Showing papers on "Total external reflection published in 2001"
TL;DR: These experiments directly confirm the predictions of Maxwell's equations that n is given by the negative square root ofɛ·μ for the frequencies where both the permittivity and the permeability are negative.
Abstract: We present experimental scattering data at microwave frequencies on a structured metamaterial that exhibits a frequency band where the effective index of refraction (n) is negative. The material consists of a two-dimensional array of repeated unit cells of copper strips and split ring resonators on interlocking strips of standard circuit board material. By measuring the scattering angle of the transmitted beam through a prism fabricated from this material, we determine the effective n, appropriate to Snell's law. These experiments directly confirm the predictions of Maxwell's equations that n is given by the negative square root of epsilon.mu for the frequencies where both the permittivity (epsilon) and the permeability (mu) are negative. Configurations of geometrical optical designs are now possible that could not be realized by positive index materials.
8,477 citations
TL;DR: This work considers circularly and linearly polarized continuous waves incident upon a medium containing spherical scatterers to investigate the interaction between polarized waves and a multiple scattering medium as functions of the relative index of refraction.
Abstract: Using the theory of radiative transfer, we investigate the interaction between polarized waves and a multiple scattering medium as functions of the relative index of refraction. To study this problem, we consider circularly and linearly polarized continuous waves incident upon a medium containing spherical scatterers. With an accurate spectral method, we compute the transmitted Stokes parameters through media containing different sized scatterers and different indices of refraction. Our numerical results show that the circular depolarization length exhibits a strong dependence on the relative index of refraction, while the linear depolarization length does not.
61 citations
Patent•
02 Mar 2001
TL;DR: In this article, a polarization-independent ultra-narrow band pass filter is proposed, which is a stack structure of dual symmetric resonance cavities, each of which includes two reflectors and a resonance light grating sandwiched in between.
Abstract: A Polarization-independent ultra-narrow band pass filter, which is not sensitive to the polarization state of incident beams of light and can obtain better narrow band pass signals with fewer film layers. The polarization-independent ultra-narrow band pass filter is a stack structure of dual symmetric resonance cavities. Each of the resonance cavities is a structure of high refraction index film layers and low refraction index layers stacked interposedly together. Each of the resonance cavities includes two reflectors and a resonance light grating sandwiched in between. Each film layer of the reflector and the resonance grating is λ/4 thick. The grating periodic length is between 0.9 λ and 3 λ and a preferred grating periodic length is 1 λ to 2 λ, where λ is the wavelength of the incident light. The high refraction index layer of the reflector is a Si layer (refraction index nH-=3.6) and the low refraction index layer is a SiO2 layer (refraction index nL=1.43). The resonance grating can be a film layer with a high refraction index (with an effective refraction index between 3.4 and 3.5) or a film layer with a low refraction index (with an effective refraction index between 1.45 and 1.5).
29 citations
Patent•
10 Jan 2001
TL;DR: In this article, a reflection/refraction optical system and a projection aligner having a high NA of 0.6 or above required for high resolution in which chromatic aberration is corrected well even in an extreme ultraviolet region, especially for a wavelength of 200 nm or less, all optical members are arranged on one line.
Abstract: PROBLEM TO BE SOLVED: To provide a reflection/refraction optical system and a projection aligner having a high NA of 0.6 or above required for high resolution in which chromatic aberration is corrected well even in an extreme ultraviolet region, especially for a wavelength of 200 nm or less, all optical members are arranged on one line and a rectangular exposure field can be formed. SOLUTION: Image of a first surface is formed on a second surface based on an image side telecentric light beam and two or more even number of reflection planes and at least one refraction member are provided. At least one of odd numbered reflection planes, when counted from the first plane of the even number of reflection planes, is concave and assuming the effective diameter of the concave reflection plane is MA1 and the largest effective diameter of at least one refraction member is RA, following relation is satisfied; (MA1/RA)<=(1/2.1), and the concave plane is directed oppositely to the second surface.
