Total external reflection

About: Total external reflection is a research topic. Over the lifetime, 829 publications have been published within this topic receiving 22213 citations.

Ray Model for Attenuated Total Reflection from a Weakly Absorbing Dielectric

Abstract: An approximate ray picture has been presented for attenuated total reflection of a plane electromagnetic wave from a weakly absorbing dielectric. An analytical expression for the reflection coefficient has been obtained for an angle of incidence larger than the critical angle. The method of limiting absorption is seen to establish the Carter-Hora conjecture regarding the validity of Renard's formula for lateral shift on account of total reflection. Potential applications of the work are discussed.

The inverse problem of estimating the film structure from X-ray reflection data

Abstract: A new model of an X-ray reflection experiment is proposed for studying the structure of a film on a substrate. The experimental data are processed to yield the density distribution across the film, and an appropriate approximation produces numerical values of the parameters { δi, βi, σi, d 1} for each of the n layers in a multilayer film model. So far there has been no method for determining the film structure from experimental data and the problem has been usually solved by trial and error.

Reflection of plane wave in oscillatory media

Abstract: The reflection of plane waves in oscillatory media described by complex Ginzburg-Landau equation has been researched. The reflection condition and the angle formed by the boundary line between incident and reflected waves and the boundary line separating two regions of different kinetics are theoretically given. Two kinds of reflections have been found. One is a back refraction-induced reflection. The corresponding angle is theoretically obtained. The other is a pure reflection, which is independent of refraction. The theoretical results are supported by numerical results. The theoretical and numerical results show that the reflection takes place only if the angle of incidence is larger than a critical value. The angle of reflection is equal to the critical angle of incidence, and it increases as the frequency of the incident wave increases for the pure reflection.

Tangential Rays at Incipient Total Reflection and Obtuse Angles of Incidence, Reflection, and Refraction

Abstract: The trajectory of the energy of a beam of light is the ray; in anisotropic media the direction of the ray is not, in general, normal to the wave front. Angles of incidence, of reflection, and of refraction are the angles which the respective wave normals make with the normal to the surface. Even in anisotropic media the wave normals, which are the directions of beams of light, obey the coplanar law of reflection and refraction.The limiting direction of a ray in any medium is the boundary surface of the medium. Hence the direction of a beam is not necessarily limited by the boundary surface of the medium. Thus in anisotropic media it is possible to have angles of incidence, of reflection, and of refraction greater than 90° even though light (i.e. energy) still remains inside the medium. Such angles of incidence, of reflection, and of refraction up to 94° have been observed with a cleaved rhomb of calcite. The theoretical calculations and experimental results are reported in this paper.