose temperature dependence agrees with theoretical estimates obtained using the independent-site approximation. On quenching to below the transition temperature, the texture first becomes more regular in spacing and coarsens before the system orders macroscopically: the kinetics behaviour is quite different from the traditional model of nucleation and growth.
TL;DR: In this paper, the effect of T1 precipitate on the anisotropy of an AlLi alloy 2090 has been investigated by comparing the behavior of the alloy with various microstructures.
Abstract: A study has been made of the effect of T1 precipitate on the anisotropy of an AlLi alloy 2090. The critical role of T1 precipitates has been identified by comparing the behavior of the alloy with various microstructures. These include (1) T8E41 tempered specimen with T1, θ′ and δ′, (2) reverted specimen with T1, (3) re-solutioning specimen with very fine δ′, and (4) under-aged specimen with fine δ′ and θ′. It has been shown that the {110}〈112〉 crystallographic texture developed during thermomechanical treatment has a direct effect on the anistropy. It also has an indirect effect by causing an inhomogeneous distribution of nucleation sites for T1 among four {111} habit planes during stretching and accordingly inhomogeneous distribution of T1 precipitates among four possible {111} planes during aging. Such inhomogeneously distributed T1 precipitates in both T8E41 tempered and reverted specimens affect the variation of tensile properties, particularly elongation with specimen orientation.
TL;DR: In this paper, the epitaxial system z−lithium niobate on GaAs(111)A and GaAs (111)B has been demonstrated by in situ pulsed laser deposition both with and without intermediate layers of MgO(111).
Abstract: The epitaxial system z‐lithium niobate on GaAs(111)A and GaAs(111)B has been demonstrated by in situ pulsed laser deposition both with and without intermediate layers of MgO(111). The in‐plane epitaxial relationships are LiNbO3[110]∥GaAs[211] and [211] indicating the existence of 180° boundaries in the LiNbO3 both with and without the MgO layer, which grows cube‐on‐cube with the GaAs. Out‐of‐plane texture is typically 1.0° and 1.2° for the MgO and LiNbO3 layers, respectively. In‐plane texture is typically 2.8° and 4.5° for the MgO and LiNbO3 layers, respectively. This epitaxial system may be useful for monolithic electro‐optic or frequency doubling applications in conjunction with semiconductor laser diodes.
TL;DR: In this paper, x-ray texture diffractometry was used to characterize the orientation of diamond nuclei and the substrate, showing that the angular spread of the nuclei orientation is rather large, amounting to 9°−13° (FWHM) in both polar and azimuthal directions.
Abstract: Oriented diamond nuclei prepared by bias‐enhanced microwave plasma chemical vapor deposition on β‐SiC and Si were characterized by x‐ray texture diffractometry. In both cases, x‐ray pole figures reveal an epitaxial relation between the orientation of diamond nuclei and the substrate. However, the angular spread of the nuclei orientation is rather large, amounting to 9°–13° (FWHM) in both polar and azimuthal directions. When growing thick diamond films on top of these already oriented diamond nuclei, the evolution of the orientational order depends critically on the growth conditions. In the case of 〈100〉 oriented nuclei, growth conditions which favor the formation of a 〈100〉 fiber texture can even improve the degree of orientational order, whereas other growth conditions result in a deterioration of the epitaxial relationship.
TL;DR: In this article, the authors used spray deposition to grow indium-dopod zinc thin films using different doping compounds in the solution, including indium chloride, indium sulfate and indium acetate, and found that the texture of the films could be change quite easily making it possible to grow films for different applications.
TL;DR: In this paper, a high-strength machinable glass-ceramic was prepared by controlling the crystallization of ZrO[sub 2]-containing Ca[sub 0.43]K[sub0.14]Mg[sub 3] (Si[sub 1]AlO[Sub 10])F[sub 6] glass.
Abstract: A high-strength machinable glass-ceramic was prepared by controlling the crystallization of ZrO[sub 2]-containing Ca[sub 0.43]K[sub 0.14]Mg[sub 3] (Si[sub 3]AlO[sub 10])F[sub 2] glass. A unique microstructure of the glass-ceramic was observed, using transmission electron microscopy (TEM): zirconia particles of nanometer size, 20-50 nm, were embedded in calcium mica crystal. After zirconia particles grew in nanometer size, the mica crystals were precipitated to embed the particles. The particles were identified as transformable tetragonal zirconia crystals. This texture leads to high strength (500 MPa in bending) and good machinability.
TL;DR: In this paper, the reversible transverse susceptibility (RTS) of particulate recording media is investigated theoretically and experimentally and it is shown that the orientational texture of the medium plays an important role in the RTS.