20 citations
Patent•
15 Mar 2001
TL;DR: In this paper, an approximate solution of the complex index of refraction is provided to obtain a new approximate solution in the successive approximation, a transmittance when the light is incident from a medium in the periphery of the measured object on the object 20 on the horizon of the detected object 20 to the medium, and a term based on the multiple reflection are processed as known quantities determined by the provided approximate solution to obtain the new approximate solutions.
Abstract: PROBLEM TO BE SOLVED: To reduce calculation volume, and to precisely and stably measure the complex index of refraction. SOLUTION: Terahertz pulse light generated in a generation part 7 is transmitted through a measured object 20. The transmission light is detected by a detector 11 to obtain an amplitude transmittance of a prescribed frequency and a phase difference. The complex index of refraction of the measured object 20 is found by successive approximation based on an expression indicating the relation between the complex index of refraction of the measured object 20 and these quantities. Multiple reflection of the terahertz light inside the measured object is reflected in the expression. When an approximate solution of the complex index of refraction is provided to obtain a new approximate solution of the complex index of refraction in the successive approximation, a transmittance when the light is incident from a medium in the periphery of the measured object 20 on the object 20, a transmittance when the light outgoes from the measured object 20 to the medium, and a term based on the multiple reflection are processed as known quantities determined by the provided approximate solution to obtain the new approximate solution.
12 citations
Patent•
20 Aug 2001
TL;DR: In this paper, a double refraction grating type polarizer is proposed, which includes a grating 200 in which a first medium 210 and a second medium 220 which extend in one direction are repeatedly disposed and which has a unidirectional periodic structure.
Abstract: PROBLEM TO BE SOLVED: To provide a polarizer having excellent durability. SOLUTION: The double refraction grating type polarizer 100 includes a grating 200 in which a first medium 210 and a second medium 220 which extend in one direction are repeatedly disposed and which has a unidirectional periodic structure. The first medium 210 consists of a double refraction material whose refractive index about S-polarized light which vibrates in almost parallel to the extended direction of the first medium 210 is different from that about P-polarized light which vibrates in a direction almost vertical to the extended direction of the first medium 210. The second medium 220 consists of an isotropic material which has a refractive index almost equal to that of the first medium 210 about the S-polarized light. A total reflection layer 300 which transmits the S-polarized light which has transmitted through the grating 200 and which totally reflects the P-polarized light diffracted by the grating 200 in a layer is provided at the optical emission side of the grating 200.
8 citations
TL;DR: In this article, the angular dependence of specularly reflected x-rays from a crystal coated with an amorphous film under the conditions for glancing noncoplanar diffraction is rigorously analyzed theoretically.
Abstract: The angular dependence of the intensity of specularly reflected x-rays from a crystal coated with an amorphous film under the conditions for glancing noncoplanar diffraction is rigorously analyzed theoretically. The anomalous angular dependence is shown to be very sensitive to the presence of thin amorphous films several nanometers thick. The optimum conditions for recording are realized at glancing angles of 1.5–4 times the critical angle for total external reflection.
6 citations
30 May 2001
TL;DR: In this paper, it was shown that when Laguerre-Gaussian light beam with non-zero azimuthal index is partially reflected at plane interface of two isotropic transparent media, a specific deformation of the beam occurs in this process, giving rise a transverse shift of the center of gravity of the reflected beam.
Abstract: It is shown that, when Laguerre-Gaussian light beam with non- zero azimuthal index is partially reflected at plane interface of two isotropic transparent media, a specific deformation of the beam occurs in this process. This deformation gives rise a transverse shift of the center of gravity of the reflected beam. When the beam is incident from a denser medium at an angle that is close to the critical angle for total reflection, the magnitude of the predicted shift, like the magnitude of the well-known lateral or Goos-Hanchen shift, can be many wavelengths.© (2001) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
5 citations
Journal Article•
TL;DR: In these experiments the x-rays approached the sample surfaces at grazing incident angles below the total external reflection critical angles for a number of reflections and hence surface strain features nominally less than a few tens of Ångstroms from the sample surface have been observed.
