Topic
Total external reflection
About: Total external reflection is a research topic. Over the lifetime, 829 publications have been published within this topic receiving 22213 citations.
Papers published on a yearly basis
Papers
More filters
01 Jan 1992
TL;DR: In this paper, a new way of focusing X-rays by capillary arrays, using total external reflection at grazing angles from the interior surfaces of hollow channels, was presented, where thin Bragg-difraction curved crystals can also be used in a transmissive mode to focus X-ray.
Abstract: We present a new way of focusing X-rays by capillary arrays, using total external reflection at grazing angles from the interior surfaces of hollow channels1–4 . Thin Bragg-difraction curved crystals can also be used in a transmissive mode to focus X-rays5 and the crystal netplanes can be considered as arrays of reflective surfaces.
1 citations
TL;DR: A micro-focus X-ray tube in combination with a focusing optic that uses total external reflection was used to enhance the diffracted intensity in a double-crystal experiment, whilst simultaneously reducing the beam footprint on the sample as discussed by the authors.
1 citations
TL;DR: In this paper, a three-crystal X-ray diffractometer under UHV conditions was used to investigate the phase shift at the substrate-layer interface originating from a misfit parallel to the surface normal or a thin intermediate layer.
Abstract: MBE grown gallium arsenide crystals with (001) orientation were investigated with a three-crystal X-ray diffractometer under UHV conditions. In the region of total external reflection (Q<0.3AA-1) no Kiessig fringes occur and hence no electron density difference between the substrate and the MBE layer exists. In the tails of the 004 Bragg reflection, modulations are observed. They are ascribed to a phase shift at the substrate-layer interface originating from a misfit parallel to the surface normal or a thin intermediate layer. The method can be applied to other thin film systems like oxidized or buried layers.
1 citations
TL;DR: In this article, the total external reflection of monochromatic neutrons has been measured on cobalt and iron thin films evaporated on glass substrates with a magnetic field applied parallel to the plane of the film.
Abstract: The total external reflection of monochromatic neutrons has been measured on cobalt and iron thin films evaporated on glass substrates. Neutron scattering from the thin‐film neutron mirrors was studied with a magnetic field applied parallel to the plane of the film. The changes in the cobalt mirror reflectivity curves with field strength can be correlated with local spin direction variations brought about by perpendicular anisotropy. By contrast, iron films show no field dependence which is consistent with measured planar coercive fields and the absence of a strong perpendicular anisotropy.
1 citations
TL;DR: In this paper, a Reflection Zone Plate Array (RZPA) is used to produce a monochromatic x-ray beam and to focus it at photon energies below 1400 eV.
Abstract: Reflection zone plates (RZP), which consist of elliptical zone plates fabricated on a total external reflection mirror surface, can be effectively used to produce a monochromatic x-ray beam and to focus it at photon energies below 1400 eV. However, as RZPs are highly chromatic, they can be designed only for one specific photon energy. We alleviate this problem by using a novel approach: a Reflection Zone Plate Array (RZPA). Here, we report about successful implementation of novel monochromator based on RZPAs for experiments with 100 fs time resolution at the upgraded Femtoslicing facility at BESSY-II. Aiming at minimum losses in x-ray flux up to 2000 resolution, we fabricated and used an RZPA as a single optical element for diffraction and focusing. Nine Fresnel lenses, designed for the energies of 410 eV, 543 eV, 644 eV, 715 eV, 786 eV, 861 eV, 1221 eV and 1333 eV which correspond to the absorption edges of NK, O-K, Mn-L, Fe-L, Co-L, Ni-L, Gd-M and Dy-M, were fabricated on the same substrate with a diameter of 100 mm. At resolution E/ΔE up to 2000 all edges of other elements in that range (400-1400 eV) are covered, too.
1 citations