Abstract: The reversible transverse susceptibility (RTS) of particulate recording media is investigated theoretically and experimentally. It is shown that the orientational texture of the medium plays an important role in the RTS. The qualitative agreement between theory and experiment is good. However, discrepancies appear during the demagnetization process which can be associated with incoherent reversal mechanisms.
TL;DR: In this article, biaxially aligned YBCO thin films were successfully formed on polycrystalline Ni-based alloy by using ion-beam-modified yttria-stabilized-zirconia (YSZ) intermediate layers.
Abstract: Biaxially aligned YBCO thin films were successfully formed on polycrystalline Ni-based alloy by using ion-beam-modified yttria-stabilized-zirconia (YSZ) intermediate layers. YSZ layers were deposited by ion-beam-assisted deposition (IBAD) with concurrent off-axis ion beam bombardment. The YSZ
TL;DR: In this paper, the influence of crystallographic texture on the frequencies of CSL grain boundaries in polycrystalline materials was investigated assuming a spatially disordered material, the explicit relation between these frequencies and the orientation distribution function was given also the role of sample symmetry was discussed and the results were obtained for the case of primary recrystallized Fe-3% Si alloy with cubic-orthorhombic symmetry.
Abstract: The influence of crystallographic texture on the frequencies of CSL grain boundaries in polycrystalline materials was investigated Assuming a spatially disordered material, the explicit relation between these frequencies and the orientation distribution function is given Also the frequencies of CSL-boundaries with respect to a specified orientation are analyzed and the role of sample symmetry is discussed Exemplary results obtained for the case of primary recrystallized Fe-3% Si alloy with cubic-orthorhombic symmetry are presented
TL;DR: In this paper, a review on the experimental aspects of the alignment of NLC in the pretilted homogeneous form in the sandwich cells is provided, and most of the contents of this paper are the results of research done by the authors in these few years.
Abstract: This article provides a review on the experimental aspects of the alignment of nematic liquid crystal (NLC) in the pretilted homogeneous form in the sandwich cells; most of the contents of this paper are the results of research done by the authors in these few years. For simplicity and convenience, we used nematic liquid crystal (5CB) only; however, we have explored several polymer orientation films such as alkylbranched or alkylbranchless polyimide (PI), PI-Langmuir-Blodgett (LB) films, and those of polypyrrole. All these films were rubbed prior to assemble the cells except for some cases of PI-LB films. These films were characterized in terms of the atomic force microscope (AFM) observation and the optical retardation that are induced by the rubbing or unidirectional pulling up of the substrates in the LB process. Aligning capabilities of these orientation films for 5CB have been evaluated in terms of the texture of the NLC media, generation of pretilt angles, and temperature dependence of the ...
TL;DR: A pseudocrystalline model is proposed to explain the occurrence of perpendicular anisotropy in amorphous rare-earth-transition metal (R-T) thin films based on the central hypothesis that during layer-by-layer growth small planar hexagonal units are formed defining on average a preferential axis perpendicular to the film plane.
Abstract: A pseudocrystalline model is proposed to explain the occurrence of perpendicular anisotropy in amorphous rare-earth--transition metal (R-T) thin films. It is based on the central hypothesis that during layer-by-layer growth small planar hexagonal units are formed defining on average a preferential axis perpendicular to the film plane. The units are similar in structure to relaxed crystalline ones and are estimated to typically comprise six rare-earth atoms. They are regarded as an idealized model of the short-range order and are consistent with the known nearest-neighbor R-T and T-T coordination numbers in the amorphous state. This model is able to explain the known experimental results concerning the influence of composition, substrate temperature, annealing, and bombardment effects during sputter deposition on the magnetic anisotropy of thin amorphous rare-earth--transition-metal films of the system (Nd, Tb, Dy) (Fe, Co), as well as the destruction of this anisotropy by additives.
Book•
04 Nov 1993
TL;DR: In this paper, the superconducting state was studied in the A2B2CanCun+ I 02n+6 systems. Theoretical outline: Ginzburg-Landau Theory. Phase diagrams in LBCO.