Abstract: Synchrotron X-Ray Topography has been used in Total Reflection Topography (TRT) mode to observe strain induced surface bumps due to the presence of underlying misfit dislocations in strained layer SiGe on Si epitaxial heterostructures. In these experiments the x-rays approached the sample surfaces at grazing incident angles below the total external reflection critical angles for a number of reflections and hence surface strain features nominally less than a few tens of Angstroms from the sample surface have been observed. These are similar to the surface bumpiness observed by Atomic Force Microscopy, albeit on a much larger lateral length scale. The fact that TRT mode images were taken was confirmed by the observation of clear and conventional back reflection topographic images of misfit dislocations in all samples when the grazing incidence angle became greater than the critical angle.
5 citations
TL;DR: In this article, it was shown that total reflection can occur only for propagation from a denser medium to a rarer medium; this result does not agree with that of Lin and Wu [Opt. Lett. 23, 22].
Abstract: We study the propagation of light from an isotropic medium to an anisotropic medium. It is shown that total reflection can occur only for propagation from a denser medium to a rarer medium; this result does not agree with that of Lin and Wu [Opt. Lett. 23, 22 (1998)].
5 citations
Patent•
07 Feb 2001
TL;DR: In this paper, the authors proposed a measuring device using total reflection decay with such constitution as to make beams of light incident to a dielectric block in a convergent light state.
Abstract: PROBLEM TO BE SOLVED: To prevent the large dispersion of the measured value in a measuring device using total reflection decay with such constitution as to make beams of light incident to a dielectric block in a convergent light state. SOLUTION: This measuring device using total reflection decay is provided with a dielectric block 11; a metal film 12 formed on one face of the dielectric block 11 and brought into contact with a sample 15; a light source 31 for generating beams of light 30; an optical system 32 for making the beams of light 30 incident to the dielectric block 11 in a total reflection condition at an interface 11a between the dielectric block 11 and the metal film 12 and in a convergent light state so as to include various incident angle components; and a photo detecting means 40 for detecting the state of total reflection decay by measuring the intensity of the beams of light 30 totally reflected at the interface 11a. The optical system 32 is so constituted that the beams of light 30 are not focused on the interface 11a. COPYRIGHT: (C)2002,JPO
08 Mar 2001
TL;DR: In this article, the authors proposed a double-beam detector for the determination of refraction index, which is based on the angle of a total internal reflection of beam of light at the dividing surface between the liquid and avariously shaped measuring prism of known refractive index.
Abstract: measurements of sugar in comestibles, etc. One of the chief methods for the determination of refraction index is based onthe measurement of the angle of a total internal reflection of beam of light at the dividing surface between the liquid and avariously shaped measuring prism of known refraction index. Such method is a "single-beam" one, for the critical angle isdetermined, for instance, by the magnitude of the shift ofthe border line between light and dark with respect to a fixed pointof reference.'3 The refraction index precision of modern critical angle refractometers is about lOs. With the "double-beam"detector, as described in the present paper, it becomes possible to achieve the same result but by means of another principleof operation.
TL;DR: In this paper, the phases of reflected light for the parallel and perpendicular modes under total reflection conditions at interfaces formed by an isotropic medium and a uniaxial crystal considering its principal planes were calculated.
Abstract: We calculate the phases of the reflected light for the parallel and perpendicular modes under total reflection conditions at interfaces formed by an isotropic medium and a uniaxial crystal considering its principal planes. It is found that for incident light that is linearly polarized we can obtain circularly polarized reflected light with only one reflection with lower refractive indices than those required for isotropic interfaces. Moreover we find that, under certain conditions, the polarization of the reflected light is the same as that of the incident light in the total reflection zone.
Patent•
21 Jun 2001
TL;DR: In this article, an optical path element composed of a light incidence part, a light projection part, and a variable refractive index substance was proposed to change the optical path when the light reflected by the reflection part 115 exits from the light projection parts 104 through the light guide member 101.
Abstract: PROBLEM TO BE SOLVED: To provide an optical path element which has simple structure, high durability, and is reducible in member cost and has high light use efficiency, and to provide a spatial optical modulator and an image display device which uses it. SOLUTION: The element is composed of a light incidence part 103 for light passed through a light guide member 101, a reflection part 115 which reflects the incident light from the incidence part, and a light projection part 104 which guides the light reflected by the reflection part to the outside as projection light through the light guide member 101, and a variable refractive index substance 105 is enclosed in an optical path including the reflection member 115. A signal is supplied to this variable refractive index substance and then the refractive index is varied without the total reflection of the incident light at the interface between the light guide member 101 and the variable refractive index substance 105 to change the optical path when the light reflected by the reflection part 115 exits from the light projection part 104 through the light guide member 101.
