Topic
Total external reflection
About: Total external reflection is a research topic. Over the lifetime, 829 publications have been published within this topic receiving 22213 citations.
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TL;DR: In this article, the ambiguity of Mossbauer spectra measured under total external reflection conditions due to the increase of the number of parameters which should be determined can be compensated by measuring a series of experimental spectra.
Abstract: An ambiguity of Mossbauer spectra measured under total external reflection conditions due to the increase of the number of parameters which should be determined can be compensated by measuring a series of experimental spectra. The interpretation of all experimental data must be done by means of numerical modeling (or fitting). The method enables us to study phase transformations within a layer of about 10 nm thickness.
3 citations
07 Apr 2003
TL;DR: In this article, a beam deflection technique that exploits electric-field controlled deflection and total internal reflection at the interface between two anti-parallel domains realized in a single crystal lithium niobate wafer is presented.
Abstract: We report a beam deflection technique that exploits electric-field controlled deflection and total internal reflection at the interface between two anti-parallel domains realized in a single crystal lithium niobate wafer. The LiNbO 3 z-cut sample was 500-µm-thick and was photolithographically patterned and poled by means of an applied electric field, in order to realize two adjacent regions of opposite domain orientation. The boundary between these domains should be very regular and free from residual stress, but in practice, a small residual index difference exists at the interface. An electric filed E z applied across the interface region, produces equal in magnitude, but opposite in sign, refractive index variations between the adjacent anti-parallel domains. For sufficiently large index variation, and for grazing incidence geometry, that is when the incidence angle is between 87° and 89°, we obtain a high efficient beam deflection. Furthermore, if the incidence angle approaches the limit angle, which is about 89°, the Total Internal Reflection (TIR) occurs, producing an abrupt beam switch from transmission to reflection, characterized with a theoretical 100% switching contrast. However, the residual interface stress generates significant Fresnel reflection from this interface at high grazing angles, limiting the switching contrast ratio achievable at 20 dB. We present data obtained for wavelengths of 632.8 nm and 4.5 m; at the latter wavelength we demonstrated the possibility to perform amplitude modulation faster than mechanical chopping, in a spectral region where no Pockels cells are available Keywords: Total internal reflection, Switching, Scanning, Electro-optic effect, Lithium niobate
3 citations
TL;DR: In this article, the authors considered reflection of light from half-space of anisotropic metamaterial at arbitrary direction of optical axis in the plane of light incidence and obtained conditions at which total reflection and refraction do not depend on the polarization of incident light and the reflection does not depend also the angle of incidence.
Abstract: We consider reflection of light from half-space of anisotropic metamaterial at arbitrary direction of optical axis in the plane of light incidence. We obtain conditions at which total reflection and refraction do not depend on the polarization of incident light and the reflection does not depend on also the angle of incidence. We also study the possibilities and conditions for using the considered system as beam splitter, omnidirectional reflector, phase retarder, and so on.
3 citations
01 Jun 1991
TL;DR: In this paper, the reflected polarization angle is determined from the extinction position of the analyzer, which gives the ratio of the reflected p-wave to s-wave, which can be used to determine the index of refraction from Fresnel equations.
Abstract: Linearly polarized light remains linearly polarized after reflection from a transparent material at oblique incidence. The reflected polarization angle is determined from the extinction position of the analyzer. If the incident polarization angle is 45 deg, the reflected polarization angle gives the ratio of the reflected p-wave to s-wave. This value can be used to determine the index of refraction from Fresnel equations. With our instrument, the uncertainty in the deduced refractive index is +/- 0.0004. This method is fast, convenient, and versatile enough to provide accurate results on small laboratory samples. In addition to measuring the refractive index, the method is sufficiently accurate to characterize the homogeneity of transparent materials.© (1991) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
3 citations
TL;DR: In this article, the electron escape functions for various final energies of electrons are measured under the conditions of interaction of characteristic CuKα radiation with a germanium specimen using two independent techniques: the method of calibrated amorphous layers and the new method of total external reflection.
Abstract: The electron escape functions for various final energies of electrons are measured under the conditions of interaction of characteristic CuKα radiation with a germanium specimen. The energy analysis is carried out by a proportional gas counter of electrons with energy resolution ≈ 18%. The measurements are carried out by using two independent techniques: the method of „calibrated amorphous layers” and the new method of „total external reflection”. The features of the second method are: the universality with respect to the specimen structure (the method can be applied to single-crystalline, polycrystalline, and amorphous samples) and the high speed of measurements.
[Russian Text Ignored].
3 citations