Total external reflection

About: Total external reflection is a research topic. Over the lifetime, 829 publications have been published within this topic receiving 22213 citations.

Total External Reflection of X Rays from Polycrystal Solid Surface

Abstract: Total external reflection of X rays from surfaces of several polycrystalline metals is analyzed. The roentgenograms of total reflection and X-ray diffraction are comprehensively studied for nickel, copper, silver, platinum, and bismuth. Theoretical processing of experimental roentgenograms is used to calculate Xray refractive indices, number of surface crystallites, interplane distances, and remaining quantities for polycrystalline metals. It is shown that the refractive index inversely depends on the interplane distance in crystallites of polycrystalline solids. Total reflection of X rays from the lead zirconate titanate ferroelectric film is studied.

Self-detection of x-ray Fresnel transmissivity using photoelectron-induced gas ionization

Abstract: Electric response of an x-ray mirror enclosed in a gas flow ionization chamber was studied under the conditions of total external reflection for hard x-rays. It is shown that the electric response of the system as a function of the incidence angle is defined by x-ray Fresnel transmissivity and photon-electron attenuation properties of the mirror material. A simple interpretation of quantum yield of the system is presented. The approach could serve as a basis for non-invasive in situ diagnostics of hard x-ray optics, easy access to complementary x-ray transmissivity data in x-ray reflectivity experiments, and might also pave the way to advanced schemes for angle and energy resolving x-ray detectors.

Surface plasmon sensor and method of measuring refractive index

Abstract: To provide a surface plasmon sensor for measuring a refractive index by which a refractive index can be easily measured with high accuracy without relying on an absorption curve. The surface plasmon sensor includes: a reflection plate which includes a metal layer having a periodic structure and on which a specimen is arranged; a light source which irradiates an incident light to the reflection plate; a light receiving part which receives a reflected light reflected on the reflection plate; and a measurement part which measures a refractive index of the specimen based on phase information on two kinds of waves which are included in reflected light reflected on a periodic structure surface and differ in polarization direction.

Measuring Nonlinear Refraction and Its Dispersion

Abstract: We describe methods for measuring the nonlinear refraction of nominally transparent materials that involve propagation from the near to the far field, which changes a phase distortion into an amplitude redistribution. These methods include beam distortion methods and Z-scan. We also look at methods to determine the spectral dependence of these changes in refractive index. Recent advances here include using femtosecond white-light continua as the source for Z-scan. The types of nonlinear refractive mechanisms are also briefly discussed including bound-electronic, excited state or free-carrier generation, reorientation, electrostrictive, and thermal nonlinear refraction as well as cascaded second-order nonlinearities.