Total external reflection

About: Total external reflection is a research topic. Over the lifetime, 829 publications have been published within this topic receiving 22213 citations.

Asymmetrical light distribution total internal reflection lens

Abstract: An asymmetrical light distribution total internal reflection lens adapted to be disposed on a light source is provided. The asymmetrical light distribution total internal reflection lens includes a body, a light incident refraction part, a light emitting surface and a total reflection surface. The body has a center axis. The light incident refraction part is located on a bottom of the body, and the light incident refraction part is a notch, used to dispose the light source. The light emitting surface is located on a top of the body and has a first surface and a second surface which are connected and not parallel to each other. The total reflection surface is located on a side part of the body, and the total reflection surface is connected with the light incident refraction part and the light emitting surface.

Light management films of differing refractive indices

Abstract: An optical layer includes a first light management film having a first index of refraction (n 1 ) and a second light management film having a second index of refraction (n 2 ). The first index of refraction and the second index of refraction are not the same, and a plurality of optical features is disposed over each of the light management films. A light management film is also disclosed.

A method for measuring the continuous dispersion spectrum of nonlinear refraction coefficients of materials

Abstract: In this paper, a method for measuring the continuous dispersion spectrum of nonlinear refraction coefficients of materials based on complex refractive index dispersion (CRID) measurement is proposed. This method involves measuring internal reflection spectra with a lab-made apparatus. From the determined CRIDs of a material with and without exciting light, the changes in refractive index over a wide spectral range can be obtained, from which the nonlinear refraction coefficients can be deduced. In addition, the RI changes at wavelengths far from the nonlinear range can be used to monitor the thermal effects. In this study, a methyl-red-doped poly(methyl methacrylate) (MR-PMMA) sample was investigated. A large nonlinear refraction coefficient on the order of 10 −1 cm 2 /W was observed. The results also show that the absolute value of nonlinear refraction coefficient of the MR-PMMA sample decreases with the increase of excitation intensity. Consequently, this study provides a powerful approach that has the potential to be applied in the study of the nonlinear properties of materials.

Formation of a metastable superlattice by x‐ray interaction with standing surface acoustic waves

Abstract: X‐ray diffraction on the surface of the YZ cut of a LiNbO3 ferroelectric crystal modulated by standing surface acoustic waves (SAW) was investigated under the total external reflection conditions. It is shown that a metastable superlattice is formed in the near‐surface region in the process of the interaction between the incident x‐ray radiation and the ferroelectric crystal surface modulated by standing SAW. The metastable superlattice may be stored for a long time period and may be read out by x‐ray and laser radiation.

Reflection EXAFS studies of metal-semiconductor interfaces

Abstract: Reflection EXAFS experiments, using total external reflection and fluorescence detection, have been performed for the Al/GaAs system. Our preliminary EXAFS results imply only moderate interdiffusion of Al into the GaAs substrate. Technical aspects of the technique are also discussed, such as methods to minimize diffraction-peak contamination of the data.