Abstract: The Superconducting State: History. Phenomena. Critical Temperature, Critical Current, and Critical Field. The Meissner-Ochsenfeld Effect. Penetration Depth and Coherence Length. Thermal Properties. Flux Pinning. Tunnelling. Theoretical Outline: Ginzburg-Landau Theory. BCS Theory. Compounds and Crystal Chemistry: Materials Classification: Alkaline Earth Doped La2CuO4. Y-Ba-Cu-0 System, A2B2CanCun+ I 02n+6 Systems. Other Systems. Summary of Processing Parameters. Defects and Crystal Chemistry: Oxygen Vacancies and Hole Creation. Lattice Defects. Flux Pinning Sites. Metallic States. Energy Levels and Bands. Measurements of Carrier Densities. Phase Equilibria: Phase Equilibria. Phase Diagrams in LBCO. Phase Diagrams in Y 123. Phase Diagrams in Bi2223 And T12223. Powder Processing, Bulk Formation, and Densification: Chemical Reaction: Calcination. Sintering. Powder Processing: Milling Media. Co-Precipitation. Aerosol Techniques. Sol-Gel. Precursor Routes. Formation and Densification: Pelletization. Wire Formation. Tape Formation. Coils. Liquid Phase Sintering. Hot Uniaxial Pressing. Cold and Hot Isostatic Pressing. Joining. Other Methods. Thin Films: Fabrication Principles: In Situ and Ex Situ Growth. Oxygen Pressure. Stoichiometry. Co-Deposition from Multiple Sources. Substrates. A-axis Films. Heterostructures. Film Quality. Deposition Techniques: Evaporation. Sputtering. Laser Ablation. Chemical Vapour Deposition. Metalorganic Solution Deposition. Weak Links and Transport Current. Alignment in Bulk Material: Partial Melting. Directional Solidification: Partial Melt Method with a Narrow Hot Zone. Float Zone Grown Single Crystal Fibers. Growth of Single Crystals. Other Methods for Growing Fibers. Deformation Alignment. Magnetic Alignment. Diffusion Texture through Precursors. Second Phase Inclusions. Impurities and Chemical Stability: Dopants. Alkali Metals. Alkaline Earths. Transition Metals. Noble Metals. Pb Doping in Bi2223. Halides. Other Dopants. Contamination in Materials Preparation: Purity of Starting Powders. Carbon Nitrates. Contaminants from Milling Media. Corrosion: Aqueous Environments. Electrochemistry. Acid Solutions. Basic Solutions. Organic Solutions. Protection. Characterization: Electricity and Magnetism: The 4-Probe Technique. Electrical Contacts. Magnetic Susceptibility. Crystal Structures: Neutron Diffraction. X-Ray Diffraction. Electron Diffraction. Characterization of Texture. Microstructures: Electron Microscopy. Optical Microscopy. Grain Boundaries. Scanning Tunnelling Necroscopy. Rutherford Backscattering. Wet Chemistry: Volumetric Measurement. lodometric Titration. Applications: Bulk Material: Cables. Magnets. Magnetic Bearings. Magnetic Shields. Requisite Critical Current Densities. Thin Films: SQUID. Microwave Devices. Bolometers. Interconnects. Digital Electronics.
TL;DR: In this article, the effects of the Pt content and dc substrate bias voltage on the magnetic properties and structure of rf sputtered CoCrPt/Cr films with two different remanent magnetization-thickness products Mrδ (0.7 and 2.3 memu/cm2) were studied.
Abstract: The effects of the Pt content (0–40 at. %) and the developed dc substrate bias voltage (0 to −190 V) on the magnetic properties and structure of rf sputtered CoCrPt/Cr films with two different remanent magnetization‐thickness products Mrδ (0.7 and 2.3 memu/cm2) were studied. It was demonstrated that a wide range of in‐plane coercivities (500–3450 Oe) can be easily obtained in these films. The addition of Pt affected the magnetic properties of the films through changes of the lattice parameter, texture, and phase composition. A maximum in the in‐plane coercivity exists for moderate amounts of Pt. The saturation magnetization decreased monotonically with increasing Pt content. rf substrate bias increased the in‐plane coercivity and altered the character of the magnetic interactions through changes of the stress, texture and microstructure of the magnetic layer.
TL;DR: In this paper, the authors measured the orientations of individual grains and hillocks in Al-l%Si sputter layers on SiO2/Si substrates during heat treatments in the range from 200 to 500°C.
Abstract: Hillocks are formed sporadically in Al-l%Si sputter layers on SiO2/Si substrates during heat treatments in the range from 200 to 500°C. The driving force is the relaxation of thermomechanical stress in the grains induced by the thermal expansion mismatch between the metallization layer and the substrate. The orientations of individual grains and hillocks are measured on-line with a medium voltage transmission electron microscope by the Kikuchi pattern method. Thermomechanical stress in the grains is calculated with a biaxial strain model, considering the glide systems of dislocations for the individual grain orientations. In general, hillocks deviate from the ordinary 〈111〉 fiber texture of aluminum sputter layers. The spatial distribution of grain orientations is illustrated by orientation images using Miller indices or Rodrigues vectors.