17 Apr 2001
TL;DR: In this paper, a new method is presented to observe the nanosecond pressure pulse field developed by the pulse laser energy deposition into the water, which is based on the pressure dependence of the refractive index of water, and can be visualized by the change in the reflectivity of the optical prism-water interface.
Abstract: New method is presented to observe the nanosecond pressure pulse field developed by the pulse laser energy deposition into the water. The present method is based on the pressure dependence of the refractive index of water, and the change in pressure can be visualized by the change in the reflectivity of the optical prism-water interface. Two procedures are tested to record the pulse laser induced high-pressure shock wave front in water, that is, (1) monitoring the time evolution of the laser intensity by a photomultiplier reflected from a point on the interface, and (2) taking an instantaneous photograph of the interface. They will give the pressure-time profile by the procedure, and to give the pressure distribution at that instant. Experimental results shows the feasibility of the method.© (2001) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
01 Sep 2001-Nuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment
TL;DR: In this article, an X-ray grazing incidence phase multilayer grating, representing a thin grating placed on a multi-layer mirror, is proposed, where a high efficiency of grating diffraction can be obtained by the possibility of changing the phase shift of the wave diffracted from the multilayer under the Bragg and total external reflection conditions.
Abstract: An X-ray grazing incidence phase multilayer grating, representing a thin grating placed on a multilayer mirror, is proposed. A high efficiency of grating diffraction can be obtained by the possibility of changing the phase shift of the wave diffracted from the multilayer under the Bragg and total external reflection conditions. A grazing incidence phase multilayer grating consisting of Pt grating stripes on a Ni/C multilayer and optimized for the hard X-ray range was fabricated. Its diffraction properties were studied at photon energies of 7 and 8 keV. The obtained maximum value of the diffraction efficiency of the +1 grating order was 9% at 7 keV and 6.5% at 8 keV. The data obtained are in a rather good accordance with the theory.
TL;DR: In this paper, the authors used grazing incidence X-ray diffraction (GIXD) to investigate the structural properties of cholesteryl-L-glutamate at the air-water interface.
Abstract: Monomolecular films at the air-water interface can be investigated on the subnanometer scale with grazing incidence X-ray diffraction (GIXD) using synchrotron radiation. This surface semsitive technique utilizes the property of total external reflection of X-rays from a water surface: an evanescent wave generated within the film diffracts in the surface plane giving an image of the film reciprocal lattice. Three applications of GIXD are presented ranging from poorly to highly crystalline thin films. (i) Cholesteryl- L-glutamate forms a crystalline monolayer at the air-water interface within which the glutamate moieties are not closely packed. This system specifically incorporates hydrophobic amino acids from the subphase. (ii) Long-chain cholesteryl esters deposited on the water surface spontaneously self assemble, forming crystalline interdigitated bilayers. The molecular structure, solved at the atomic resolution, was found to be similar to the 3D counterpart. (iii) According to 2-D diffraction theory, the shape of Bragg peaks is related to the mechanical constants of the film. Rigidity of the film can be deduced from a detailed peak analysis for secondary short chain alcohols showing a softening of the monolayer close to melting.
01 Sep 2001-Nuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment
TL;DR: In this article, the possibility of the use of quasi-Bragg diffuse scattering for express measurements of changes in multilayer d-spacing was studied, and the error of this method was shown to be minimal, if the incident or scattered angles are sufficiently far from the critical total external reflection or Bragg angles.
Abstract: The possibility of the use of quasi-Bragg diffuse scattering for express measurements of changes in multilayer d-spacing was studied. The error of this method was shown to be minimal, if the incident or scattered angles are sufficiently far from the critical total external reflection or Bragg angles. As an example, the measurements of the W/Si multilayer mirror with linearly varying d-spacing are presented.