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Total external reflection

About: Total external reflection is a research topic. Over the lifetime, 829 publications have been published within this topic receiving 22213 citations.


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Patent
17 Jun 2015
TL;DR: In this paper, a reflection film consisting of a cholesteric liquid-crystalline phase is presented, with a reflection wavelength at which a diffuse reflectance for nonpolarized light becomes 50% or more in a wavelength region in which each of the circularly-polarised light reflection layers exhibits selective reflection, the reflection wavelength being in an infrared wavelength region.
Abstract: The present invention provides a reflection film, comprising a right circularly-polarized light reflection layer and a left circularly-polarized light reflection layer as circularly-polarized light reflection layers, each of the circularly-polarized light reflection layers consisting of a layer obtained by fixing a cholesteric liquid-crystalline phase, having a reflection wavelength at which a diffuse reflectance for non-polarized light becomes 50% or more in a wavelength region in which each of the circularly-polarized light reflection layers exhibits selective reflection, the reflection wavelength being in an infrared wavelength region, and the reflection film exhibiting a direct transmittance of non-polarized visible light of 50% or more and a haze value of 5% or less; and an optical member including the reflection film, which can be used as a handwriting input sheet. The optical member can be used by being stuck to the surface of a display.

2 citations

Journal ArticleDOI
TL;DR: In this article, the Goos-Hanchen and Imbert-Fedorov shifts are analyzed when total reflection occurs at an interface between normal media and between normal and negatively refractive media.

2 citations

Posted Content
TL;DR: In this article, the transport of light for different incidence angles in a strongly disordered optical medium composed by core-shell nanoparticles (TiO2@Silica) suspended in ethanol solution was studied.
Abstract: This paper studies the transport of light for different incidence angles in a strongly disordered optical medium composed by core-shell nanoparticles (TiO2@Silica) suspended in ethanol solution. A decrease of optical conductance and an increase of absorption near the input border are reported when the incidence angle is increased. We associated this phenomenon to an increase of the density of localized states (localization increase) near the input border, which could be explained by a large increase of internal reflection with the incidence angle, which in turn would be a direct consequence of the enhancement of the effective refractive index near the input border by localization itself. The specular reflection, measured for the photons that enter the sample, is considerably lower than the effective internal reflection undergone by the coherently backscattered photons in the exact opposite direction, indicating a non-reciprocal propagation of light (mirror-symmetry breaking). This study represents a novel approach in order to understand the complex physics involved in a strongly disordered optical medium at the critical regime of approaching localization.

2 citations

Proceedings ArticleDOI
08 Mar 2001
TL;DR: In this article, the authors proposed a double-beam detector for the determination of refraction index, which is based on the angle of a total internal reflection of beam of light at the dividing surface between the liquid and avariously shaped measuring prism of known refractive index.
Abstract: measurements of sugar in comestibles, etc. One of the chief methods for the determination of refraction index is based onthe measurement of the angle of a total internal reflection of beam of light at the dividing surface between the liquid and avariously shaped measuring prism of known refraction index. Such method is a "single-beam" one, for the critical angle isdetermined, for instance, by the magnitude of the shift ofthe border line between light and dark with respect to a fixed pointof reference.'3 The refraction index precision of modern critical angle refractometers is about lOs. With the "double-beam"detector, as described in the present paper, it becomes possible to achieve the same result but by means of another principleof operation.

2 citations

Book ChapterDOI
01 Jan 1986
TL;DR: The reflectivities of single surfaces at normal or near-normal incidence for soft X rays are very small as mentioned in this paper, and high reflectivities from single surfaces are only obtained at grazing angles of incidence.
Abstract: As discussed in Chapter 1, the reflectivities of single surfaces at normal or near-normal incidence for soft X rays are very small. High reflectivities from single surfaces are only obtained at grazing angles of incidence. This is because the refractive index of the reflecting medium is very close to, and slightly less than, that of the surrounding medium (vacuum)—the conditions under which total external reflection can occur.

2 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
20224
20214
20206
20198
20189
201710