Showing papers on "Total external reflection published in 1972"

Optical device with means for reducing internal reflections

Abstract: The outer surface of a transparent optical mass is directly coated with an internal reflection suppressing coating having an index of refraction smaller than that of the optical mass for suppressing internal reflections of light passing through the mass at angles of incidence to the surface greater than the critical angle. The coating includes a dispersing medium and a material in the form of light absorbing particles having dimensions smaller than one-fifth of the wavelength of visible light dispersed in the medium. The particles have a sufficient density near the surface to absorb a major portion of visible light at all wavelengths incident upon the surface through the mass at angles of incidence greater than the critical angle.

Stratified media and total reflection phenomena.

Abstract: General recurrence relations for the deduction of the reflection and transmission coefficients of a stratified medium are derived. These are suitable for numerical computations on such layered systems involving complex indices of refraction and oblique incidence. The results are applied to total reflection phenomena involving the presence of a dielectric, a perfectly reflecting, or a metallic medium in the less dense medium beyond the totally reflecting boundary. Numerical results are given on a total reflection attenuator, on a total reflection phase shifter, and on a total reflection polarizer. These indicate the potential use of such total reflection phenomena for optical components and laser applications.

Totally Internally Reflecting Thin-Film Optical Cavities

Abstract: Thin-film optical cavities formed by optical waveguides in which end faces are parallel, optically smooth, and perpendicular to waveguide surfaces are analyzed for the possibility of total internal reflection of waveguide mode ray components at the end faces. Conditions for the occurrence of this phenomena in various modes are derived and evaluated for GaAs waveguides using dispersion relations. A refractive index difference between waveguide and surrounding media of at least 4% for GaAs is necessary before total reflection at the end faces can occur. For such differences, total reflection in single mode GaAs waveguide is nearly always expected.